Class information for:
Level 2: ELLIPSOMETRY//MUELLER MATRIX//NANOOPT PROPERTY

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
1597 6577 19.3 55%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 3)


ID, lev.
above		 Publications Label for level above
78 79582 OPTICS EXPRESS//PHOTONIC CRYSTAL//PHOTONIC CRYSTALS

Classes in level below (level 1)


ID, lev. below Publications Label for level below
5231 1585 MUELLER MATRIX//SHENZHEN MINIMAL INVAS MED TECHNOL//BIOPHYS BIOIMAGING
8186 1210 NANOOPT PROPERTY//PLASMA PHYS PLASMA SOURCES//NON UNIFORM THIN FILMS
9665 1066 SURFACE PHOTOABSORPTION//REFLECTANCE ANISOTROPY SPECTROSCOPY//REFLECTION ANISOTROPY SPECTROSCOPY
16949 561 ALUMINUM DOPED ZINC OXIDE ZNOAL//ABELES EQUATIONS//OPTICAL CONDUCTIVITY MEASUREMENT
18906 464 IMAGING ELLIPSOMETRY//TOTAL INTERNAL REFLECTION ELLIPSOMETRY//ROTATING POLARIZER ANALYZER ELLIPSOMETER
20680 389 GRP OPT INTER ES//CONICAL REFRACTION//INTERNAL CONICAL REFRACTION
20732 387 INFRARED ELLIPSOMETRY//MICROELECT OPT MAT//BERLIN
23610 285 ABSORBING SUBSTRATE//SINGLE LAYER COATING//ELLIPSOMETRY PLICAT S
24468 260 MAGNETO OPTICAL ELLIPSOMETRY//GOMEL ENGINEER//INCOHERENT EFFECTS
26637 204 PHASE MODULATED FLOW BIREFRINGENCE//BICOZAMYCIN//FLEXIBLE CHAIN POLYMER
32972 100 SPECTRAL BRIGHTNESS COEFFICIENTS//EARLY WINTER SEEDING//POLARIZATION REMOTE SENSING
34651 66 CEAG//SUR E TREATMENT OPT MAT//VIBRATION STATES

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ELLIPSOMETRY Author keyword 45 12% 5% 341
2 MUELLER MATRIX Author keyword 38 26% 2% 125
3 NANOOPT PROPERTY Address 32 55% 1% 40
4 SURFACE PHOTOABSORPTION Author keyword 26 80% 0% 16
5 SPECTROSCOPIC ELLIPSOMETRY Author keyword 24 14% 2% 162
6 PLASMA PHYS PLASMA SOURCES Address 22 67% 0% 20
7 REFLECTANCE ANISOTROPY SPECTROSCOPY Author keyword 20 49% 0% 29
8 IMAGING ELLIPSOMETRY Author keyword 17 43% 0% 30
9 REFLECTION ANISOTROPY SPECTROSCOPY Author keyword 14 64% 0% 14
10 SHENZHEN MINIMAL INVAS MED TECHNOL Address 12 50% 0% 18

