Class information for:
Level 1: PHOTOELECTRON HOLOGRAPHY//X RAY FLUORESCENCE HOLOGRAPHY//PHOTOELECTRON DIFFRACTION

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
8532 1174 26.5 65%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
30 33296 SURFACE SCIENCE//LOW INDEX SINGLE CRYSTAL SURFACES//CHEMISORPTION

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 PHOTOELECTRON HOLOGRAPHY Author keyword 47 84% 2% 26
2 X RAY FLUORESCENCE HOLOGRAPHY Author keyword 38 89% 1% 17
3 PHOTOELECTRON DIFFRACTION Author keyword 35 30% 8% 96
4 DIRECTIONAL ELASTIC PEAK ELECTRON SPECTROSCOPY DEPES Author keyword 19 80% 1% 12
5 DISPLAY TYPE SPHERICAL MIRROR ANALYZER Author keyword 12 86% 1% 6
6 X RAY HOLOGRAPHY Author keyword 9 50% 1% 13
7 FORWARD FOCUSING Author keyword 9 83% 0% 5
8 FORWARD FOCUSING PEAK Author keyword 8 100% 0% 5
9 MULTIPLE SCATTERING MS APPROXIMATION Author keyword 8 100% 0% 5
10 X RAY PHOTOELECTRON DIFFRACTION Author keyword 8 32% 2% 21

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 PHOTOELECTRON HOLOGRAPHY 47 84% 2% 26 Search PHOTOELECTRON+HOLOGRAPHY Search PHOTOELECTRON+HOLOGRAPHY
2 X RAY FLUORESCENCE HOLOGRAPHY 38 89% 1% 17 Search X+RAY+FLUORESCENCE+HOLOGRAPHY Search X+RAY+FLUORESCENCE+HOLOGRAPHY
3 PHOTOELECTRON DIFFRACTION 35 30% 8% 96 Search PHOTOELECTRON+DIFFRACTION Search PHOTOELECTRON+DIFFRACTION
4 DIRECTIONAL ELASTIC PEAK ELECTRON SPECTROSCOPY DEPES 19 80% 1% 12 Search DIRECTIONAL+ELASTIC+PEAK+ELECTRON+SPECTROSCOPY+DEPES Search DIRECTIONAL+ELASTIC+PEAK+ELECTRON+SPECTROSCOPY+DEPES
5 DISPLAY TYPE SPHERICAL MIRROR ANALYZER 12 86% 1% 6 Search DISPLAY+TYPE+SPHERICAL+MIRROR+ANALYZER Search DISPLAY+TYPE+SPHERICAL+MIRROR+ANALYZER
6 X RAY HOLOGRAPHY 9 50% 1% 13 Search X+RAY+HOLOGRAPHY Search X+RAY+HOLOGRAPHY
7 FORWARD FOCUSING 9 83% 0% 5 Search FORWARD+FOCUSING Search FORWARD+FOCUSING
8 FORWARD FOCUSING PEAK 8 100% 0% 5 Search FORWARD+FOCUSING+PEAK Search FORWARD+FOCUSING+PEAK
9 MULTIPLE SCATTERING MS APPROXIMATION 8 100% 0% 5 Search MULTIPLE+SCATTERING+MS+APPROXIMATION Search MULTIPLE+SCATTERING+MS+APPROXIMATION
10 X RAY PHOTOELECTRON DIFFRACTION 8 32% 2% 21 Search X+RAY+PHOTOELECTRON+DIFFRACTION Search X+RAY+PHOTOELECTRON+DIFFRACTION

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ELECTRON EMISSION HOLOGRAPHY 130 97% 3% 36
2 FLUORESCENCE HOLOGRAPHY 90 96% 2% 27
3 PHOTOELECTRON HOLOGRAPHY 83 84% 4% 46
4 ATOMIC IMAGES 34 93% 1% 13
5 EMISSION HOLOGRAPHY 32 88% 1% 15
6 ENERGY AUGER 28 81% 1% 17
7 X RAY HOLOGRAPHY 28 54% 3% 36
8 MEDIUM ENERGY 27 71% 2% 22
9 AUGER ELECTRON 25 26% 7% 81
10 AUGER ELECTRON DIFFRACTION 21 53% 2% 28

