Class information for:
Level 1: LIFETIME CONTROL//SEMI INSULATING MATERIALS//POWER DIODES

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
9059 1125 16.2 43%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
372 16511 SWAMP//OXYGEN PRECIPITATION//GROWN IN DEFECT

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 LIFETIME CONTROL Author keyword 13 47% 2% 21
2 SEMI INSULATING MATERIALS Author keyword 3 100% 0% 3
3 POWER DIODES Author keyword 3 30% 1% 8
4 LOCAL LIFETIME CONTROL Author keyword 2 44% 0% 4
5 FLEROV NUCL REACT DUBNA Address 2 67% 0% 2
6 IMPURITY INTERSTITIALS Author keyword 2 67% 0% 2
7 MICROWAVE PROBED PHOTOCONDUCTIVITY Author keyword 2 50% 0% 3
8 TRIVACANCY Author keyword 2 50% 0% 3
9 HRPITS Author keyword 2 36% 0% 4
10 SI PHOTODIODE Author keyword 2 36% 0% 4

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 LIFETIME CONTROL 13 47% 2% 21 Search LIFETIME+CONTROL Search LIFETIME+CONTROL
2 SEMI INSULATING MATERIALS 3 100% 0% 3 Search SEMI+++INSULATING+MATERIALS Search SEMI+++INSULATING+MATERIALS
3 POWER DIODES 3 30% 1% 8 Search POWER+DIODES Search POWER+DIODES
4 LOCAL LIFETIME CONTROL 2 44% 0% 4 Search LOCAL+LIFETIME+CONTROL Search LOCAL+LIFETIME+CONTROL
5 IMPURITY INTERSTITIALS 2 67% 0% 2 Search IMPURITY+INTERSTITIALS Search IMPURITY+INTERSTITIALS
6 MICROWAVE PROBED PHOTOCONDUCTIVITY 2 50% 0% 3 Search MICROWAVE+PROBED+PHOTOCONDUCTIVITY Search MICROWAVE+PROBED+PHOTOCONDUCTIVITY
7 TRIVACANCY 2 50% 0% 3 Search TRIVACANCY Search TRIVACANCY
8 HRPITS 2 36% 0% 4 Search HRPITS Search HRPITS
9 SI PHOTODIODE 2 36% 0% 4 Search SI+PHOTODIODE Search SI+PHOTODIODE
10 HIGH TEMPERATURE IRRADIATION 2 29% 0% 5 Search HIGH+TEMPERATURE+IRRADIATION Search HIGH+TEMPERATURE+IRRADIATION

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 IRRADIATED SILICON 22 22% 8% 89
2 DIVACANCY 19 36% 4% 43
3 LIFETIME CONTROL 11 44% 2% 19
4 PROTON IRRADIATED SILICON 8 62% 1% 8
5 88 K 6 100% 0% 4
6 I N DIODE 4 42% 1% 8
7 BOMBARDED SILICON 4 40% 1% 8
8 RADIATION DEFECTS 4 17% 2% 20
9 TRANSIENT SPECTROSCOPY CHARACTERIZATION 3 100% 0% 3
10 DIVACANCIES 2 20% 1% 10

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
FRENKEL PAIRS IN GERMANIUM AND SILICON (REVIEW) 1992 20 14 64%
Deep level transient spectroscopy of defects in high-energy light-particle irradiated Si 2004 15 92 29%
Doping of semiconductors using radiation defects produced by irradiation with protons and alpha particles 2001 30 77 17%
Formation efficiency of the thermostable recombination centres in irradiated silicon p-n structures 1996 0 6 67%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 FLEROV NUCL REACT DUBNA 2 67% 0.2% 2
2 PHYS PHYS ELECT 2 23% 0.6% 7
3 CRMR2 1 100% 0.2% 2
4 MPI HIGH MAGNET FIELD 1 50% 0.2% 2
5 DYNAMITRON TANDEM 1 18% 0.4% 4
6 CHAIR POWER ELECT EMC 1 50% 0.1% 1
7 KAWAMURA 1 50% 0.1% 1
8 NANOTECHNOL OPEN 1 50% 0.1% 1
9 RF TEST TECHNOL 1 50% 0.1% 1
10 SLOVAK OFF STANDARDS METROL TESTING 1 50% 0.1% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000218208 CLUSTER OF DEFECTS//GROUP II ELEMENTS//SI CD
2 0.0000167362 ELECT MAT DEVICES NANOSTRUCT//L DLTS//CNR IMM MATIS
3 0.0000115898 NONIONIZING ENERGY LOSS NIEL//DISPLACEMENT DAMAGE DOSE//NONIONIZING ENERGY LOSS
4 0.0000096719 GETTERING//GETTERING EFFICIENCY//SI AU
5 0.0000092338 HYDROGEN IN SILICON//MULTIVACANCY//HYDROGEN IN SI
6 0.0000089933 EMISSION RATE SPECTRUM//CAPACITANCE TRANSIENTS//DLTS RESOLUTION
7 0.0000087285 OXYGEN PRECIPITATION//GROWN IN DEFECT//CZOCHRALSKI SILICON
8 0.0000064450 RADIATION HARDNESS//SUPER LHC//SILICON DETECTORS
9 0.0000063922 TRANSIENT ENHANCED DIFFUSION//SWAMP//PAIR DIFFUSION MODEL
10 0.0000060313 POST IMPLANTATION DEFECTS//MULTI INTERFACE SOLAR CELL//PLANAR NANOSTRUCTURE