Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
8084 | 1220 | 25.1 | 77% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1376 | 7700 | GALLIUM ARSENIDE//SULFUR PASSIVATION//INDIUM ARSENIDE |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ELECTRON COUNTING MODEL | Author keyword | 18 | 89% | 1% | 8 |
2 | SUR E STUDY | Address | 12 | 86% | 0% | 6 |
3 | GA ADATOM | Author keyword | 8 | 100% | 0% | 5 |
4 | INDIUM ARSENIDE | Author keyword | 6 | 14% | 3% | 38 |
5 | ELECTRON COUNTING RULE | Author keyword | 6 | 100% | 0% | 4 |
6 | HCL ISOPROPANOL TREATMENT | Author keyword | 6 | 100% | 0% | 4 |
7 | GAAS SURFACES | Author keyword | 5 | 63% | 0% | 5 |
8 | GAAS001 SURFACE | Author keyword | 5 | 63% | 0% | 5 |
9 | T BUTYLPHOSPHINE | Author keyword | 4 | 75% | 0% | 3 |
10 | GAAS001 | Author keyword | 4 | 36% | 1% | 9 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ELECTRON COUNTING MODEL | 18 | 89% | 1% | 8 | Search ELECTRON+COUNTING+MODEL | Search ELECTRON+COUNTING+MODEL |
2 | GA ADATOM | 8 | 100% | 0% | 5 | Search GA+ADATOM | Search GA+ADATOM |
3 | INDIUM ARSENIDE | 6 | 14% | 3% | 38 | Search INDIUM+ARSENIDE | Search INDIUM+ARSENIDE |
4 | ELECTRON COUNTING RULE | 6 | 100% | 0% | 4 | Search ELECTRON+COUNTING+RULE | Search ELECTRON+COUNTING+RULE |
5 | HCL ISOPROPANOL TREATMENT | 6 | 100% | 0% | 4 | Search HCL+ISOPROPANOL+TREATMENT | Search HCL+ISOPROPANOL+TREATMENT |
6 | GAAS SURFACES | 5 | 63% | 0% | 5 | Search GAAS+SURFACES | Search GAAS+SURFACES |
7 | GAAS001 SURFACE | 5 | 63% | 0% | 5 | Search GAAS001+SURFACE | Search GAAS001+SURFACE |
8 | T BUTYLPHOSPHINE | 4 | 75% | 0% | 3 | Search T+BUTYLPHOSPHINE | Search T+BUTYLPHOSPHINE |
9 | GAAS001 | 4 | 36% | 1% | 9 | Search GAAS001 | Search GAAS001 |
10 | 2 X 4 | 3 | 100% | 0% | 3 | Search 2+X+4 | Search 2+X+4 |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | 2X4 | 50 | 88% | 2% | 23 |
2 | GAAS100 2X4 | 37 | 74% | 2% | 28 |
3 | GAAS100 SURFACES | 35 | 37% | 6% | 74 |
4 | GROWN GAAS001 | 30 | 69% | 2% | 25 |
5 | SEMICONDUCTOR 001 SURFACES | 29 | 88% | 1% | 14 |
6 | ELECTRON COUNTING MODEL | 24 | 82% | 1% | 14 |
7 | GAAS001 | 24 | 13% | 13% | 163 |
8 | 2X2 RECONSTRUCTIONS | 23 | 60% | 2% | 25 |
9 | GAAS001 SURFACES | 21 | 33% | 4% | 53 |
10 | POLAR SEMICONDUCTOR SURFACES | 21 | 64% | 2% | 21 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Surface reconstructions on GaAs(001) | 2008 | 52 | 127 | 83% |
III-V compound semiconductor (001) surfaces | 2002 | 82 | 98 | 81% |
Scanning tunneling microscopy of III-V compound semiconductor (001) surfaces | 1997 | 130 | 149 | 58% |
Arsenic-rich GaAs(001) surface structure | 2005 | 32 | 135 | 71% |
Self-organized growth on GaAs surfaces | 2004 | 76 | 154 | 30% |
Semiconductor surface reconstruction: The structural chemistry of two-dimensional surface compounds | 1996 | 184 | 197 | 24% |
Do we understand the structure of the gallium-rich surface of GaAs(001)? Experimental and theoretical approaches | 2002 | 11 | 35 | 69% |
Atomic-scale homoepitaxial growth simulations of reconstructed III-V surfaces | 2001 | 37 | 147 | 29% |
Structure and surface core-level shifts of GaAs surfaces prepared by molecular-beam epitaxy | 2000 | 12 | 63 | 46% |
Scanning tunneling microscopy of the GaAs(001) surface reconstructions | 1997 | 1 | 77 | 79% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SUR E STUDY | 12 | 86% | 0.5% | 6 |
2 | COMP SCI ENGN SCI PHYS | 2 | 33% | 0.5% | 6 |
3 | ELECT TELECOMUNICAT | 2 | 43% | 0.2% | 3 |
4 | CMRC2 | 1 | 100% | 0.2% | 2 |
5 | FESTKORPERPHYS THEORET OPT | 1 | 100% | 0.2% | 2 |
6 | LMPS | 1 | 25% | 0.2% | 3 |
7 | UFR SCI MAT | 1 | 19% | 0.3% | 4 |
8 | HARRISON M RANDALL | 1 | 33% | 0.2% | 2 |
9 | QUANTUM SIMULAT GRP | 1 | 23% | 0.2% | 3 |
10 | DIPARTIMENTO FIS INFORMAT MATEMAT FIM | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000237378 | SURFACE PHOTOABSORPTION//REFLECTANCE ANISOTROPY SPECTROSCOPY//REFLECTION ANISOTROPY SPECTROSCOPY |
2 | 0.0000180162 | HIGH RESOLUTION LOW ENERGY ELECTRON DIFFRACTION//GAAS GAP//SURFACE RESONANCES |
3 | 0.0000173720 | WEBSTER//ADIABATIC BOND CHARGE MODEL//INAS110 |
4 | 0.0000169595 | REFLECTION MASS SPECTROMETRY//2D ISLAND//INTERFACE DISORDER |
5 | 0.0000146990 | ATOMIC HYDROGEN CLEANING//ECR HYDROGEN PLASMA//IN SITU VACUUM PROCESS |
6 | 0.0000124405 | SULFUR PASSIVATION//PHOSPHIDIZATION//PHOSPHINE PLASMA |
7 | 0.0000092935 | LATERAL P N JUNCTION//411A GAAS SUBSTRATES//411A |
8 | 0.0000090676 | INDIUM PHOSPHIDE100//INTERACTION IONS MATTER//SIMULATION METHOD TRIM |
9 | 0.0000087609 | FAK PHYS CHEM//INDIUM SEGREGATION//IN DESORPTION |
10 | 0.0000086323 | RADIAT NUCL DETECT MAT ANAL//ENGN NANOSCI NANOTECHNOL INITIAT//INTERATOMIC ENERGY |