Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
7992 | 1229 | 18.6 | 41% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1121 | 9214 | RANKED SET SAMPLING//ORDER STATISTICS//RECORD VALUES |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | STRESS STRENGTH MODEL | Author keyword | 43 | 68% | 3% | 38 |
2 | GENERALIZED EXPONENTIAL DISTRIBUTION | Author keyword | 37 | 63% | 3% | 37 |
3 | BATHTUB SHAPE | Author keyword | 29 | 88% | 1% | 14 |
4 | BATHTUB SHAPED FAILURE RATE | Author keyword | 27 | 74% | 2% | 20 |
5 | EXPONENTIATED WEIBULL DISTRIBUTION | Author keyword | 20 | 67% | 1% | 18 |
6 | BATHTUB FAILURE RATE | Author keyword | 19 | 74% | 1% | 14 |
7 | FAILURE RATE FUNCTION | Author keyword | 16 | 54% | 2% | 21 |
8 | SIMULTANEOUS FAILURES | Author keyword | 15 | 88% | 1% | 7 |
9 | LINDLEY DISTRIBUTION | Author keyword | 15 | 73% | 1% | 11 |
10 | STRESS STRENGTH RELIABILITY | Author keyword | 15 | 73% | 1% | 11 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | DECREASING FAILURE RATE | 116 | 97% | 3% | 33 |
2 | FAILURE RATE FUNCTION | 53 | 78% | 3% | 35 |
3 | PY LESS THAN X | 40 | 82% | 2% | 23 |
4 | PR Y LESS | 35 | 89% | 1% | 16 |
5 | WEIBULL FAMILY | 33 | 100% | 1% | 13 |
6 | MODIFIED WEIBULL DISTRIBUTION | 32 | 80% | 2% | 20 |
7 | EXPONENTIATED WEIBULL FAMILY | 29 | 72% | 2% | 23 |
8 | BATHTUB | 21 | 51% | 2% | 29 |
9 | LIFETIME DISTRIBUTION | 20 | 43% | 3% | 35 |
10 | GENERALIZED EXPONENTIAL DISTRIBUTIONS | 15 | 82% | 1% | 9 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Modifications of the Weibull distribution: A review | 2014 | 3 | 71 | 89% |
BURN-IN MODELS AND METHODS - A REVIEW | 1990 | 37 | 14 | 71% |
FACING THE HEADACHES OF EARLY FAILURES - A STATE-OF-THE-ART REVIEW OF BURN-IN DECISIONS | 1983 | 71 | 1 | 100% |
BATHTUB DISTRIBUTIONS - A REVIEW | 1988 | 59 | 12 | 58% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | KHANSAR UNIT | 11 | 100% | 0.5% | 6 |
2 | ESTAT INFORMAT | 5 | 25% | 1.4% | 17 |
3 | DEINFO | 4 | 67% | 0.3% | 4 |
4 | COMP SCI PL STAT | 3 | 28% | 0.8% | 10 |
5 | PL STAT COMP SCI | 2 | 43% | 0.2% | 3 |
6 | DES | 1 | 12% | 0.7% | 8 |
7 | QUANTITAT METHODS ECON | 1 | 11% | 0.6% | 7 |
8 | CCEN UFPE | 1 | 50% | 0.1% | 1 |
9 | DES UFSCAR | 1 | 50% | 0.1% | 1 |
10 | DESIGN PROD PRECIS ENGN | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000212015 | PROGRESSIVE CENSORING//PROGRESSIVE TYPE II CENSORING//CUMULATIVE EXPOSURE MODEL |
2 | 0.0000207186 | BIRNBAUM SAUNDERS DISTRIBUTION//SINH NORMAL DISTRIBUTION//SKIP LOT SAMPLING |
3 | 0.0000166779 | HAZARD RATE ORDER//LIKELIHOOD RATIO ORDER//REVERSED HAZARD RATE ORDER |
4 | 0.0000155029 | CURE RATE MODELS//CURE MODEL//LONG TERM SURVIVAL MODELS |
5 | 0.0000153647 | MIXED FAILURE TIME DISTRIBUTION//NONLINEAR DISCRIMINANT FUNCTION//ERRORS OF MISCLASSIFICATION |
6 | 0.0000089532 | MAXIMUM PRODUCT OF SPACINGS//MODIFIED MOMENT ESTIMATORS//SPACINGS |
7 | 0.0000082660 | SKEW NORMAL DISTRIBUTION//SKEW NORMAL//SKEW SYMMETRIC DISTRIBUTIONS |
8 | 0.0000069411 | KATEDRA ELEKTROTECH ELEKT//WYDZIAL INZYNIERII ELEKT KOMPUTEROWEJ//SCATTERED CURRENT |
9 | 0.0000066548 | VYSOCHANSKII PETUNIN INEQUALITY//CALCULUS OF TIME SCALES//CLASSICAL OCCUPANCY PROBLEM |
10 | 0.0000065402 | RENEWAL FUNCTION//PARAMETRIC CONFIDENCE INTERVAL//SEQUENTIAL CONFIDENCE INTERVAL |