Class information for:
Level 1: TXRF//TOTAL REFLECTION X RAY FLUORESCENCE//TOTAL REFLECTION X RAY FLUORESCENCE TXRF

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
7432 1288 22.3 54%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1890 5404 X-RAY SPECTROMETRY//TXRF//TOTAL REFLECTION X RAY FLUORESCENCE

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 TXRF Author keyword 130 55% 13% 162
2 TOTAL REFLECTION X RAY FLUORESCENCE Author keyword 86 63% 7% 85
3 TOTAL REFLECTION X RAY FLUORESCENCE TXRF Author keyword 40 76% 2% 28
4 VAPOR PHASE DECOMPOSITION VPD Author keyword 15 88% 1% 7
5 LOW Z ELEMENTS Author keyword 13 71% 1% 10
6 SR TXRF Author keyword 13 71% 1% 10
7 GRAZING EMISSION Author keyword 11 100% 0% 6
8 TOTAL REFLECTION X RAY FLUORESCENCE ANALYSIS Author keyword 10 54% 1% 13
9 GRAZING EXIT Author keyword 9 64% 1% 9
10 TOTAL REFLECTION X RAY FLUORESCENCE SPECTROMETRY TXRF Author keyword 9 83% 0% 5

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 TXRF 130 55% 13% 162 Search TXRF Search TXRF
2 TOTAL REFLECTION X RAY FLUORESCENCE 86 63% 7% 85 Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE
3 TOTAL REFLECTION X RAY FLUORESCENCE TXRF 40 76% 2% 28 Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE+TXRF Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE+TXRF
4 VAPOR PHASE DECOMPOSITION VPD 15 88% 1% 7 Search VAPOR+PHASE+DECOMPOSITION+VPD Search VAPOR+PHASE+DECOMPOSITION+VPD
5 LOW Z ELEMENTS 13 71% 1% 10 Search LOW+Z+ELEMENTS Search LOW+Z+ELEMENTS
6 SR TXRF 13 71% 1% 10 Search SR+TXRF Search SR+TXRF
7 GRAZING EMISSION 11 100% 0% 6 Search GRAZING+EMISSION Search GRAZING+EMISSION
8 TOTAL REFLECTION X RAY FLUORESCENCE ANALYSIS 10 54% 1% 13 Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE+ANALYSIS Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE+ANALYSIS
9 GRAZING EXIT 9 64% 1% 9 Search GRAZING+EXIT Search GRAZING+EXIT
10 TOTAL REFLECTION X RAY FLUORESCENCE SPECTROMETRY TXRF 9 83% 0% 5 Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE+SPECTROMETRY+TXRF Search TOTAL+REFLECTION+X+RAY+FLUORESCENCE+SPECTROMETRY+TXRF

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 TXRF 132 82% 6% 77
2 SI WAFER SURFACES 35 89% 1% 16
3 BEAMLINE L 14 100% 1% 7
4 LOW Z ELEMENTS 13 58% 1% 15
5 MAIN PEAK PROFILES 12 86% 0% 6
6 RADIATION TOTAL REFLECTION 11 100% 0% 6
7 SR TXRF 11 100% 0% 6
8 THIN FILM ANALYSIS 9 83% 0% 5
9 SILICON WAFER SURFACES 9 52% 1% 12
10 RXF 8 100% 0% 5

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Trace and ultratrace analysis of liquid samples by X-ray fluorescence spectrometry 2014 12 61 51%
Total reflection x-ray fluorescence analysis - a review 2007 63 68 87%
Total reflection X-ray fluorescence and grazing incidence X-ray spectrometry - Tools for micro- and surface analysis. A review 2009 42 62 74%
Sample pretreatment strategies for total reflection X-ray fluorescence analysis: A tutorial review 2013 12 240 63%
Trends in total reflection X-ray fluorescence spectrometry for metallic contamination control in semiconductor nanotechnology 2006 30 73 81%
Synchrotron radiation induced TXRF 2008 14 56 82%
Preconcentration Methods for the Analysis of Liquid Samples by X-Ray Fluorescence Techniques 2010 22 101 53%
Total Reflection X-ray Fluorescence Analysis: Physical Foundations and Analytical Application (A Review) 2011 9 54 81%
Recent trends in total reflection X-ray fluorescence spectrometry for biological applications 2009 27 136 51%
Review on grazing incidence x-ray spectrometry and reflectometry 1999 66 359 40%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 TXRF 15 88% 0.5% 7
2 NIPPON STEEL CORP 4 75% 0.2% 3
3 PROC CHARACTERIZAT 4 75% 0.2% 3
4 GRP ENVIRONM MACROMOL CHEM 4 44% 0.5% 7
5 NIPPON STEEL CORP LTD 3 60% 0.2% 3
6 SERV INTER INVEST 3 20% 0.9% 12
7 XRAY ANALYT PLICAT 2 22% 0.7% 9
8 NBQ 2 36% 0.4% 5
9 CHEM TECHNOL ENVIRONM CHEM 2 14% 1.2% 15
10 CHEM TESTING SECT 2 67% 0.2% 2

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000220009 X-RAY SPECTROMETRY//WDXRF ANALYSIS//XRF ANALYSIS OF BIOLOGICAL SAMPLES
2 0.0000180462 POLYCAPILLARY X RAY OPTICS//CONFOCAL MICRO X RAY FLUORESCENCE//POLYCAPILLARY X RAY LENS
3 0.0000154912 MONOXIDE FLAME EMISSION SPECTROMETRY//DUAL WAVELENGTH METHOD//ELEMENTS CONTENT
4 0.0000141086 SYNCHRONOUS RADIATION//SRXRF TECHNIQUE//GEOCHEMISTRY OF LUNAR ROCKS
5 0.0000114497 TOTAL EXTERNAL REFLECTION//X RAY STANDING WAVES//LAYERED SYNTHETIC MICROSTRUCTURES
6 0.0000076798 EAST CALCUTTA WETLAND//CAS SHANDONG PROV COASTAL ENVIRONM PROC//AGGREGATE STABILITY INDEX
7 0.0000076730 INTERLABORATORY COMPARISON TEST//COMBUSTION DUST//COMM PLAST CRMS HAZARDOUS MET
8 0.0000072824 ANALYTICAL VALUES//CULTURAL HERITAGE SAMPLES//DEHYDROABIETYLAMINE SCHIFF BASE
9 0.0000065339 CU ZN RATIO//NSECT//RADIOG CITY COMMUNITY HLTH SCI
10 0.0000064593 ENGN PLICAT RADIOISOTOPES//MONTECUCCOLINO//PROV PL NUCL TECH GEOSCI