Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
9401 | 1091 | 19.1 | 46% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
2051 | 4868 | SCANNING//LAMACOP//BACKSCATTERED ELECTRONS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | LAMACOP | Address | 27 | 71% | 2% | 22 |
2 | SECONDARY ELECTRON EMISSION | Author keyword | 11 | 16% | 6% | 62 |
3 | ALUMINA INSULATOR | Author keyword | 9 | 83% | 0% | 5 |
4 | SURFACE FLASHOVER IN VACUUM | Author keyword | 9 | 67% | 1% | 8 |
5 | DEEP DIELECTRIC CHARGING | Author keyword | 8 | 70% | 1% | 7 |
6 | BEAM TRANSPORT CONTROL | Author keyword | 8 | 100% | 0% | 5 |
7 | INSULATOR BEAM GUIDE | Author keyword | 8 | 100% | 0% | 5 |
8 | RADIATION INDUCED CONDUCTIVITY RIC | Author keyword | 7 | 67% | 1% | 6 |
9 | SURFACE FLASHOVER | Author keyword | 6 | 23% | 2% | 24 |
10 | X RAY INDUCED SECONDARY ELECTRON EMISSION | Author keyword | 6 | 100% | 0% | 4 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | FLASHOVER | 19 | 24% | 6% | 69 |
2 | IRRADIATED INSULATORS | 15 | 71% | 1% | 12 |
3 | SURFACE FLASHOVER | 10 | 30% | 3% | 29 |
4 | EMISSION YIELD | 7 | 50% | 1% | 10 |
5 | ALUMINA INSULATORS | 6 | 80% | 0% | 4 |
6 | INSULATING TARGET | 6 | 58% | 1% | 7 |
7 | PULSED FLASHOVER | 4 | 67% | 0% | 4 |
8 | SOLID INSULATORS | 4 | 56% | 0% | 5 |
9 | ALPHA SIO2 | 2 | 40% | 0% | 4 |
10 | LINEWIDTH METROLOGY | 2 | 40% | 0% | 4 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Alumina based ceramics for high-voltage insulation | 2010 | 19 | 18 | 61% |
SURFACE FLASHOVER OF INSULATORS | 1989 | 216 | 34 | 79% |
Self-consistent charging in dielectric films under defocused electron beam irradiation | 2011 | 4 | 30 | 80% |
Recent developments and new strategies in scanning electron microscopy | 2005 | 40 | 29 | 45% |
The surface potential of insulating thin films negatively charged by a low-energy focused electron beam | 2010 | 8 | 33 | 76% |
Low voltage scanning electron microscopy | 1996 | 131 | 20 | 20% |
Space charge characterization for the 21st century | 1997 | 45 | 45 | 33% |
Study of dynamic behavior of trapped charge in the insulating materials by using a new experimental approach | 2014 | 0 | 11 | 100% |
Experimental Investigation of Electron Emission from Dielectric Surfaces Due to Primary Electron Beam: A Review | 2014 | 0 | 25 | 72% |
The hopping electron cathode for cathode ray tubes | 2004 | 0 | 7 | 86% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | LAMACOP | 27 | 71% | 2.0% | 22 |
2 | MAU | 4 | 75% | 0.3% | 3 |
3 | G PI MAT FONCT | 3 | 57% | 0.4% | 4 |
4 | DTI UMR 6107 | 3 | 100% | 0.3% | 3 |
5 | ELE ON EMISS SOURCE | 3 | 35% | 0.5% | 6 |
6 | LASSI | 2 | 32% | 0.5% | 6 |
7 | MAT PHYS GRP | 2 | 16% | 0.8% | 9 |
8 | LPIO EA 3254 | 1 | 100% | 0.2% | 2 |
9 | RELIABIL ENGN OFF | 1 | 50% | 0.2% | 2 |
10 | UMR 6107 | 1 | 17% | 0.6% | 7 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000161239 | ELECTRON BEAM TESTING//SOREP//VOLTAGE CONTRAST |
2 | 0.0000156196 | MEAN PENETRATION DEPTH//CONTINUOUS SLOWING DOWN APPROXIMATION//DOPANT CONTRAST |
3 | 0.0000149390 | MULTIPACTOR//AURORA SOFTWARE TESTING SL//ELECTRON CLOUD INSTABILITY |
4 | 0.0000140855 | SPACECRAFT CHARGING//SPACECRAFT ENVIRONM INTERACT ENGN//LORENTZ SPACECRAFT |
5 | 0.0000108690 | EPOXY RESIN INSULATOR//SURFACE CHARGE ACCUMULATION//ELE OPHYS HIGH VOLTAGE TECH |
6 | 0.0000107090 | SCANNING//SECONDARY EMISSION NOISE//INTEGRATED CIRCUIT ADV PROC TECHNOL |
7 | 0.0000106711 | ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE//ENVIRONMENTAL SEM//VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE |
8 | 0.0000078679 | IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION//IEEE TRANSACTIONS ON ELECTRICAL INSULATION//SPACE CHARGE |
9 | 0.0000073748 | EMISSION STATISTICS//PARTICLE INDUCED ELECTRON EMISSION//KINETIC ELECTRON EMISSION |
10 | 0.0000065371 | ALKALI ION MIGRATION//ETUD MAT PROC ACTIF//DEN DTCD SECM |