Class information for:
Level 2: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SINGLE EVENT UPSET SEU

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
1040 9640 19.7 37%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 3)


ID, lev.
above		 Publications Label for level above
372 29885 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//COMPUTER SCIENCE, HARDWARE & ARCHITECTURE//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

Classes in level below (level 1)


ID, lev. below Publications Label for level below
690 3093 SINGLE EVENT UPSET SEU//SINGLE EVENT UPSET//SINGLE EVENT TRANSIENT
2015 2322 TRANSITION FAULTS//FUNCTIONAL BROADSIDE TESTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
8194 1209 BUILT IN REDUNDANCY ANALYSIS BIRA//CATASTROPHIC FAULT PATTERNS//CRITICAL AREA
8737 1154 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//ANALOG FAULT DIAGNOSIS//LOOPBACK TEST
18823 469 UNIDIRECTIONAL ERRORS//SELF CHECKING CIRCUITS//BALANCED CODES
19778 426 ITERATIVE LOGIC ARRAYS//C TESTABILITY//CELL FAULT MODEL
20445 399 IBM SYST TECHNOL GRP//390//SERVER GRP
25353 236 DESIGN ERROR DIAGNOSIS//PASS FAIL INFORMATION//WITT POLYNOMIAL
27561 186 SYST LEVEL INTEGRAT GRP//DYNAMIC PARTIAL RECONFIGURATION DPR//DYNAMICALLY PROGRAMMABLE GATE ARRAY
29866 146 TRACE SIGNAL SELECTION//SILICON DEBUG//REAL TIME TRACE

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS Journal 718 66% 7% 659
2 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS Journal 201 20% 9% 911
3 SINGLE EVENT UPSET SEU Author keyword 180 71% 1% 144
4 SINGLE EVENT UPSET Author keyword 168 55% 2% 207
5 IEEE DESIGN & TEST OF COMPUTERS Journal 153 36% 4% 349
6 SINGLE EVENT TRANSIENT Author keyword 132 69% 1% 114
7 TRANSITION FAULTS Author keyword 126 85% 1% 67
8 BUILT IN SELF TEST BIST Author keyword 126 59% 1% 141
9 SINGLE EVENT EFFECTS Author keyword 123 53% 2% 163
10 SINGLE EVENT TRANSIENT SET Author keyword 123 78% 1% 80

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 SINGLE EVENT UPSET SEU 180 71% 1% 144 Search SINGLE+EVENT+UPSET+SEU Search SINGLE+EVENT+UPSET+SEU
2 SINGLE EVENT UPSET 168 55% 2% 207 Search SINGLE+EVENT+UPSET Search SINGLE+EVENT+UPSET
3 SINGLE EVENT TRANSIENT 132 69% 1% 114 Search SINGLE+EVENT+TRANSIENT Search SINGLE+EVENT+TRANSIENT
4 TRANSITION FAULTS 126 85% 1% 67 Search TRANSITION+FAULTS Search TRANSITION+FAULTS
5 BUILT IN SELF TEST BIST 126 59% 1% 141 Search BUILT+IN+SELF+TEST+BIST Search BUILT+IN+SELF+TEST+BIST
6 SINGLE EVENT EFFECTS 123 53% 2% 163 Search SINGLE+EVENT+EFFECTS Search SINGLE+EVENT+EFFECTS
7 SINGLE EVENT TRANSIENT SET 123 78% 1% 80 Search SINGLE+EVENT+TRANSIENT+SET Search SINGLE+EVENT+TRANSIENT+SET
8 DESIGN FOR TESTABILITY 108 46% 2% 174 Search DESIGN+FOR+TESTABILITY Search DESIGN+FOR+TESTABILITY
9 SOFT ERROR 108 47% 2% 169 Search SOFT+ERROR Search SOFT+ERROR
10 BUILT IN SELF TEST 93 42% 2% 169 Search BUILT+IN+SELF+TEST Search BUILT+IN+SELF+TEST

