Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
8483 | 1180 | 24.1 | 46% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
803 | 11388 | ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | EFTEM | Author keyword | 13 | 23% | 4% | 48 |
2 | ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY EFTEM | Author keyword | 11 | 67% | 1% | 10 |
3 | SPECTRUM IMAGING | Author keyword | 9 | 36% | 2% | 21 |
4 | ENERGY FILTERING TEM | Author keyword | 9 | 44% | 1% | 15 |
5 | IMAGE EELS | Author keyword | 8 | 100% | 0% | 5 |
6 | ELEMENTAL MAPPING | Author keyword | 8 | 20% | 3% | 35 |
7 | ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY | Author keyword | 6 | 36% | 1% | 14 |
8 | ELECTRON SPECTROSCOPIC IMAGING | Author keyword | 5 | 21% | 2% | 22 |
9 | EELS QUANTIFICATION | Author keyword | 4 | 75% | 0% | 3 |
10 | FIELD EMISSION TRANSMISSION ELECTRON MICROSCOPE FE TEM | Author keyword | 4 | 75% | 0% | 3 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | EELS QUANTIFICATION | 23 | 86% | 1% | 12 |
2 | POSTCOLUMN IMAGING FILTER | 17 | 75% | 1% | 12 |
3 | UNCONVENTIONAL METHODS | 16 | 65% | 1% | 15 |
4 | IMAGING FILTER | 15 | 68% | 1% | 13 |
5 | EELS | 15 | 14% | 8% | 98 |
6 | LOSS SPECTROMETRY | 7 | 41% | 1% | 14 |
7 | ELEMENTAL DISTRIBUTION IMAGES | 7 | 57% | 1% | 8 |
8 | ENERGY FILTERING TEM | 6 | 43% | 1% | 10 |
9 | EFTEM | 5 | 31% | 1% | 13 |
10 | EFTEM ELEMENTAL MAPS | 4 | 47% | 1% | 7 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Optimization of the signal to noise ratio in EFTEM elemental maps with regard to different eonization edge types | 1998 | 33 | 23 | 87% |
Quantitative analysis of electron spectroscopic imaging series | 1997 | 35 | 20 | 85% |
The effect of lens aberrations on the spatial resolution of an energy-filtered TEM image | 1997 | 31 | 7 | 86% |
An introduction to energy-filtered transmission electron microscopy | 2002 | 20 | 63 | 73% |
Structure and mass analysis by scanning transmission electron microscopy | 2001 | 30 | 60 | 33% |
Elemental mapping of microstructures by scanning electron microscopy-energy dispersive X-ray spectrometry (SEM-EDS): extraordinary advances with the silicon drift detector (SDD) | 2013 | 3 | 7 | 43% |
Theoretical and experimental investigations of resolution and detection limits in energy-filtering electron microscopy | 1997 | 14 | 7 | 100% |
X-ray mapping in electron-beam instruments | 2006 | 40 | 56 | 34% |
ENERGY-FILTERING TRANSMISSION ELECTRON-MICROSCOPY | 1991 | 56 | 79 | 75% |
Omega filter installed in the 1 MV microscope of Kyushu University | 2008 | 3 | 8 | 100% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | FOR UNGS ELEKTRONENMIKROSKOPIE | 3 | 35% | 0.5% | 6 |
2 | LERI | 1 | 21% | 0.5% | 6 |
3 | BIOMED STRUCT ANAL GRP A0600 | 1 | 100% | 0.2% | 2 |
4 | PATHOL AEM UNIT | 1 | 100% | 0.2% | 2 |
5 | UNITE SERV MICROSCOPIE ELE ANALYT QUANTITAT | 1 | 100% | 0.2% | 2 |
6 | HIGH VOLTAGE MICROSCOPY STN | 1 | 40% | 0.2% | 2 |
7 | ICEM | 1 | 23% | 0.3% | 3 |
8 | ELECTUNITAT ASSOCIADA | 1 | 50% | 0.1% | 1 |
9 | ERM 203 | 1 | 50% | 0.1% | 1 |
10 | GLOBALFOUNDRIES D DEN | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000272753 | ENGN 36//MINIMUM MASS FRACTION//QUANTITATIVE X RAY MAPPING |
2 | 0.0000253965 | EMCD//ELECTRON MAGNETIC CIRCULAR DICHROISM//INELASTIC ELECTRON SCATTERING THEORY |
3 | 0.0000216681 | VEELS//ELECTRON ENERGY FILTER//LOW VOLTAGE EELS |
4 | 0.0000158287 | CADMIUM YELLOW//ELECTRON BACKSCATTERING COEFFICIENT//EYE CATARACTS |
5 | 0.0000122100 | ELECTRON TOMOGRAPHY//TILT SERIES//MISSING WEDGE |
6 | 0.0000113205 | ULTRAMICROSCOPY//ABERRATION CORRECTION//DEPTH SECTIONING |
7 | 0.0000108751 | X RAY MICROANALYSIS//BIOLOGICAL X RAY MICROANALYSIS//DIFFUSIBLE IONS |
8 | 0.0000102506 | NANOPYRAMID ARRAY//DOPANT ION IMPLANTATION//FIS SUPERFICIES INTER ES |
9 | 0.0000100040 | ELNES//CORE HOLE EFFECTS//ENERGY LOSS NEAR EDGE STRUCTURES |
10 | 0.0000079112 | ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY EF TEM//NANOPLAST//SOIL ORGANICS |