Class information for:
Level 2: PROTON BEAM WRITING//NUCLEAR MICROPROBE//ION BEAM PLICAT

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
2223 4329 18.5 52%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 3)


ID, lev.
above		 Publications Label for level above
354 31587 X-RAY SPECTROMETRY//NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS//ARCHAEOMETRY

Classes in level below (level 1)


ID, lev. below Publications Label for level below
2928 2035 NUCLEAR MICROPROBE//PROTON MICROPROBE//SCANNING TRANSMISSION ION MICROSCOPY
4545 1694 ELASTIC RECOIL DETECTION//ION BEAM ANALYSIS//TOF ERDA
18001 509 PROTON BEAM WRITING//ION BEAM PLICAT//PROBE FORMING SYSTEM
33457 91 CURL FREE VECTOR POTENTIAL//MACRO SCALE QUANTUM EFFECTS//TRANSITION AMPLITUDE WAVE

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 PROTON BEAM WRITING Author keyword 112 75% 2% 82
2 NUCLEAR MICROPROBE Author keyword 90 48% 3% 138
3 ION BEAM PLICAT Address 45 41% 2% 87
4 SCANNING TRANSMISSION ION MICROSCOPY Author keyword 44 100% 0% 16
5 ION BEAM ANALYSIS Author keyword 36 27% 3% 112
6 PROBE FORMING SYSTEM Author keyword 29 88% 0% 14
7 ELASTIC RECOIL DETECTION Author keyword 27 44% 1% 47
8 PIXE Author keyword 25 14% 4% 170
9 SCANNING NUCLEAR MICROPROBE Author keyword 24 91% 0% 10
10 PROTON MICROPROBE Author keyword 22 53% 1% 30

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 PROTON BEAM WRITING 112 75% 2% 82 Search PROTON+BEAM+WRITING Search PROTON+BEAM+WRITING
2 NUCLEAR MICROPROBE 90 48% 3% 138 Search NUCLEAR+MICROPROBE Search NUCLEAR+MICROPROBE
3 SCANNING TRANSMISSION ION MICROSCOPY 44 100% 0% 16 Search SCANNING+TRANSMISSION+ION+MICROSCOPY Search SCANNING+TRANSMISSION+ION+MICROSCOPY
4 ION BEAM ANALYSIS 36 27% 3% 112 Search ION+BEAM+ANALYSIS Search ION+BEAM+ANALYSIS
5 PROBE FORMING SYSTEM 29 88% 0% 14 Search PROBE+FORMING+SYSTEM Search PROBE+FORMING+SYSTEM
6 ELASTIC RECOIL DETECTION 27 44% 1% 47 Search ELASTIC+RECOIL+DETECTION Search ELASTIC+RECOIL+DETECTION
7 PIXE 25 14% 4% 170 Search PIXE Search PIXE
8 SCANNING NUCLEAR MICROPROBE 24 91% 0% 10 Search SCANNING+NUCLEAR+MICROPROBE Search SCANNING+NUCLEAR+MICROPROBE
9 PROTON MICROPROBE 22 53% 1% 30 Search PROTON+MICROPROBE Search PROTON+MICROPROBE
10 QUADRUPOLE LENS 21 65% 0% 20 Search QUADRUPOLE+LENS Search QUADRUPOLE+LENS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 NUCLEAR MICROPROBE 103 49% 4% 152
2 ELASTIC RECOIL DETECTION 59 53% 2% 77
3 PROTON MICROPROBE 55 42% 2% 101
4 ION BEAM ANALYSIS 39 44% 2% 67
5 E GAS TELESCOPE 37 100% 0% 14
6 SCANNING PROTON MICROPROBE 32 60% 1% 35
7 RBS 31 33% 2% 78
8 RUTHERFORD BACKSCATTERING ANALYSIS 30 100% 0% 12
9 STIM TOMOGRAPHY 27 92% 0% 11
10 GEOSCIENCE APPLICATIONS 23 86% 0% 12

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Status of ion beam data analysis and simulation software 2006 38 140 86%
Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool 2003 99 126 59%
Bio-metals imaging and speciation in cells using proton and synchrotron radiation X-ray microspectroscopy 2009 58 57 23%
Hydrogen detection near surfaces and shallow interfaces with resonant nuclear reaction analysis 2014 5 632 23%
Application of micro- and nanoprobes to the analysis of small-sized 3D materials, nanosystems, and nanoobjects 2012 9 156 38%
Classical and macroquantum dynamics of charged particles in a magnetic field 2003 16 14 86%
Analysis of ALD-processed thin films by ion-beam techniques 2005 37 33 33%
Three-dimensional silicon micromachining 2012 5 48 46%
Characterization of interface of Al-Ni/a-Si for thin film transistor using high-resolution Rutherford backscattering spectrometry 2009 2 3 100%
ELASTIC RECOIL DETECTION 1993 28 53 62%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ION BEAM PLICAT 45 41% 2.0% 87
2 CIBA 14 37% 0.7% 30
3 ION BEAM 9 14% 1.3% 58
4 LOUISIANA ACCELERATOR 9 55% 0.3% 11
5 ELE OSTAT ACCELERATORS 8 75% 0.1% 6
6 NUCL MICROSCOPY 7 30% 0.5% 20
7 RCNM 6 80% 0.1% 4
8 VAN DE GRAAFF GRP 6 41% 0.3% 12
9 TAKASAKI ADV RADIAT 6 18% 0.7% 30
10 MICROANALYT 4 18% 0.5% 23

Related classes at same level (level 2)


Rank Relatedness score Related classes
1 0.0000020281 X-RAY SPECTROMETRY//TXRF//TOTAL REFLECTION X RAY FLUORESCENCE
2 0.0000018322 ARCHAEOMETRY//JOURNAL OF GLASS STUDIES//UMR 171
3 0.0000014435 NUCL SCI S//FLUORESCENCE YIELDS//ECPSSR
4 0.0000013963 JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-ARTICLES//JOURNAL OF RADIOANALYTICAL CHEMISTRY//K0 METHOD
5 0.0000013433 ION BEAM MIXING//RADIAT BEAM MAT ENGN//BALLISTIC MIXING
6 0.0000012030 STOPPING POWER//LAMOR//RESONANT COHERENT EXCITATION
7 0.0000010117 STRIPPER LIFETIME//CARBON STRIPPER//CARBON STRIPPER FOIL
8 0.0000009796 CHANNELING RADIATION//INFN SEZ FERRARA//VOLUME REFLECTION
9 0.0000009567 WEDGE AND STRIP ANODE//CANONICAL ABERRATION THEORY//OPT PHYS ELECT ENGN
10 0.0000007902 ACCELERATOR MASS SPECTROMETRY//RADIOCARBON//AMS