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SEU 202 78% 1% 135
2 SINGLE EVENT UPSET 135 63% 1% 135
3 UPSETS 119 72% 1% 94
4 UPSET 100 58% 1% 116
5 SRAMS 85 61% 1% 89
6 SINGLE EVENT TRANSIENTS 79 72% 1% 62
7 TESTABILITY 71 47% 1% 111
8 SOFT ERROR RATE 68 70% 1% 57
9 SINGLE EVENT UPSETS 59 62% 1% 61
10 CHARGE COLLECTION 59 36% 1% 132

Journals


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 718 66% 7% 659
2 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 201 20% 9% 911
3 IEEE DESIGN & TEST OF COMPUTERS 153 36% 4% 349
4 IEEE TRANSACTIONS ON COMPUTERS 63 11% 6% 534
5 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS 45 12% 4% 349
6 IBM JOURNAL OF RESEARCH AND DEVELOPMENT 31 12% 2% 236
7 IET COMPUTERS AND DIGITAL TECHNIQUES 19 21% 1% 82
8 ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS 13 14% 1% 89
9 INTEGRATION-THE VLSI JOURNAL 11 11% 1% 92
10 IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES 8 10% 1% 70

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Basic mechanisms and modeling of single-event upset in digital microelectronics 2003 347 120 93%
IBM experiments in soft fails in computer electronics (1978-1994) 1996 152 18 100%
On-line testing for VLSI - A compendium of approaches 1998 75 10 100%
Real-time soft-error rate measurements: A review 2014 1 34 85%
Defect tolerance in VLSI circuits: Techniques and yield analysis 1998 73 51 86%
Physics-based simulation of single-event effects 2005 48 89 88%
Debug support for complex systems on-chip: a review 2006 40 4 75%
Iddq testing for CMOS VLSI 2000 53 19 74%
Device simulation of charge collection and single-event upset 1996 78 84 79%
A review of yield modelling techniques for semiconductor manufacturing 2006 31 29 69%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SPACE DEF ELECT 122 86% 0.6% 62
2 IBM SYST TECHNOL GRP 49 66% 0.5% 46
3 COMP AIDED DESIGN TEST GRP 33 100% 0.1% 13
4 RADIAT EFFECTS GRP 25 71% 0.2% 20
5 390 15 68% 0.1% 13
6 ISDE 15 88% 0.1% 7
7 IC DESIGN DIGITAL DESIGN TEST 14 100% 0.1% 7
8 FAULT TOLERANT COMP GRP 13 80% 0.1% 8
9 COMPONENT ENGN GRP 11 100% 0.1% 6
10 RELIABLE HIGH PERFORMANCE COMP 10 37% 0.2% 23

Related classes at same level (level 2)


Rank Relatedness score Related classes
1 0.0000018208 MULTIPLE VALUED LOGIC//LOGIC SYNTHESIS//REED MULLER EXPANSIONS
2 0.0000015941 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//HIGH LEVEL SYNTHESIS
3 0.0000008721 IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//FLOORPLANNING//PHYSICAL DESIGN
4 0.0000007777 RESIDUE NUMBER SYSTEM RNS//RESIDUE NUMBER SYSTEM//RESIDUE ARITHMETIC
5 0.0000007406 IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//SOLID-STATE ELECTRONICS
6 0.0000005620 JOURNAL OF CELLULAR AUTOMATA//CELLULAR AUTOMATA//ELEMENTARY CELLULAR AUTOMATA
7 0.0000004660 SIMULATION//ARIZONA INTEGRAT MODELING SIMULAT//TIME WARP
8 0.0000004175 SMPTE JOURNAL//SMPTE MOTION IMAGING JOURNAL//ENTERTAINMENT IMAGING BUSINESS UNIT
9 0.0000004082 ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING//CURRENT CONVEYORS//IEEE JOURNAL OF SOLID-STATE CIRCUITS
10 0.0000003899 PARALLEL COMPUTING//JOURNAL OF PARALLEL AND DISTRIBUTED COMPUTING//INTERNATIONAL JOURNAL OF PARALLEL PROGRAMMING