Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
7243 | 1314 | 14.1 | 43% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1993 | 5054 | NANOELECT GIGASCALE SYST//ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | SPECIFIC ON RESISTANCE | Author keyword | 52 | 58% | 4% | 59 |
2 | BREAKDOWN VOLTAGE BV | Author keyword | 42 | 74% | 2% | 31 |
3 | LDMOS | Author keyword | 28 | 31% | 6% | 76 |
4 | BREAKDOWN VOLTAGE | Author keyword | 26 | 16% | 11% | 146 |
5 | POWER MOSFET | Author keyword | 25 | 27% | 6% | 79 |
6 | ON RESISTANCE | Author keyword | 16 | 30% | 3% | 43 |
7 | TRENCH GATE | Author keyword | 14 | 53% | 1% | 19 |
8 | RESURF | Author keyword | 13 | 38% | 2% | 27 |
9 | SUPERJUNCTION SJ | Author keyword | 13 | 62% | 1% | 13 |
10 | QUASI SATURATION | Author keyword | 12 | 63% | 1% | 12 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | SPECIFIC ON RESISTANCE | 52 | 58% | 4% | 59 | Search SPECIFIC+ON+RESISTANCE | Search SPECIFIC+ON+RESISTANCE |
2 | BREAKDOWN VOLTAGE BV | 42 | 74% | 2% | 31 | Search BREAKDOWN+VOLTAGE+BV | Search BREAKDOWN+VOLTAGE+BV |
3 | LDMOS | 28 | 31% | 6% | 76 | Search LDMOS | Search LDMOS |
4 | BREAKDOWN VOLTAGE | 26 | 16% | 11% | 146 | Search BREAKDOWN+VOLTAGE | Search BREAKDOWN+VOLTAGE |
5 | POWER MOSFET | 25 | 27% | 6% | 79 | Search POWER+MOSFET | Search POWER+MOSFET |
6 | ON RESISTANCE | 16 | 30% | 3% | 43 | Search ON+RESISTANCE | Search ON+RESISTANCE |
7 | TRENCH GATE | 14 | 53% | 1% | 19 | Search TRENCH+GATE | Search TRENCH+GATE |
8 | RESURF | 13 | 38% | 2% | 27 | Search RESURF | Search RESURF |
9 | SUPERJUNCTION SJ | 13 | 62% | 1% | 13 | Search SUPERJUNCTION+SJ | Search SUPERJUNCTION+SJ |
10 | QUASI SATURATION | 12 | 63% | 1% | 12 | Search QUASI+SATURATION | Search QUASI+SATURATION |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ON RESISTANCE | 79 | 65% | 6% | 74 |
2 | LDMOS | 32 | 54% | 3% | 42 |
3 | DRIFT REGION | 23 | 86% | 1% | 12 |
4 | INCLUDING QUASI SATURATION | 23 | 100% | 1% | 10 |
5 | BREAKDOWN VOLTAGE | 15 | 19% | 5% | 71 |
6 | BREAKDOWN VOLTAGE IMPROVEMENT | 12 | 86% | 0% | 6 |
7 | VDMOS | 12 | 86% | 0% | 6 |
8 | BURIED LAYER | 9 | 45% | 1% | 15 |
9 | LDMOST | 9 | 83% | 0% | 5 |
10 | RESURF LDMOS | 8 | 70% | 1% | 7 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
A review of HVI technology | 2014 | 1 | 17 | 94% |
SILICON-ON-INSULATOR DEVICES FOR HIGH-VOLTAGE AND POWER IC APPLICATIONS | 1994 | 35 | 6 | 83% |
Review of Silicon Power Semiconductor Technologies for Power Supply on Chip and Power Supply in Package Applications | 2013 | 5 | 5 | 40% |
A Review of Super Junction LDMOS | 2011 | 4 | 5 | 100% |
High-Power Microwave LDMOS Transistors for Wireless Data Transmission Technologies (Review) | 2010 | 0 | 3 | 100% |
RF transistors: Recent developments and roadmap toward terahertz applications | 2007 | 40 | 28 | 11% |
A review of safe operation area | 2006 | 4 | 8 | 50% |
AN OVERVIEW OF SMART POWER TECHNOLOGY | 1991 | 71 | 7 | 29% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ASIC SYST ENGN | 5 | 17% | 2.1% | 28 |
2 | ANALOGUE INTEGRATED CIRCUITS | 5 | 55% | 0.5% | 6 |
3 | 24 | 4 | 41% | 0.5% | 7 |
4 | MINIST EDUC WIDE BAND G SEMICOND MAT DEVICES | 3 | 15% | 1.2% | 16 |
5 | INFORMAT TELECOMMUN SYST CO | 2 | 44% | 0.3% | 4 |
6 | GUANGXI WIRELESS WIDEBAND COMMUN SIGNAL | 2 | 67% | 0.2% | 2 |
7 | POWER DEVICES SYST GRP | 2 | 67% | 0.2% | 2 |
8 | SMARTMOS TECHNOL | 2 | 43% | 0.2% | 3 |
9 | CHINA 24 | 1 | 100% | 0.2% | 2 |
10 | CORP ENGN DEVICE INFRA TEAM | 1 | 100% | 0.2% | 2 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000163520 | INSULATED GATE BIPOLAR TRANSISTOR IGBT//LATERAL INSULATED GATE BIPOLAR TRANSISTOR LIGBT//INSULATED GATE BIPOLAR TRANSISTORS IGBTS |
2 | 0.0000110020 | HORIZONTAL CURRENT BIPOLAR TRANSISTOR HCBT//DYNAMIC THRESHOLD MOSFET DTMOS//LATERAL BIPOLAR TRANSISTOR |
3 | 0.0000084249 | NONQUASI STATIC NQS EFFECT//QUCS//RSCE |
4 | 0.0000079467 | HOT CARRIER//CHANNEL INITIATED SECONDARY ELECTRON CHISEL//HOT CARRIER DEGRADATION |
5 | 0.0000070144 | BEAM CHANNEL TRANSISTOR//IMPURITY ENHANCED OXIDATION//BIPOLAR MODE FIELD EFFECT TRANSISTORS BMFETS |
6 | 0.0000069604 | NANOELECT GIGASCALE SYST//ELECTROSTATIC DISCHARGE ESD//SILICON CONTROLLED RECTIFIER SCR |
7 | 0.0000066455 | SIPOS//MSOS O P STRUCTURE//SEMI INSULATING POLYCRYSTALLINE SILICON |
8 | 0.0000058566 | 4H SIC MESFET//MESFET//MESFETS |
9 | 0.0000046409 | DOUBLE GATE MOSFET//FINFET//SHORT CHANNEL EFFECTS |
10 | 0.0000045429 | SINGLE EVENT BURNOUT SEB//SINGLE EVENT GATE RUPTURE SEGR//RREACT GRP |