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
X-ray fluorescence holography 2012 8 37 84%
X-ray holography 1999 64 58 95%
ADSORBATE STRUCTURE DETERMINATION ON SURFACES USING PHOTOELECTRON DIFFRACTION 1994 168 86 59%
ELASTIC-SCATTERING AND INTERFERENCE OF BACKSCATTERED PRIMARY, AUGER AND X-RAY PHOTOELECTRONS AT HIGH KINETIC-ENERGY - PRINCIPLES AND APPLICATIONS 1992 180 94 69%
Adsorbate structure determination using photoelectron diffraction: Methods and applications 2007 37 245 36%
X-Ray photoelectron diffraction and photoelectron holography as methods for investigating the local atomic structure of the surface of solids 2014 2 76 78%
The study of the local atomic structure by means of X-ray photoelectron diffraction 2003 41 193 38%
Two-dimensional angle-resolved photoelectron spectroscopy using display analyzer - Atomic orbital analysis and characterization of valence band 2006 7 22 95%
Photoelectron diffraction: New dimensions in space, time, and spin 1995 53 85 65%
X-RAY PHOTOELECTRON AND AUGER-ELECTRON FORWARD SCATTERING - A NEW TOOL FOR SURFACE CRYSTALLOGRAPHY 1990 347 109 61%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 MAT USING GENERAT SYNCHROTRON RADIAT I 4 40% 0.7% 8
2 CHAIR OPT SPECT 3 45% 0.4% 5
3 NEUTRON SPECT 2 31% 0.4% 5
4 ESC 1 16% 0.3% 4
5 COHERENT XRAY OPT GRP 1 50% 0.1% 1
6 INDUSTRIAL SCI 1 50% 0.1% 1
7 PHI INC 1 50% 0.1% 1
8 ZENTRUM MIKROSTRUKTURFOR HAMBURG 1 50% 0.1% 1
9 SERV PHYS MAT MICROSTRUCT 1 10% 0.5% 6
10 EQUIPE PHYS SUR ES INTER ES 1 11% 0.4% 5

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000130552 HISOR//SPANISH CRG BEAMLINE SPLINE BM25//HAXPES
2 0.0000128679 EELFS//TUNGSTEN 100 SURFACE//ATOMIC PAIR CORRELATION FUNCTION
3 0.0000119356 PHYS QUANTUM CHEM//LEHRSTUHL FESTKORPERPHYS//THEORY OF SCATTERING
4 0.0000084343 CNRS PHOTOPHYS MOLEC BATIMENT 213//MOP//SPIN DEPENDENT TRANSMISSION
5 0.0000083204 REG PHYSICOCHEM ANAL//DOUBLE DIFFRACTION//TRANSMISSION REFLECTION AND SCANNING ELECTRON MICROSCOPY INCLUDING EBIC MECHANICAL PROPERTIES OF SOLIDS
6 0.0000070406 SECONDARY ELECTRON EMISSION SPECTRA//AA GALKIN DONETSK PHYS TECHNOL//CONJUGATED ORGANIC MOLECULES
7 0.0000065318 SECOND ORDER FOCUSING//SPACE PLASMA INSTRUMENT//SPHERICAL CONDENSER
8 0.0000064311 KOSSEL TECHNIQUE//LATTICE SOURCE INTERFERENCES//DETERMINATION OF LATTICE PARAMETERS
9 0.0000062614 IMFP//ELASTIC PEAK ELECTRON SPECTROSCOPY//SURFACE EXCITATION
10 0.0000060286 TOTAL EXTERNAL REFLECTION//X RAY STANDING WAVES//LAYERED SYNTHETIC MICROSTRUCTURES