Class information for:
Level 1: SURFACE PHOTOABSORPTION//REFLECTANCE ANISOTROPY SPECTROSCOPY//REFLECTION ANISOTROPY SPECTROSCOPY

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
9665 1066 22.9 73%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1597 6577 ELLIPSOMETRY//MUELLER MATRIX//NANOOPT PROPERTY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SURFACE PHOTOABSORPTION Author keyword 26 80% 2% 16
2 REFLECTANCE ANISOTROPY SPECTROSCOPY Author keyword 20 49% 3% 29
3 REFLECTION ANISOTROPY SPECTROSCOPY Author keyword 14 64% 1% 14
4 REFLECTANCE ANISOTROPY SPECTROSCOPY RAS Author keyword 11 78% 1% 7
5 REFLECTANCE DIFFERENCE SPECTROSCOPY Author keyword 10 41% 2% 20
6 REFLECTANCE DIFFERENCE SPECTROSCOPY RDS Author keyword 6 80% 0% 4
7 S K GROWTH Author keyword 4 75% 0% 3
8 INVEST COMUNICAC OPT Address 3 15% 2% 21
9 LASER REFLECTOMETRY Author keyword 3 35% 1% 8
10 MONOLAYER OSCILLATION Author keyword 3 100% 0% 3

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 SURFACE PHOTOABSORPTION 26 80% 2% 16 Search SURFACE+PHOTOABSORPTION Search SURFACE+PHOTOABSORPTION
2 REFLECTANCE ANISOTROPY SPECTROSCOPY 20 49% 3% 29 Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY
3 REFLECTION ANISOTROPY SPECTROSCOPY 14 64% 1% 14 Search REFLECTION+ANISOTROPY+SPECTROSCOPY Search REFLECTION+ANISOTROPY+SPECTROSCOPY
4 REFLECTANCE ANISOTROPY SPECTROSCOPY RAS 11 78% 1% 7 Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY+RAS Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY+RAS
5 REFLECTANCE DIFFERENCE SPECTROSCOPY 10 41% 2% 20 Search REFLECTANCE+DIFFERENCE+SPECTROSCOPY Search REFLECTANCE+DIFFERENCE+SPECTROSCOPY
6 REFLECTANCE DIFFERENCE SPECTROSCOPY RDS 6 80% 0% 4 Search REFLECTANCE+DIFFERENCE+SPECTROSCOPY+RDS Search REFLECTANCE+DIFFERENCE+SPECTROSCOPY+RDS
7 S K GROWTH 4 75% 0% 3 Search S+K+GROWTH Search S+K+GROWTH
8 LASER REFLECTOMETRY 3 35% 1% 8 Search LASER+REFLECTOMETRY Search LASER+REFLECTOMETRY
9 MONOLAYER OSCILLATION 3 100% 0% 3 Search MONOLAYER+OSCILLATION Search MONOLAYER+OSCILLATION
10 REFLECTANCE ANISOTROPY SPECTROSCOPY RAS RDS 3 100% 0% 3 Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY+RAS+RDS Search REFLECTANCE+ANISOTROPY+SPECTROSCOPY+RAS+RDS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 001 GAAS 79 50% 11% 114
2 REFLECTANCE DIFFERENCE SPECTROSCOPY 74 52% 9% 101
3 BANDGAP OPTICAL ANISOTROPIES 33 100% 1% 13
4 ANISOTROPY SPECTROSCOPY 29 52% 4% 40
5 REFLECTION ANISOTROPY SPECTROSCOPY 19 55% 2% 24
6 CUBIC SEMICONDUCTORS 18 36% 4% 42
7 OPTICAL ANISOTROPIES 18 46% 3% 29
8 INDUCED OPTICAL ANISOTROPIES 18 89% 1% 8
9 DIFFERENCE SPECTROSCOPY 16 17% 8% 90
10 001 GAAS SURFACES 15 68% 1% 13

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Reflection anisotropy spectroscopy 2005 195 301 55%
Characterization of epitaxial semiconductor growth by reflectance anisotropy spectroscopy and ellipsometry 1997 70 72 60%
Stress-induced optical anisotropies measured by modulated reflectance 2004 9 44 80%
Aspects of reflectance anisotropy spectroscopy from semiconductor surfaces 1998 38 64 50%
Real-time optical characterization of thin film growth 2001 9 43 74%
Polarizable dipole models for reflectance anisotropy spectroscopy: a review 2004 8 61 54%
Real-time diagnostics for metalorganic vapor phase epitaxy 2005 4 4 75%
Calculation of reflectance anisotropy for semiconductor surface exploration 2005 10 72 49%
PHASE-MODULATED ELLIPSOMETRY FROM THE ULTRAVIOLET TO THE INFRARED - IN-SITU APPLICATION TO THE GROWTH OF SEMICONDUCTORS 1993 90 90 21%
Optical diagnostics for thin film processing 2003 6 268 16%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 INVEST COMUNICAC OPT 3 15% 2.0% 21
2 OPTOELE ON MAT 2 67% 0.2% 2
3 IRC SUR E SCI 1 19% 0.7% 7
4 CHRISTIAN DOPPLER OBERFLACHENOPT 1 100% 0.2% 2
5 HALBLEITERPHYS FESTKORPERPHYS 1 50% 0.2% 2
6 SCI TECHNOL CHEMPOB 88SACKVILLE ST 1 100% 0.2% 2
7 UMR CNRS 7601 1 27% 0.4% 4
8 UNITE RECH HETEROEPITAXIES PLICAT 1 16% 0.6% 6
9 SEKR PN 6 1 1 40% 0.2% 2
10 FBH 1 33% 0.2% 2

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000237378 ELECTRON COUNTING MODEL//SUR E STUDY//GA ADATOM
2 0.0000189408 MEASUREMENT ENGN SENSOR TECHNOL//PHYS TECHNOL LOW DIMENS STRUCT//PLANAR MICROCAVITIES
3 0.0000186928 OBLIQUE INCIDENCE REFLECTIVITY DIFFERENCE//OBLIQUE INCIDENCE REFLECTIVITY DIFFERENCE OIRD//OBLIQUE INCIDENCE REFLECTIVITY DIFFERENCE OI RD
4 0.0000143014 NANOOPT PROPERTY//PLASMA PHYS PLASMA SOURCES//NON UNIFORM THIN FILMS
5 0.0000111393 ULYANOVSK BRANCH//BREIT OPERATOR//LIGHT INTENSITY FLUCTUATIONS
6 0.0000106672 HIGH RESOLUTION LOW ENERGY ELECTRON DIFFRACTION//GAAS GAP//SURFACE RESONANCES
7 0.0000096374 ACOUSTIC SURFACE PLASMON//SURFACE PLASMON DISPERSION//SURFACE PLASMON LIFETIME
8 0.0000093931 SHG MICROSCOPE//2ND HARMONIC GENERATION//AC LEON
9 0.0000092440 TRIMETHYLINDIUM//CHEMICAL BEAM EPITAXY CBE//MOLECULAR LAYER EPITAXY
10 0.0000088166 IMAGING ELLIPSOMETRY//TOTAL INTERNAL REFLECTION ELLIPSOMETRY//ROTATING POLARIZER ANALYZER ELLIPSOMETER