Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
1771 | 5849 | 15.5 | 61% |
Classes in level above (level 3) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
87 | 77161 | SEMICONDUCTOR LASERS//IEEE JOURNAL OF QUANTUM ELECTRONICS//JOURNAL OF CRYSTAL GROWTH |
Classes in level below (level 1) |
ID, lev. below | Publications | Label for level below |
---|---|---|
2421 | 2181 | ULTRAHIGH FREQUENCY SEMICOND ELECT//INALAS INGAAS//HIGH ELECTRON MOBILITY TRANSISTORS |
7097 | 1330 | SOLID PHASE REGROWTH//PD GE//OHMIC CONTACTS |
9876 | 1048 | LT GAAS//LOW TEMPERATURE GROWN GAAS//LOW TEMPERATURE GAAS |
16188 | 601 | ATSUGI ELECT COMMUN S FUNCT DEVICE DEV//INTEGRATED PROD BUSINESS UNIT//SINGLE VOLTAGE SUPPLY |
19720 | 428 | DRAIN CURRENT TRANSIENT//FUNCT ELEMENTS CONTROL SYST//GATE LAG |
24454 | 261 | ERSB//INP111A//DYAS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | LT GAAS | Author keyword | 38 | 58% | 1% | 44 |
2 | ULTRAHIGH FREQUENCY SEMICOND ELECT | Address | 36 | 77% | 0% | 24 |
3 | LOW TEMPERATURE GROWN GAAS | Author keyword | 26 | 56% | 1% | 32 |
4 | INALAS INGAAS | Author keyword | 18 | 53% | 0% | 23 |
5 | HIGH ELECTRON MOBILITY TRANSISTORS | Author keyword | 16 | 19% | 1% | 76 |
6 | LOW TEMPERATURE GAAS | Author keyword | 15 | 62% | 0% | 16 |
7 | METAMORPHIC | Author keyword | 12 | 27% | 1% | 39 |
8 | HEMT | Author keyword | 12 | 10% | 2% | 113 |
9 | GATE VOLTAGE SWING | Author keyword | 11 | 65% | 0% | 11 |
10 | T GATE | Author keyword | 11 | 41% | 0% | 21 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | LT GAAS | 38 | 58% | 1% | 44 | Search LT+GAAS | Search LT+GAAS |
2 | LOW TEMPERATURE GROWN GAAS | 26 | 56% | 1% | 32 | Search LOW+TEMPERATURE+GROWN+GAAS | Search LOW+TEMPERATURE+GROWN+GAAS |
3 | INALAS INGAAS | 18 | 53% | 0% | 23 | Search INALAS+INGAAS | Search INALAS+INGAAS |
4 | HIGH ELECTRON MOBILITY TRANSISTORS | 16 | 19% | 1% | 76 | Search HIGH+ELECTRON+MOBILITY+TRANSISTORS | Search HIGH+ELECTRON+MOBILITY+TRANSISTORS |
5 | LOW TEMPERATURE GAAS | 15 | 62% | 0% | 16 | Search LOW+TEMPERATURE+GAAS | Search LOW+TEMPERATURE+GAAS |
6 | METAMORPHIC | 12 | 27% | 1% | 39 | Search METAMORPHIC | Search METAMORPHIC |
7 | HEMT | 12 | 10% | 2% | 113 | Search HEMT | Search HEMT |
8 | GATE VOLTAGE SWING | 11 | 65% | 0% | 11 | Search GATE+VOLTAGE+SWING | Search GATE+VOLTAGE+SWING |
9 | T GATE | 11 | 41% | 0% | 21 | Search T+GATE | Search T+GATE |
10 | GAAS MESFET | 11 | 28% | 1% | 33 | Search GAAS+MESFET | Search GAAS+MESFET |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | HEMTS | 73 | 19% | 6% | 336 |
2 | MESFETS | 50 | 33% | 2% | 126 |
3 | INALAS INGAAS HEMTS | 48 | 65% | 1% | 46 |
4 | DOPED CHANNEL | 45 | 94% | 0% | 16 |
5 | SOLID PHASE REGROWTH | 41 | 100% | 0% | 15 |
6 | BEAM EPITAXIAL GAAS | 34 | 58% | 1% | 39 |
7 | PSEUDOMORPHIC HEMTS | 26 | 58% | 1% | 30 |
