Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 7249 | 1313 | 27.7 | 70% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 886 | 10744 | SURFACE AND INTERFACE ANALYSIS//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//IMFP |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | ION SPUTTERING | Author keyword | 9 | 24% | 2% | 31 |
| 2 | HBEREICH AUTOMATISIERUNG INFORMAT | Address | 8 | 100% | 0% | 5 |
| 3 | ION EROSION | Author keyword | 7 | 67% | 0% | 6 |
| 4 | ION INDUCED SURFACE MODIFICATION | Author keyword | 6 | 80% | 0% | 4 |
| 5 | LOW ENERGY DEPOSITION | Author keyword | 6 | 80% | 0% | 4 |
| 6 | ION BEAM EROSION | Author keyword | 5 | 63% | 0% | 5 |
| 7 | RIPPLE TOPOGRAPHY | Author keyword | 5 | 63% | 0% | 5 |
| 8 | GRP DINAM LINEAL DNL | Address | 3 | 57% | 0% | 4 |
| 9 | AIIIBV SEMICONDUCTOR SURFACES | Author keyword | 3 | 100% | 0% | 3 |
| 10 | BOMBARDMENT INDUCED RIPPLES | Author keyword | 3 | 100% | 0% | 3 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | ION SPUTTERING | 9 | 24% | 2% | 31 | Search ION+SPUTTERING | Search ION+SPUTTERING |
| 2 | ION EROSION | 7 | 67% | 0% | 6 | Search ION+EROSION | Search ION+EROSION |
| 3 | ION INDUCED SURFACE MODIFICATION | 6 | 80% | 0% | 4 | Search ION+INDUCED+SURFACE+MODIFICATION | Search ION+INDUCED+SURFACE+MODIFICATION |
| 4 | LOW ENERGY DEPOSITION | 6 | 80% | 0% | 4 | Search LOW+ENERGY+DEPOSITION | Search LOW+ENERGY+DEPOSITION |
| 5 | ION BEAM EROSION | 5 | 63% | 0% | 5 | Search ION+BEAM+EROSION | Search ION+BEAM+EROSION |
| 6 | RIPPLE TOPOGRAPHY | 5 | 63% | 0% | 5 | Search RIPPLE+TOPOGRAPHY | Search RIPPLE+TOPOGRAPHY |
| 7 | AIIIBV SEMICONDUCTOR SURFACES | 3 | 100% | 0% | 3 | Search AIIIBV+SEMICONDUCTOR+SURFACES | Search AIIIBV+SEMICONDUCTOR+SURFACES |
| 8 | BOMBARDMENT INDUCED RIPPLES | 3 | 100% | 0% | 3 | Search BOMBARDMENT+INDUCED+RIPPLES | Search BOMBARDMENT+INDUCED+RIPPLES |
| 9 | ION SCULPTING | 3 | 100% | 0% | 3 | Search ION+SCULPTING | Search ION+SCULPTING |
| 10 | ROUGHENING AND TOPOGRAPHY | 3 | 100% | 0% | 3 | Search ROUGHENING+AND+TOPOGRAPHY | Search ROUGHENING+AND+TOPOGRAPHY |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | SPUTTERED SURFACES | 192 | 93% | 6% | 74 |
| 2 | ROUGHENING INSTABILITY | 174 | 82% | 8% | 101 |
| 3 | RIPPLE TOPOGRAPHY | 77 | 82% | 3% | 45 |
| 4 | BOMBARDED SI | 60 | 100% | 2% | 20 |
| 5 | BEAM EROSION | 56 | 100% | 1% | 19 |
| 6 | BOMBARDED SI001 | 42 | 75% | 2% | 30 |
| 7 | RIPPLE FORMATION | 37 | 48% | 4% | 57 |
| 8 | TOPOGRAPHY DEVELOPMENT | 31 | 92% | 1% | 12 |
| 9 | INDUCED RIPPLE TOPOGRAPHY | 26 | 80% | 1% | 16 |
| 10 | SPUTTER EROSION | 24 | 91% | 1% | 10 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Making waves: Kinetic processes controlling surface evolution during low energy ion sputtering | 2007 | 248 | 218 | 65% |
| Self-organized nanopattrening of silicon surfaces by ion beam sputtering | 2014 | 6 | 237 | 75% |
| Ion-Induced Nanoscale Ripple Patterns on Si Surfaces: Theory and Experiment | 2010 | 27 | 92 | 92% |
| Morphology of ion-sputtered surfaces | 2002 | 280 | 82 | 57% |
| Large area smoothing of surfaces by ion bombardment: fundamentals and applications | 2009 | 34 | 76 | 59% |
| Ripple formation on silicon by medium energy ion bombardment | 2009 | 19 | 63 | 81% |
| Spontaneous Patterning of Surfaces by Low-Energy Ion Beams | 2010 | 9 | 48 | 90% |
| The physics and applications of ion beam erosion | 2001 | 101 | 97 | 59% |
| Nanopatterning by multiple-ion-beam sputtering | 2009 | 8 | 42 | 95% |
| Investigations of ripple pattern formation on Germanium surfaces using 100-keV Ar+ ions | 2015 | 0 | 26 | 85% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | HBEREICH AUTOMATISIERUNG INFORMAT | 8 | 100% | 0.4% | 5 |
| 2 | GRP DINAM LINEAL DNL | 3 | 57% | 0.3% | 4 |
| 3 | FIS MAT NICOLAS CABRERA | 3 | 50% | 0.3% | 4 |
| 4 | ESCUELA TECN SUPER INGN ICAI | 2 | 20% | 0.7% | 9 |
| 5 | UNITA RIC GENOVA | 2 | 28% | 0.4% | 5 |
| 6 | GRP DINAM NO LINEAL DNL | 1 | 38% | 0.2% | 3 |
| 7 | UNITA GENOVA | 1 | 14% | 0.7% | 9 |
| 8 | THIN FILM VACUUM PACKAGING | 1 | 40% | 0.2% | 2 |
| 9 | INT MICRO MECHATRON | 1 | 33% | 0.2% | 2 |
| 10 | SONDERFOR BEREICH 345 | 1 | 14% | 0.4% | 5 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000191222 | INDIUM PHOSPHIDE100//INTERACTION IONS MATTER//SIMULATION METHOD TRIM |
| 2 | 0.0000130014 | OXYGEN BOMBARDMENT//STORING MATTER TECHNIQUE//SCI ANAL MAT SAM |
| 3 | 0.0000116152 | CONICAL PROTRUSION//FINE PROTRUSION//STRIPE RIB |
| 4 | 0.0000095033 | AMORPHOUS III V SEMICONDUCTORS//GAAS1 XNX THIN FILMS//SUNAG |
| 5 | 0.0000079158 | KINETIC ROUGHENING THEORY//RESTRICTED SOLID ON SOLID MODEL//KINETIC ROUGHENING |
| 6 | 0.0000072691 | FOCUSED ION BEAM//SHAVE OFF//SHAVE OFF DEPTH PROFILING |
| 7 | 0.0000060424 | KINETIC EXCITATION//ION PHOTON EMISSION//NON ADDITIVE SPUTTERING |
| 8 | 0.0000049163 | SURFACE DIFFUSION//ISLAND MORPHOLOGY//IPRT |
| 9 | 0.0000046036 | SWIFT HEAVY IONS//THERMAL SPIKE//THERMAL SPIKE MODEL |
| 10 | 0.0000043613 | LATERAL CRYSTALLINE GROWTH//ACCELERATORS//ION INDUCED DEFECTS |