Class information for:
Level 1: SINGLE EVENT UPSET SEU//SINGLE EVENT UPSET//SINGLE EVENT TRANSIENT

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
690 3093 20.1 50%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1040 9640 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SINGLE EVENT UPSET SEU

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SINGLE EVENT UPSET SEU Author keyword 176 71% 5% 143
2 SINGLE EVENT UPSET Author keyword 166 55% 7% 206
3 SINGLE EVENT TRANSIENT Author keyword 129 68% 4% 113
4 SINGLE EVENT EFFECTS Author keyword 123 53% 5% 163
5 SINGLE EVENT TRANSIENT SET Author keyword 123 78% 3% 80
6 SPACE DEF ELECT Address 122 86% 2% 62
7 SOFT ERROR Author keyword 102 46% 5% 165
8 SINGLE EVENT TRANSIENTS Author keyword 79 75% 2% 57
9 SOFT ERRORS Author keyword 75 44% 4% 128
10 SOFT ERROR RATE SER Author keyword 56 73% 1% 43

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 SINGLE EVENT UPSET SEU 176 71% 5% 143 Search SINGLE+EVENT+UPSET+SEU Search SINGLE+EVENT+UPSET+SEU
2 SINGLE EVENT UPSET 166 55% 7% 206 Search SINGLE+EVENT+UPSET Search SINGLE+EVENT+UPSET
3 SINGLE EVENT TRANSIENT 129 68% 4% 113 Search SINGLE+EVENT+TRANSIENT Search SINGLE+EVENT+TRANSIENT
4 SINGLE EVENT EFFECTS 123 53% 5% 163 Search SINGLE+EVENT+EFFECTS Search SINGLE+EVENT+EFFECTS
5 SINGLE EVENT TRANSIENT SET 123 78% 3% 80 Search SINGLE+EVENT+TRANSIENT+SET Search SINGLE+EVENT+TRANSIENT+SET
6 SOFT ERROR 102 46% 5% 165 Search SOFT+ERROR Search SOFT+ERROR
7 SINGLE EVENT TRANSIENTS 79 75% 2% 57 Search SINGLE+EVENT+TRANSIENTS Search SINGLE+EVENT+TRANSIENTS
8 SOFT ERRORS 75 44% 4% 128 Search SOFT+ERRORS Search SOFT+ERRORS
9 SOFT ERROR RATE SER 56 73% 1% 43 Search SOFT+ERROR+RATE+SER Search SOFT+ERROR+RATE+SER
10 SINGLE EVENT TRANSIENTS SETS 54 83% 1% 30 Search SINGLE+EVENT+TRANSIENTS+SETS Search SINGLE+EVENT+TRANSIENTS+SETS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SEU 202 78% 4% 135
2 SINGLE EVENT UPSET 135 63% 4% 135
3 UPSETS 119 72% 3% 94
4 UPSET 98 57% 4% 115
5 SINGLE EVENT TRANSIENTS 79 72% 2% 62
6 SRAMS 73 58% 3% 84
7 SOFT ERROR RATE 68 70% 2% 57
8 SINGLE EVENT UPSETS 59 62% 2% 61
9 CHARGE COLLECTION 59 36% 4% 132
10 SOI TECHNOLOGIES 51 91% 1% 21

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Basic mechanisms and modeling of single-event upset in digital microelectronics 2003 347 120 93%
IBM experiments in soft fails in computer electronics (1978-1994) 1996 152 18 100%
Real-time soft-error rate measurements: A review 2014 1 34 85%
Physics-based simulation of single-event effects 2005 48 89 88%
Device simulation of charge collection and single-event upset 1996 78 84 79%
Radiation Effects in MOS-based Devices and Circuits: A Review 2011 3 125 58%
A survey of memory error correcting techniques for improved reliability 2011 1 13 54%
New redundant logic design concept for high noise and low voltage scenarios 2011 1 4 50%
A case history of solar and galactic space weather effects on the geosynchronous communications satellite TDRS-1 2000 3 3 67%
Single-ion irradiation: physics, technology and applications 2008 4 58 26%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SPACE DEF ELECT 122 86% 2.0% 62
2 RADIAT EFFECTS GRP 25 71% 0.6% 20
3 ISDE 15 88% 0.2% 7
4 COMPONENT ENGN GRP 11 100% 0.2% 6
5 SEVERE ENVIRONM MAT 9 83% 0.2% 5
6 IES UMR CNRS 5214 8 75% 0.2% 6
7 NSF HIGH PERFORMANCE RECONFIGURABLE COMP 6 80% 0.1% 4
8 CENT CAD DESIGN SOLUT 6 58% 0.2% 7
9 MEI TECHNOL INC 6 100% 0.1% 4
10 PPGC 5 30% 0.5% 14

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000187183 SINGLE EVENT BURNOUT SEB//SINGLE EVENT GATE RUPTURE SEGR//RREACT GRP
2 0.0000073676 UNIDIRECTIONAL ERRORS//SELF CHECKING CIRCUITS//BALANCED CODES
3 0.0000069724 COMPUTER MEMORY SYSTEMS//HIGH DIMENSIONAL PARITY CHECK CODE//PARALLEL DECODING ARCHITECTURE
4 0.0000069495 OXIDE TRAPPED CHARGE//ELDRS//TOTAL IONIZING DOSE
5 0.0000066746 SYST LEVEL INTEGRAT GRP//DYNAMIC PARTIAL RECONFIGURATION DPR//DYNAMICALLY PROGRAMMABLE GATE ARRAY
6 0.0000056928 NONIONIZING ENERGY LOSS NIEL//DISPLACEMENT DAMAGE DOSE//NONIONIZING ENERGY LOSS
7 0.0000048410 NEUROMORPHIC NETWORKS//ELECTRONIC NANOTECHNOLOGY//CMOL
8 0.0000045203 DATA RETENTION TIME//VOLTAGE DOWN CONVERTER//FERROELECTRIC MEMORY
9 0.0000042471 SRAM//PROCESS VARIATION//POWER GATING
10 0.0000040417 RADFET//IMPLANTABLE DOSIMETER//DEVICE PHYS MICROELECT