Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
9671 | 1066 | 16.8 | 50% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1700 | 6150 | HETEROJUNCTION BIPOLAR TRANSISTORS//HETEROJUNCTION BIPOLAR TRANSISTORS HBTS//HETEROJUNCTION BIPOLAR TRANSISTOR HBT |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | A AMA MICROELECT SCI TECHNOL | Address | 28 | 44% | 4% | 47 |
2 | SIGEHBT | Author keyword | 20 | 33% | 5% | 51 |
3 | SIGE HBT | Author keyword | 13 | 28% | 4% | 40 |
4 | SIGE HETEROJUNCTION BIPOLAR TRANSISTORS HBTS | Author keyword | 13 | 80% | 1% | 8 |
5 | BASE TRANSIT TIME | Author keyword | 13 | 69% | 1% | 11 |
6 | MIXED MODE STRESS | Author keyword | 10 | 73% | 1% | 8 |
7 | SIGEHBTS | Author keyword | 8 | 44% | 1% | 14 |
8 | SILICON GERMANIUM SIGE | Author keyword | 8 | 21% | 3% | 33 |
9 | NEUTRAL BASE RECOMBINATION | Author keyword | 6 | 80% | 0% | 4 |
10 | PROTON TOLERANCE | Author keyword | 6 | 80% | 0% | 4 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | 77 K APPLICATIONS | 44 | 88% | 2% | 21 |
2 | CHARGE CONTROL RELATION | 35 | 89% | 2% | 16 |
3 | BIPOLAR TRANSISTORS | 24 | 17% | 12% | 125 |
4 | PROFILE DESIGN | 21 | 69% | 2% | 18 |
5 | COLLECTOR BASE JUNCTION | 11 | 78% | 1% | 7 |
6 | QUASI NEUTRAL LAYERS | 11 | 78% | 1% | 7 |
7 | RHBD TECHNIQUES | 11 | 78% | 1% | 7 |
8 | DEEP TRENCH ISOLATION | 9 | 83% | 0% | 5 |
9 | BASE BIPOLAR TECHNOLOGY | 8 | 70% | 1% | 7 |
10 | STATIC MODELS | 8 | 75% | 1% | 6 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
SiGe HBT technology: A new contender for Si-based RF and microwave circuit applications | 1998 | 197 | 40 | 50% |
Scaling of SiGe heterojunction bipolar transistors | 2005 | 31 | 29 | 34% |
SiGe HBT for application in BiCMOS technology: II. Design, technology and performance | 2001 | 20 | 29 | 45% |
Methods for Determining the Emitter Resistance in SiGe HBTs: A Review and an Evaluation Across Technology Generations | 2015 | 0 | 16 | 69% |
Noise behavior in SiGe devices | 2001 | 14 | 19 | 37% |
A review of radiation effects in heterojunction bipolar transistors | 2005 | 0 | 32 | 53% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | A AMA MICROELECT SCI TECHNOL | 28 | 44% | 4.4% | 47 |
2 | ELE ON DEVICES INTEGRATED CIRCUITS | 1 | 100% | 0.2% | 2 |
3 | PHYS THIN FILMS MAT ELECT LPCMME | 1 | 100% | 0.2% | 2 |
4 | SMMC | 1 | 100% | 0.2% | 2 |
5 | MICROELECT SEMICOND DEV | 1 | 40% | 0.2% | 2 |
6 | INSA LYONCNRS | 1 | 50% | 0.1% | 1 |
7 | MICROWAVE COMPONENT GRP | 1 | 50% | 0.1% | 1 |
8 | RF DEV | 1 | 50% | 0.1% | 1 |
9 | SEMICOND DEVICE TECHNOL | 1 | 50% | 0.1% | 1 |
10 | STEVENSON 5635 | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000262300 | PASSIVATED CONTACT//POLYSILICON EMITTER//CLOCK ACCESS TIME |
2 | 0.0000201095 | HETEROJUNCTION BIPOLAR TRANSISTORS//HETEROJUNCTION BIPOLAR TRANSISTOR//HBT |
3 | 0.0000172375 | HORIZONTAL CURRENT BIPOLAR TRANSISTOR HCBT//DYNAMIC THRESHOLD MOSFET DTMOS//LATERAL BIPOLAR TRANSISTOR |
4 | 0.0000135474 | OPEN CIRCUIT VOLTAGE DECAY OCVD//APPARENT BAND GAP NARROWING//EQUIVALENT DIAGRAM |
5 | 0.0000090137 | DECISION CIRCUITS//DEMULTIPLEXING EQUIPMENT//MIKROELEKT ZENTRUM A |
6 | 0.0000089403 | STRAINED SI//SIGE//STRAINED SILICON |
7 | 0.0000072853 | NONQUASI STATIC NQS EFFECT//QUCS//RSCE |
8 | 0.0000059506 | CARL EMILY FUCHS MICROELECT//CEFIM//EUROPEAN QUAL |
9 | 0.0000058508 | ULTRAVIOLET LIGHT DETECTORS//ORIENTATION OF MOLECULES//BORON CHEMICAL VAPOR DEPOSITION |
10 | 0.0000053339 | OXIDE TRAPPED CHARGE//ELDRS//TOTAL IONIZING DOSE |