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 ELLIPSOMETRY 45 12% 5% 341 Search ELLIPSOMETRY Search ELLIPSOMETRY
2 MUELLER MATRIX 38 26% 2% 125 Search MUELLER+MATRIX Search MUELLER+MATRIX
3 SURFACE PHOTOABSORPTION 26 80% 0% 16 Search SURFACE+PHOTOABSORPTION Search SURFACE+PHOTOABSORPTION
4 SPECTROSCOPIC ELLIPSOMETRY 24 14% 2% 162 Search SPECTROSCOPIC+ELLIPSOMETRY Search SPECTROSCOPIC+ELLIPSOMETRY
5 REFLECTANCE ANISOTROPY SPECTROSCOPY 20 49% 0% 29 Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY
6 IMAGING ELLIPSOMETRY 17 43% 0% 30 Search IMAGING+ELLIPSOMETRY Search IMAGING+ELLIPSOMETRY
7 REFLECTION ANISOTROPY SPECTROSCOPY 14 64% 0% 14 Search REFLECTION+ANISOTROPY+SPECTROSCOPY Search REFLECTION+ANISOTROPY+SPECTROSCOPY
8 REFLECTANCE DIFFERENCE SPECTROSCOPY 12 43% 0% 21 Search REFLECTANCE+DIFFERENCE+SPECTROSCOPY Search REFLECTANCE+DIFFERENCE+SPECTROSCOPY
9 POLARIZATION ANALYSIS AND MEASUREMENT 11 65% 0% 11 Search POLARIZATION+ANALYSIS+AND+MEASUREMENT Search POLARIZATION+ANALYSIS+AND+MEASUREMENT
10 REFLECTANCE ANISOTROPY SPECTROSCOPY RAS 11 78% 0% 7 Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY+RAS Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY+RAS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 001 GAAS 79 50% 2% 114
2 REFLECTANCE DIFFERENCE SPECTROSCOPY 78 53% 2% 103
3 SPECTROSCOPIC ELLIPSOMETRY 73 18% 6% 363
4 MONOAXIAL OPTICAL COMPONENTS 52 87% 0% 26
5 RAY TRACING FORMULAS 50 75% 1% 36
6 MUELLER MATRICES 41 54% 1% 53
7 MUELLER MATRIX 41 33% 2% 100
8 4 DETECTOR PHOTOPOLARIMETER 39 73% 0% 30
9 POLAR DECOMPOSITION 34 41% 1% 65
10 BANDGAP OPTICAL ANISOTROPIES 33 100% 0% 13

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Review of passive imaging polarimetry for remote sensing applications 2006 291 58 72%
Reflection anisotropy spectroscopy 2005 195 301 57%
Polarimetric characterization of light and media 2007 97 169 50%
Conical diffraction: Hamilton's diabolical point at the heart of crystal optics 2007 66 23 70%
Polarized light imaging in biomedicine: emerging Mueller matrix methodologies for bulk tissue assessment 2015 1 60 68%
Review on Mueller matrix algebra for the analysis of polarimetric measurements 2014 2 76 91%
Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization 2013 6 28 79%
DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV 1983 2146 20 55%
Characterization of epitaxial semiconductor growth by reflectance anisotropy spectroscopy and ellipsometry 1997 70 72 74%
Multiple-angle-of-incidence ellipsometry 1999 41 16 81%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 NANOOPT PROPERTY 32 55% 0.6% 40
2 PLASMA PHYS PLASMA SOURCES 22 67% 0.3% 20
3 SHENZHEN MINIMAL INVAS MED TECHNOL 12 50% 0.3% 18
4 JOINT MODERN METROL 12 86% 0.1% 6
5 MICROELECT OPT MAT 8 28% 0.4% 25
6 LPICM 8 15% 0.7% 48
7 BIOPHYS BIOIMAGING 8 26% 0.4% 26
8 GRP OPT INTER ES 6 80% 0.1% 4
9 MED BIOPHYS RADIAT ONCOL 6 44% 0.2% 11
10 OPT IMAGING SENSING 6 26% 0.3% 20

Related classes at same level (level 2)


Rank Relatedness score Related classes
1 0.0000018762 DIGITAL PHOTOELASTICITY//RGB PHOTOELASTICITY//PHOTOELASTICITY
2 0.0000016037 CIRCULAR BRAGG PHENOMENON//GLANCING ANGLE DEPOSITION//ANTIREFLECTION
3 0.0000012474 GALLIUM ARSENIDE//SULFUR PASSIVATION//INDIUM ARSENIDE
4 0.0000010097 CORRELAT OPT//WAVES IN RANDOM MEDIA//ELECTROMAGNETIC SCATTERING BY ROUGH SURFACES
5 0.0000009918 MEASUREMENT SENSOR//DEV KAJAANI//VAISALA
6 0.0000008978 RANDOM LASER//RANDOM LASERS//RANDOM LASING
7 0.0000008781 SUM FREQUENCY GENERATION//SUM FREQUENCY SPECTROSCOPY//SPECT MOL SUR E
8 0.0000008624 INTERFACIAL SHEARS//MICROBENDING LOSS//RAPID THERMAL PROCESSING RTP
9 0.0000008075 NANO SENSORS GRP//GUIDED MODE RESONANCE//GUIDED MODE RESONANCE GMR
10 0.0000007748 DIPOLE MOMENT DERIVATIVES//BERREMAN EFFECT//EIGENSPECTRA