Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
6413 | 1422 | 20.6 | 70% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1707 | 6121 | TWO PHOTON ABSORPTION//Z SCAN//OPTICAL LIMITING |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | Z SCAN | Author keyword | 23 | 16% | 9% | 133 |
2 | NONLINEAR REFRACTION | Author keyword | 17 | 28% | 4% | 51 |
3 | UMR 6163 | Address | 11 | 78% | 0% | 7 |
4 | NONLINEAR REFRACTIVE INDEX | Author keyword | 10 | 19% | 3% | 48 |
5 | NONLINEAR ABSORPTION | Author keyword | 8 | 14% | 4% | 53 |
6 | Z SCAN TECHNIQUE | Author keyword | 8 | 19% | 3% | 36 |
7 | PHOTON ANGERSEA 4464 | Address | 6 | 71% | 0% | 5 |
8 | PROPRIETES OPT MAT PLICAT | Address | 6 | 18% | 2% | 28 |
9 | REFLECTION Z SCAN | Author keyword | 3 | 57% | 0% | 4 |
10 | SPATIAL SELF PHASE MODULATION | Author keyword | 3 | 57% | 0% | 4 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | Z SCAN | 23 | 16% | 9% | 133 | Search Z+SCAN | Search Z+SCAN |
2 | NONLINEAR REFRACTION | 17 | 28% | 4% | 51 | Search NONLINEAR+REFRACTION | Search NONLINEAR+REFRACTION |
3 | NONLINEAR REFRACTIVE INDEX | 10 | 19% | 3% | 48 | Search NONLINEAR+REFRACTIVE+INDEX | Search NONLINEAR+REFRACTIVE+INDEX |
4 | NONLINEAR ABSORPTION | 8 | 14% | 4% | 53 | Search NONLINEAR+ABSORPTION | Search NONLINEAR+ABSORPTION |
5 | Z SCAN TECHNIQUE | 8 | 19% | 3% | 36 | Search Z+SCAN+TECHNIQUE | Search Z+SCAN+TECHNIQUE |
6 | REFLECTION Z SCAN | 3 | 57% | 0% | 4 | Search REFLECTION+Z+SCAN | Search REFLECTION+Z+SCAN |
7 | SPATIAL SELF PHASE MODULATION | 3 | 57% | 0% | 4 | Search SPATIAL+SELF+PHASE+MODULATION | Search SPATIAL+SELF+PHASE+MODULATION |
8 | TWO PHOTON ABSORPTION COEFFICIENT | 3 | 45% | 0% | 5 | Search TWO+PHOTON+ABSORPTION+COEFFICIENT | Search TWO+PHOTON+ABSORPTION+COEFFICIENT |
9 | THIRD ORDER NONLINEARITY | 2 | 16% | 1% | 13 | Search THIRD+ORDER+NONLINEARITY | Search THIRD+ORDER+NONLINEARITY |
10 | NONLINEAR RESPONSE TIME | 2 | 67% | 0% | 2 | Search NONLINEAR+RESPONSE+TIME | Search NONLINEAR+RESPONSE+TIME |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SINGLE BEAM | 97 | 31% | 18% | 256 |
2 | Z SCAN | 29 | 23% | 8% | 110 |
3 | REFLECTION Z SCAN | 24 | 91% | 1% | 10 |
4 | BEAM Z SCAN | 23 | 100% | 1% | 10 |
5 | OPTICAL NONLINEARITIES | 23 | 17% | 9% | 127 |
6 | NONLINEAR REFRACTION | 18 | 33% | 3% | 44 |
7 | FREE CARRIER NONLINEARITIES | 18 | 89% | 1% | 8 |
8 | N2 MEASUREMENTS | 14 | 49% | 1% | 21 |
9 | Z SCAN TECHNIQUE | 13 | 23% | 3% | 49 |
10 | HIGH INDEX GLASSES | 12 | 75% | 1% | 9 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Measurement of nonlinear refraction of thick samples using nonlinear-imaging technique with a phase object | 2014 | 0 | 20 | 90% |
Spectral and Nonlinear Optical Characteristics of ZnO Nanocomposites | 2010 | 15 | 56 | 27% |
KRAMERS-KRONIG RELATIONS IN NONLINEAR OPTICS | 1992 | 140 | 27 | 37% |
Measuring Nonlinear Refraction and Its Dispersion | 2009 | 1 | 41 | 66% |
CHARACTERIZATION OF NONLINEAR-OPTICAL ABSORPTION AND REFRACTION | 1993 | 26 | 27 | 70% |
Optical nonlinearity in photonic glasses | 2005 | 59 | 86 | 17% |
Nonlinear-optical parameters of various media | 2007 | 12 | 110 | 30% |
REVIEW OF MULTIPHOTON ABSORPTION IN CRYSTALLINE SOLIDS | 1985 | 150 | 9 | 78% |
Optical nonlinearities in the transparency region of bulk semiconductors | 1999 | 6 | 61 | 64% |
Fabrication and characteristics of bismuth oxide based highly nonlinear fiber | 2008 | 2 | 8 | 38% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | UMR 6163 | 11 | 78% | 0.5% | 7 |
2 | PHOTON ANGERSEA 4464 | 6 | 71% | 0.4% | 5 |
3 | PROPRIETES OPT MAT PLICAT | 6 | 18% | 2.0% | 28 |
4 | NPO AKADEMPRIBOR | 2 | 22% | 0.7% | 10 |
5 | JIANGSU OPTOELECT TECHNOL | 2 | 17% | 0.8% | 12 |
6 | LPHIA | 2 | 31% | 0.4% | 5 |
7 | PHOTON ANGERS | 1 | 15% | 0.6% | 9 |
8 | GA RAZUVAEV METALLOORGAN CHEM | 1 | 38% | 0.2% | 3 |
9 | CHEM PHYS MOL BIOL GRP | 1 | 50% | 0.1% | 2 |
10 | LPHIAEA 4464 | 1 | 100% | 0.1% | 2 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000273821 | OPTICAL LIMITING//Z SCAN//REVERSE SATURABLE ABSORPTION |
2 | 0.0000132909 | SEC CEMUC//HUBEI PROV SCI MET PROC//GLASS COMPOSITES |
3 | 0.0000086889 | ILLICHIVSK EDUC//CUCL//SEMICONDUCTOR DOPED GLASS |
4 | 0.0000073276 | ADV PHOTON DEVICE SYST//OPTOELECT CIRCUITS SYST//MICROELECT SCI S |
5 | 0.0000071806 | TWO PHOTON ABSORPTION//TWO PHOTON ABSORPTION CROSS SECTION//UP CONVERTED FLUORESCENCE |
6 | 0.0000067471 | FRACTIONAL DIMENSIONAL APPROACH//GAAS FILM//FRACTIONAL DIMENSIONAL SPACES |
7 | 0.0000061236 | VER CERAM//EQUIPE VER CERAM//INFRARED MAT DEVICES |
8 | 0.0000056489 | TELLURITE GLASSES//TELLURIUM OXIDE//TELLURITES |
9 | 0.0000056358 | MULTICHANNEL LASER SYSTEM//DYE DOPED POLYMER FILMS//INDUCED HOLOGRAPHIC GRATINGS |
10 | 0.0000055629 | JANOSSY EFFECT//LIGHT INDUCED FREEDERICKSZ TRANSITION//LIGHT INDUCED REORIENTATION |