8 | LOW SUBSTRATE TEMPERATURES | 25 | 47% | 1% | 39 |
9 | GAAS MESFETS | 23 | 24% | 1% | 85 |
10 | ELECTRON MOBILITY TRANSISTORS | 21 | 14% | 2% | 140 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Mechanisms of current flow in metal-semiconductor ohmic contacts | 2007 | 51 | 268 | 41% |
LOW-TEMPERATURE-GROWN III-V MATERIALS | 1995 | 77 | 92 | 78% |
RECENT DEVELOPMENTS IN OHMIC CONTACTS FOR III-V COMPOUND SEMICONDUCTORS | 1992 | 135 | 137 | 86% |
Molecular beam epitaxy of nonstoichiometric semiconductors and multiphase material systems | 1996 | 39 | 114 | 61% |
Reliability physics of compound semiconductor transistors for microwave applications | 2001 | 20 | 53 | 58% |
EPITAXY OF DISSIMILAR MATERIALS | 1995 | 42 | 106 | 58% |
Hot electron effects and degradation of GaAs and InP HEMTs for microwave and millimetre-wave applications | 1998 | 13 | 24 | 96% |
ULTRA-HIGH-SPEED MODULATION-DOPED FIELD-EFFECT TRANSISTORS - A TUTORIAL REVIEW | 1992 | 83 | 37 | 51% |
Ohmic contacts to GaAs epitaxial layers | 1997 | 14 | 92 | 78% |
OHMIC METAL III-V-SEMICONDUCTOR CONTACTS - FABRICATION METHODS AND PROPERTIES (REVIEW) | 1994 | 11 | 48 | 83% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ULTRAHIGH FREQUENCY SEMICOND ELECT | 36 | 77% | 0.4% | 24 |
2 | MICROWAVE SEMICOND ELECT | 6 | 47% | 0.2% | 9 |
3 | KANSAI ELECT S | 6 | 38% | 0.2% | 12 |
4 | FUNCT ELEMENTS CONTROL SYST | 6 | 50% | 0.1% | 8 |
5 | MILLIMETER WAVE INNOVAT TECHNOL | 5 | 23% | 0.3% | 19 |
6 | MRSEC TECHNOL ENABLING HETEROSTRUCT MAT | 5 | 63% | 0.1% | 5 |
7 | MICROWAVE DEVICES TEAM | 4 | 67% | 0.1% | 4 |
8 | ATSUGI ELECT COMMUN S FUNCT DEVICE DEV | 4 | 75% | 0.1% | 3 |
9 | ULTRAFAST SYST GRP | 4 | 75% | 0.1% | 3 |
10 | ULTRA HIGH FREQUENCY SEMICOND ELECT | 4 | 46% | 0.1% | 6 |
Related classes at same level (level 2) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000022014 | GALLIUM ARSENIDE//SULFUR PASSIVATION//INDIUM ARSENIDE |
2 | 0.0000021245 | ADV SUBSUR E IMAGING//PHOTODETECTORS//PHOTODIODES |
3 | 0.0000019198 | EQUILIBRIUM AVERAGE PROJECTION SCHEME EAPS//ELECTRON PHONON COUPLING SYSTEM//ZERO RESISTANCE STATES |
4 | 0.0000018456 | GAAS ON SI//GAAS SI//GAINP |
5 | 0.0000013963 | EL2//NONIONIZING ENERGY LOSS NIEL//DX CENTERS |
6 | 0.0000013869 | HETEROJUNCTION BIPOLAR TRANSISTORS//HETEROJUNCTION BIPOLAR TRANSISTORS HBTS//HETEROJUNCTION BIPOLAR TRANSISTOR HBT |
7 | 0.0000008619 | GAINNAS//DILUTE NITRIDES//ANTIMONIDES |
8 | 0.0000007927 | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES//IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS//MICROWAVE AND OPTICAL TECHNOLOGY LETTERS |
9 | 0.0000007093 | QUASI NEUTRAL LIMIT//COMPRESSIBLE NAVIER STOKES EQUATIONS//DENSITY DEPENDENT VISCOSITY |
10 | 0.0000006627 | ELECT DEVICES MAT TECHNOL//PLASMA ETCHING//SIO2 ETCHING |