Class information for:
Level 1: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//ANALOG FAULT DIAGNOSIS//LOOPBACK TEST

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
8737 1154 18.7 35%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1040 9640 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SINGLE EVENT UPSET SEU

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS Journal 38 19% 16% 185
2 ANALOG FAULT DIAGNOSIS Author keyword 25 77% 1% 17
3 LOOPBACK TEST Author keyword 24 91% 1% 10
4 OSCILLATION BASED TEST Author keyword 23 72% 2% 18
5 ANALOG TEST Author keyword 18 53% 2% 24
6 MIXED SIGNAL TEST Author keyword 17 43% 3% 30
7 I DDQ TESTING Author keyword 15 53% 2% 20
8 ANALOG SYSTEM TESTING Author keyword 15 73% 1% 11
9 ANALOG BIST Author keyword 13 80% 1% 8
10 ANALOG TESTING Author keyword 12 50% 1% 17

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 ANALOG FAULT DIAGNOSIS 25 77% 1% 17 Search ANALOG+FAULT+DIAGNOSIS Search ANALOG+FAULT+DIAGNOSIS
2 LOOPBACK TEST 24 91% 1% 10 Search LOOPBACK+TEST Search LOOPBACK+TEST
3 OSCILLATION BASED TEST 23 72% 2% 18 Search OSCILLATION+BASED+TEST Search OSCILLATION+BASED+TEST
4 ANALOG TEST 18 53% 2% 24 Search ANALOG+TEST Search ANALOG+TEST
5 MIXED SIGNAL TEST 17 43% 3% 30 Search MIXED+SIGNAL+TEST Search MIXED+SIGNAL+TEST
6 I DDQ TESTING 15 53% 2% 20 Search I+DDQ+TESTING Search I+DDQ+TESTING
7 ANALOG SYSTEM TESTING 15 73% 1% 11 Search ANALOG+SYSTEM+TESTING Search ANALOG+SYSTEM+TESTING
8 ANALOG BIST 13 80% 1% 8 Search ANALOG+BIST Search ANALOG+BIST
9 ANALOG TESTING 12 50% 1% 17 Search ANALOG+TESTING Search ANALOG+TESTING
10 ANALOG SYSTEM FAULT DIAGNOSIS 12 86% 1% 6 Search ANALOG+SYSTEM+FAULT+DIAGNOSIS Search ANALOG+SYSTEM+FAULT+DIAGNOSIS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 TEST METHODOLOGY 14 64% 1% 14
2 ANALOG CIRCUITS 12 25% 4% 42
3 TEST NODES 8 70% 1% 7
4 TEST POINTS SELECTION 7 57% 1% 8
5 AMBIGUITY GROUPS 6 80% 0% 4
6 ANALOG ELECTRONIC CIRCUITS 6 80% 0% 4
7 TEST FREQUENCIES 6 80% 0% 4
8 FAULT DICTIONARY 6 71% 0% 5
9 LOOPBACK TEST 6 100% 0% 4
10 IN CURRENT SENSOR 5 60% 1% 6

Journals


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 38 19% 16% 185

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
I-DDX-based test methods: A survey 2004 24 31 68%
Iddq testing for CMOS VLSI 2000 53 19 42%
Challenges for Semiconductor Test Engineering: A Review Paper 2012 2 11 45%
FAULT-DIAGNOSIS OF ANALOG CIRCUITS 1985 209 23 96%
I-DDQ testing: state of the art and future trends 1998 8 23 78%
RESPONSE CHANGE IN LINEARIZED CIRCUITS AND SYSTEMS - COMPUTATIONAL ALGORITHMS AND APPLICATIONS 1985 4 16 31%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 ELECT RUMENTAT DEV GRP 6 100% 0.3% 4
2 KATEDRA OPTOELEKT SYST ELEKT 3 60% 0.3% 3
3 METROL ELECT SYST 3 60% 0.3% 3
4 REG VILLA MARIA 2 32% 0.5% 6
5 WIRELESS BUSINESS UNIT 2 67% 0.2% 2
6 DELET 2 40% 0.3% 4
7 ELECT ELECT COMP CONTROL ENGN 2 22% 0.7% 8
8 FRENCH COUNCIL CNRS 1 100% 0.2% 2
9 GRP INVEST SERV ELECT CONTROL 1 100% 0.2% 2
10 HVAL GRP 1 100% 0.2% 2

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000117765 CANTABRIAN BASIN AUTHOR//STATISTICAL LEARNING TECHNIQUES//TWO SCALE DISCRETIZATION
2 0.0000099829 ITERATIVE LOGIC ARRAYS//C TESTABILITY//CELL FAULT MODEL
3 0.0000096617 SWITCHED CURRENT CIRCUITS//SWITCHED CURRENT//SWITCHED CURRENT FILTER
4 0.0000090584 LIDFT//ADC TESTING//INTERPOLATED DFT
5 0.0000081504 ELLIPSOIDAL TECHNIQUE//DESIGN CENTERING//PARAMETRIC YIELD
6 0.0000074772 ANALOG CIRCUIT SYNTHESIS//CIRCUIT SIZING//ANALOG DESIGN AUTOMATION
7 0.0000071145 CURRENT STEERING//DIGITAL TO ANALOG CONVERTER DAC//DIGITAL TO ANALOG CONVERTERS DACS
8 0.0000067834 BUILT IN REDUNDANCY ANALYSIS BIRA//CATASTROPHIC FAULT PATTERNS//CRITICAL AREA
9 0.0000063877 TRANSITION FAULTS//FUNCTIONAL BROADSIDE TESTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
10 0.0000063868 DESIGN ERROR DIAGNOSIS//PASS FAIL INFORMATION//WITT POLYNOMIAL