Class information for:
Level 1: LAMACOP//SECONDARY ELECTRON EMISSION//ALUMINA INSULATOR

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
9401 1091 19.1 46%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
2051 4868 SCANNING//LAMACOP//BACKSCATTERED ELECTRONS

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
1 LAMACOP Address 27 71% 2% 22
2 SECONDARY ELECTRON EMISSION Author keyword 11 16% 6% 62
3 ALUMINA INSULATOR Author keyword 9 83% 0% 5
4 SURFACE FLASHOVER IN VACUUM Author keyword 9 67% 1% 8
5 DEEP DIELECTRIC CHARGING Author keyword 8 70% 1% 7
6 BEAM TRANSPORT CONTROL Author keyword 8 100% 0% 5
7 INSULATOR BEAM GUIDE Author keyword 8 100% 0% 5
8 RADIATION INDUCED CONDUCTIVITY RIC Author keyword 7 67% 1% 6
9 SURFACE FLASHOVER Author keyword 6 23% 2% 24
10 X RAY INDUCED SECONDARY ELECTRON EMISSION Author keyword 6 100% 0% 4

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
LCSH search Wikipedia search
1 SECONDARY ELECTRON EMISSION 11 16% 6% 62 Search SECONDARY+ELECTRON+EMISSION Search SECONDARY+ELECTRON+EMISSION
2 ALUMINA INSULATOR 9 83% 0% 5 Search ALUMINA+INSULATOR Search ALUMINA+INSULATOR
3 SURFACE FLASHOVER IN VACUUM 9 67% 1% 8 Search SURFACE+FLASHOVER+IN+VACUUM Search SURFACE+FLASHOVER+IN+VACUUM
4 DEEP DIELECTRIC CHARGING 8 70% 1% 7 Search DEEP+DIELECTRIC+CHARGING Search DEEP+DIELECTRIC+CHARGING
5 BEAM TRANSPORT CONTROL 8 100% 0% 5 Search BEAM+TRANSPORT+CONTROL Search BEAM+TRANSPORT+CONTROL
6 INSULATOR BEAM GUIDE 8 100% 0% 5 Search INSULATOR+BEAM+GUIDE Search INSULATOR+BEAM+GUIDE
7 RADIATION INDUCED CONDUCTIVITY RIC 7 67% 1% 6 Search RADIATION+INDUCED+CONDUCTIVITY+RIC Search RADIATION+INDUCED+CONDUCTIVITY+RIC
8 SURFACE FLASHOVER 6 23% 2% 24 Search SURFACE+FLASHOVER Search SURFACE+FLASHOVER
9 X RAY INDUCED SECONDARY ELECTRON EMISSION 6 100% 0% 4 Search X+RAY+INDUCED+SECONDARY+ELECTRON+EMISSION Search X+RAY+INDUCED+SECONDARY+ELECTRON+EMISSION
10 VACUUM INSULATOR 4 75% 0% 3 Search VACUUM+INSULATOR Search VACUUM+INSULATOR

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
1 FLASHOVER 19 24% 6% 69
2 IRRADIATED INSULATORS 15 71% 1% 12
3 SURFACE FLASHOVER 10 30% 3% 29
4 EMISSION YIELD 7 50% 1% 10
5 ALUMINA INSULATORS 6 80% 0% 4
6 INSULATING TARGET 6 58% 1% 7
7 PULSED FLASHOVER 4 67% 0% 4
8 SOLID INSULATORS 4 56% 0% 5
9 ALPHA SIO2 2 40% 0% 4
10 LINEWIDTH METROLOGY 2 40% 0% 4

Journals

Reviews



Title Publ. year Cit. Active
references
% act. ref.
to same field
Alumina based ceramics for high-voltage insulation 2010 19 18 61%
SURFACE FLASHOVER OF INSULATORS 1989 216 34 79%
Self-consistent charging in dielectric films under defocused electron beam irradiation 2011 4 30 80%
Recent developments and new strategies in scanning electron microscopy 2005 40 29 45%
The surface potential of insulating thin films negatively charged by a low-energy focused electron beam 2010 8 33 76%
Low voltage scanning electron microscopy 1996 131 20 20%
Space charge characterization for the 21st century 1997 45 45 33%
Study of dynamic behavior of trapped charge in the insulating materials by using a new experimental approach 2014 0 11 100%
Experimental Investigation of Electron Emission from Dielectric Surfaces Due to Primary Electron Beam: A Review 2014 0 25 72%
The hopping electron cathode for cathode ray tubes 2004 0 7 86%

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
1 LAMACOP 27 71% 2.0% 22
2 MAU 4 75% 0.3% 3
3 G PI MAT FONCT 3 57% 0.4% 4
4 DTI UMR 6107 3 100% 0.3% 3
5 ELE ON EMISS SOURCE 3 35% 0.5% 6
6 LASSI 2 32% 0.5% 6
7 MAT PHYS GRP 2 16% 0.8% 9
8 LPIO EA 3254 1 100% 0.2% 2
9 RELIABIL ENGN OFF 1 50% 0.2% 2
10 UMR 6107 1 17% 0.6% 7

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000161239 ELECTRON BEAM TESTING//SOREP//VOLTAGE CONTRAST
2 0.0000156196 MEAN PENETRATION DEPTH//CONTINUOUS SLOWING DOWN APPROXIMATION//DOPANT CONTRAST
3 0.0000149390 MULTIPACTOR//AURORA SOFTWARE TESTING SL//ELECTRON CLOUD INSTABILITY
4 0.0000140855 SPACECRAFT CHARGING//SPACECRAFT ENVIRONM INTERACT ENGN//LORENTZ SPACECRAFT
5 0.0000108690 EPOXY RESIN INSULATOR//SURFACE CHARGE ACCUMULATION//ELE OPHYS HIGH VOLTAGE TECH
6 0.0000107090 SCANNING//SECONDARY EMISSION NOISE//INTEGRATED CIRCUIT ADV PROC TECHNOL
7 0.0000106711 ENVIRONMENTAL SCANNING ELECTRON MICROSCOPE//ENVIRONMENTAL SEM//VARIABLE PRESSURE SCANNING ELECTRON MICROSCOPE
8 0.0000078679 IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION//IEEE TRANSACTIONS ON ELECTRICAL INSULATION//SPACE CHARGE
9 0.0000073748 EMISSION STATISTICS//PARTICLE INDUCED ELECTRON EMISSION//KINETIC ELECTRON EMISSION
10 0.0000065371 ALKALI ION MIGRATION//ETUD MAT PROC ACTIF//DEN DTCD SECM