Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
8940 | 1135 | 15.8 | 57% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1059 | 9522 | THERMAL LENS SPECTROMETRY//THERMAL DIFFUSIVITY//PHOTOTHERMAL OPTOELECT DIAGNOST S |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | PHOTOCARRIER RADIOMETRY | Author keyword | 32 | 88% | 1% | 15 |
2 | CADIFT | Address | 13 | 69% | 1% | 11 |
3 | PHOTOTHERMAL OPTOELECT DIAGNOST S | Address | 9 | 37% | 2% | 19 |
4 | ADV DIFFUS WAVE TECHNOL | Address | 7 | 23% | 2% | 25 |
5 | SURFACE THERMAL LENS | Author keyword | 6 | 71% | 0% | 5 |
6 | PHOTODISPLACEMENT | Author keyword | 6 | 100% | 0% | 4 |
7 | PHOTOTHERMAL DISPLACEMENT | Author keyword | 5 | 55% | 1% | 6 |
8 | PURE PL SCI NAT SCI | Address | 4 | 67% | 0% | 4 |
9 | MODULATED FREE CARRIER ABSORPTION | Author keyword | 4 | 75% | 0% | 3 |
10 | PHOTOTHERMAL DEFLECTION METHOD | Author keyword | 4 | 75% | 0% | 3 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | PROCESSED SILICON | 44 | 100% | 1% | 16 |
2 | MIRAGE TECHNIQUE | 25 | 71% | 2% | 20 |
3 | SURFACE DEFORMATION TECHNIQUE | 18 | 83% | 1% | 10 |
4 | CARRIER ILLUMINATION | 12 | 86% | 1% | 6 |
5 | MIRAGE EFFECT MEASUREMENT | 10 | 52% | 1% | 14 |
6 | THERMAL DIFFUSIVITY MEASUREMENTS | 10 | 35% | 2% | 22 |
7 | PHOTOTHERMAL DEFLECTION | 8 | 37% | 2% | 18 |
8 | OPTICAL REFLECTANCE | 8 | 32% | 2% | 21 |
9 | MODULATED OPTICAL REFLECTANCE | 7 | 50% | 1% | 10 |
10 | SI WAFERS | 7 | 28% | 2% | 20 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
PHOTOTHERMAL MEASUREMENTS ON OPTICAL THIN-FILMS | 1995 | 61 | 77 | 45% |
SIGNAL-TO-NOISE RATIO IN LOCK-IN AMPLIFIER SYNCHRONOUS DETECTION - A GENERALIZED COMMUNICATIONS-SYSTEMS APPROACH WITH APPLICATIONS TO FREQUENCY, TIME, AND HYBRID (RATE WINDOW) PHOTOTHERMAL MEASUREMENTS | 1994 | 14 | 7 | 71% |
ANNEALING KINETICS OF DEFECTS OF ION-IMPLANTED AND FURNACE-ANNEALED SILICON LAYERS - THERMODYNAMIC APPROACH | 1992 | 9 | 40 | 48% |
Laser photothermal spectroscopy of light-induced absorption | 2013 | 0 | 82 | 13% |
NONLINEAR PHOTOTHERMAL SPECTROSCOPIC ANALYSIS OF ION-IMPLANTED SILICON-WAFERS | 1990 | 0 | 23 | 22% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | CADIFT | 13 | 69% | 1.0% | 11 |
2 | PHOTOTHERMAL OPTOELECT DIAGNOST S | 9 | 37% | 1.7% | 19 |
3 | ADV DIFFUS WAVE TECHNOL | 7 | 23% | 2.2% | 25 |
4 | PURE PL SCI NAT SCI | 4 | 67% | 0.4% | 4 |
5 | CNRS URA 840 | 2 | 67% | 0.2% | 2 |
6 | EXPT LASER PHYS | 2 | 67% | 0.2% | 2 |
7 | ADV DIFFUS WAVE TECHNOL CADIFT | 2 | 19% | 0.8% | 9 |
8 | ADV DIFFUS WAVE TECHNOL CADIFT MECH IND ENG | 1 | 50% | 0.2% | 2 |
9 | RUMENTAT CNRS UPR A0005 | 1 | 100% | 0.2% | 2 |
10 | MECS | 1 | 21% | 0.4% | 5 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000293145 | ELECTRON ACOUSTIC MICROSCOPY//PA IMAGING//PHOTOACOUSTIC MICROSCOPE |
2 | 0.0000289614 | PHOTOPYROELECTRIC TECHNIQUE//THERMAL EFFUSIVITY//PHOTOPYROELECTRIC CALORIMETRY |
3 | 0.0000172207 | AC CALORIMETRIC METHOD//TEMPERATURE WAVE ANALYSIS//THREE OMEGA METHOD |
4 | 0.0000169151 | AU NI50FE50//ECS ENGN//CIENCIAS FIS LCFIS |
5 | 0.0000158889 | THERMAL LENS SPECTROMETRY//INTEGRATED CHEM PROJECT//THERMAL LENS MICROSCOPE |
6 | 0.0000104195 | PHOTOACOUSTIC SPECTROSCOPY//PHOTOACOUSTIC PHASE//STEP SCAN FT IR |
7 | 0.0000097831 | RD OPT THIN FILM COATINGS//TIO2 SIO2 HIGH REFLECTORS//LASER INDUCED DAMAGE |
8 | 0.0000075240 | SCANNING THERMAL MICROSCOPY//MICRO THERMAL ANALYSIS//SCANNING THERMAL MICROSCOPE |
9 | 0.0000064546 | TRANSIENT REFLECTING GRATING//TRANSIENT REFLECTING GRATINGS//ANISOTROPY OF THE REFRACTIVE INDICES |
10 | 0.0000051829 | INFRARED THERMOGRAPHY//PULSED THERMOGRAPHY//ITEF |