Class information for:
Level 1: BUILT IN REDUNDANCY ANALYSIS BIRA//CATASTROPHIC FAULT PATTERNS//CRITICAL AREA

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
8194 1209 18.8 36%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1040 9640 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SINGLE EVENT UPSET SEU

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 BUILT IN REDUNDANCY ANALYSIS BIRA Author keyword 23 100% 1% 10
2 CATASTROPHIC FAULT PATTERNS Author keyword 17 100% 1% 8
3 CRITICAL AREA Author keyword 14 43% 2% 26
4 BUILT IN SELF REPAIR BISR Author keyword 10 52% 1% 14
5 MARCH TEST Author keyword 9 44% 1% 16
6 MEMORY TESTING Author keyword 9 24% 3% 33
7 MEMORY REPAIR Author keyword 8 52% 1% 11
8 PATTERN SENSITIVE FAULTS Author keyword 7 53% 1% 10
9 SECT COMP ENGN Address 6 80% 0% 4
10 DEGRADABLE VLSI ARRAY Author keyword 6 71% 0% 5

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 BUILT IN REDUNDANCY ANALYSIS BIRA 23 100% 1% 10 Search BUILT+IN+REDUNDANCY+ANALYSIS+BIRA Search BUILT+IN+REDUNDANCY+ANALYSIS+BIRA
2 CATASTROPHIC FAULT PATTERNS 17 100% 1% 8 Search CATASTROPHIC+FAULT+PATTERNS Search CATASTROPHIC+FAULT+PATTERNS
3 CRITICAL AREA 14 43% 2% 26 Search CRITICAL+AREA Search CRITICAL+AREA
4 BUILT IN SELF REPAIR BISR 10 52% 1% 14 Search BUILT+IN+SELF+REPAIR+BISR Search BUILT+IN+SELF+REPAIR+BISR
5 MARCH TEST 9 44% 1% 16 Search MARCH+TEST Search MARCH+TEST
6 MEMORY TESTING 9 24% 3% 33 Search MEMORY+TESTING Search MEMORY+TESTING
7 MEMORY REPAIR 8 52% 1% 11 Search MEMORY+REPAIR Search MEMORY+REPAIR
8 PATTERN SENSITIVE FAULTS 7 53% 1% 10 Search PATTERN+SENSITIVE+FAULTS Search PATTERN+SENSITIVE+FAULTS
9 DEGRADABLE VLSI ARRAY 6 71% 0% 5 Search DEGRADABLE+VLSI+ARRAY Search DEGRADABLE+VLSI+ARRAY
10 SEMICONDUCTOR YIELD 6 71% 0% 5 Search SEMICONDUCTOR+YIELD Search SEMICONDUCTOR+YIELD

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 CRITICAL AREA 15 71% 1% 12
2 FUNCTIONAL FAULTS 15 77% 1% 10
3 PATTERN SENSITIVE FAULTS 15 73% 1% 11
4 RANDOM ACCESS MEMORIES 13 26% 3% 42
5 AREA FAULT CLUSTERS 12 86% 0% 6
6 MANUFACTURING YIELD 12 86% 0% 6
7 INFRASTRUCTURE IP 10 57% 1% 12
8 CRITICAL AREA COMPUTATION 9 83% 0% 5
9 IC FABRICATION 9 83% 0% 5
10 INTEGRATED CIRCUIT YIELD 9 83% 0% 5

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Defect tolerance in VLSI circuits: Techniques and yield analysis 1998 73 51 86%
A review of yield modelling techniques for semiconductor manufacturing 2006 31 29 66%
An overview of manufacturing yield and reliability modeling for semiconductor products 1999 51 37 51%
LARGE-AREA FAULT CLUSTERS AND FAULT TOLERANCE IN VLSI CIRCUITS - A REVIEW 1989 30 23 100%
HIGH-YIELD ASSEMBLY OF MULTICHIP MODULES THROUGH KNOWN-GOOD ICS AND EFFECTIVE TEST STRATEGIES 1992 31 26 19%
A REVIEW OF FAULT-TOLERANT TECHNIQUES FOR THE ENHANCEMENT OF INTEGRATED-CIRCUIT YIELD 1986 41 32 56%
COMPUTER-AIDED-DESIGN FOR VLSI CIRCUIT MANUFACTURABILITY 1990 47 80 15%
WAFER LEVEL SYSTEM INTEGRATION - A REVIEW 1989 3 17 35%
SOURCES OF FAILURES AND YIELD IMPROVEMENT FOR VLSI AND RESTRUCTURABLE INTERCONNECTS FOR RVLSI AND WSI .1. SOURCES OF FAILURES AND YIELD IMPROVEMENT FOR VLSI 1984 36 19 21%
Microelectronics research in chemical engineering: A metaphorical view 2002 0 65 2%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SECT COMP ENGN 6 80% 0.3% 4
2 DEFECT REDUCT TECHNOL 3 100% 0.2% 3
3 INTEGRATED CIRCUITS DESIGN TEST 3 50% 0.3% 4
4 ADV RELIABLE SYST 3 60% 0.2% 3
5 VERY LARGE SCALE INTEGRAT COMP AIDED DESIGN 3 60% 0.2% 3
6 ADV TEST CHIP 1 100% 0.2% 2
7 ALGORITHM LANGUAGES 1 100% 0.2% 2
8 EMBEDDED TEST REPAIR PROGRAM 1 100% 0.2% 2
9 HIGH PERFORMANCE EMBEDDED SYST 1 12% 0.8% 10
10 ACTL 1 50% 0.1% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000125317 DATA RETENTION TIME//VOLTAGE DOWN CONVERTER//FERROELECTRIC MEMORY
2 0.0000100374 COMPUTER MEMORY SYSTEMS//HIGH DIMENSIONAL PARITY CHECK CODE//PARALLEL DECODING ARCHITECTURE
3 0.0000098757 SYST LEVEL INTEGRAT GRP//DYNAMIC PARTIAL RECONFIGURATION DPR//DYNAMICALLY PROGRAMMABLE GATE ARRAY
4 0.0000091051 ELLIPSOIDAL TECHNIQUE//DESIGN CENTERING//PARAMETRIC YIELD
5 0.0000090414 ITERATIVE LOGIC ARRAYS//C TESTABILITY//CELL FAULT MODEL
6 0.0000085271 TRANSITION FAULTS//FUNCTIONAL BROADSIDE TESTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
7 0.0000085189 DIRECT EXECUTION//IBM CELL BROADBAND ENGINE//LONGLEY RICE MODEL
8 0.0000076877 QUANTUM SENSITIVITY LIMIT//ACTIVE QUANTUM FILTER//LARGE AREA FILMS
9 0.0000074796 THERMAL ENGN TECHNOL//J AN MARINE SCI TECHNOL//INP WAFERS
10 0.0000067834 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//ANALOG FAULT DIAGNOSIS//LOOPBACK TEST