Class information for:
Level 1: CATHODE LENS//SPECTROMICROSCOPY//PHOTOEMISSION MICROSCOPY

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
9166 1113 23.9 58%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1490 7092 EUV LITHOG//UNDULATORS//SPECTROMICROSCOPY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 CATHODE LENS Author keyword 23 76% 1% 16
2 SPECTROMICROSCOPY Author keyword 19 37% 4% 41
3 PHOTOEMISSION MICROSCOPY Author keyword 14 55% 2% 17
4 EMISSION ELECTRON MICROSCOPE EEM Author keyword 11 100% 1% 6
5 XPEEM Author keyword 9 41% 2% 17
6 WIEN FILTER Author keyword 9 42% 1% 16
7 PEEM Author keyword 8 25% 2% 27
8 IST NEUROBIOL Address 6 29% 2% 19
9 EXPEEM Author keyword 6 100% 0% 4
10 VERY LOW ENERGY STEM Author keyword 6 100% 0% 4

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 CATHODE LENS 23 76% 1% 16 Search CATHODE+LENS Search CATHODE+LENS
2 SPECTROMICROSCOPY 19 37% 4% 41 Search SPECTROMICROSCOPY Search SPECTROMICROSCOPY
3 PHOTOEMISSION MICROSCOPY 14 55% 2% 17 Search PHOTOEMISSION+MICROSCOPY Search PHOTOEMISSION+MICROSCOPY
4 EMISSION ELECTRON MICROSCOPE EEM 11 100% 1% 6 Search EMISSION+ELECTRON+MICROSCOPE+EEM Search EMISSION+ELECTRON+MICROSCOPE+EEM
5 XPEEM 9 41% 2% 17 Search XPEEM Search XPEEM
6 WIEN FILTER 9 42% 1% 16 Search WIEN+FILTER Search WIEN+FILTER
7 PEEM 8 25% 2% 27 Search PEEM Search PEEM
8 EXPEEM 6 100% 0% 4 Search EXPEEM Search EXPEEM
9 VERY LOW ENERGY STEM 6 100% 0% 4 Search VERY+LOW+ENERGY+STEM Search VERY+LOW+ENERGY+STEM
10 LEEM 5 26% 2% 18 Search LEEM Search LEEM

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 PHOTOELECTRON MICROSCOPY 31 63% 3% 31
2 PHOTOEMISSION SPECTROMICROSCOPY 31 92% 1% 12
3 CATHODE LENS 30 84% 1% 16
4 PHOTOEMISSION ELECTRON MICROSCOPY 23 39% 4% 46
5 MULTIPHOTON PHOTOEMISSION 21 73% 1% 16
6 PHOTOELECTRON MICROSCOPE 18 89% 1% 8
7 SPECTROMICROSCOPY 16 21% 6% 70
8 LEEM 16 64% 1% 16
9 ENERGY FILTER 14 64% 1% 14
10 PEEM 12 50% 2% 17

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
LOW-ENERGY-ELECTRON MICROSCOPY 1994 363 66 47%
Photoelectron microscopy and applications in surface and materials science 2002 87 168 58%
Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM 2008 54 137 34%
Scanning low-energy electron microscopy 2003 61 109 28%
Aberration correction past and present 2009 22 73 32%
Imaging of magnetic structures by photoemission electron microscopy 1999 42 93 38%
Theory and Computation of Electron Mirrors: The Central Particle Method 2013 2 22 64%
Time-resolved photoemission electron microscopy 2006 23 227 36%
THE CONTINUING DEVELOPMENT OF LOW-ENERGY ELECTRON-MICROSCOPY FOR CHARACTERIZING SURFACES 1992 38 34 71%
Investigating surface magnetism by means of photoexcitation electron emission microscopy 2002 34 111 37%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 IST NEUROBIOL 6 29% 1.7% 19
2 IRAMIS SPCSI LENSIS 2 67% 0.2% 2
3 FR EXPT PHYS 72 1 50% 0.2% 2
4 FESTKORPERFOR IFF 9 1 24% 0.4% 4
5 IFF 6 1 40% 0.2% 2
6 LENSIS 1 40% 0.2% 2
7 LIFE CULTURE 1 17% 0.4% 4
8 BIRCHES IND ESTATE 1 50% 0.1% 1
9 CREATIVE INITIAT SOUSEI 1 50% 0.1% 1
10 FESTKORPERFOR IFF6 1 50% 0.1% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000146768 CANONICAL ABERRATION THEORY//OPT PHYS ELECT ENGN//ACCURACY OF COMPUTATION
2 0.0000145950 BIMR//STXM//SOFT X RAY SPECTROMICROSCOPY
3 0.0000102253 CONTACT MICROSCOPY//LEAF DETAILS//SOFT X RAY CONTACT MICROSCOPY
4 0.0000092544 MICROCOLUMN//SCHOTTKY EMITTER//PROD DESIGN TECHNOL
5 0.0000086921 MEAN PENETRATION DEPTH//CONTINUOUS SLOWING DOWN APPROXIMATION//DOPANT CONTRAST
6 0.0000078199 GASSENDI//FRONT ENDS//VARIED LINE SPACING GRATINGS
7 0.0000062723 ELECTRON BEAM TESTING//SOREP//VOLTAGE CONTRAST
8 0.0000059789 X RAY MICROSCOPY//FRESNEL ZONE PLATES//RONTGENPHYS
9 0.0000058193 SECOND ORDER FOCUSING//SPACE PLASMA INSTRUMENT//SPHERICAL CONDENSER
10 0.0000054869 IMFP//ELASTIC PEAK ELECTRON SPECTROSCOPY//SURFACE EXCITATION