Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
5252 | 1582 | 25.5 | 77% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
666 | 12577 | SCANNING TUNNELING MICROSCOPY//ATOM WI LAYERS//VICINAL SINGLE CRYSTAL SURFACES |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ATOM WI LAYERS | Address | 16 | 45% | 2% | 27 |
2 | SI335 | Author keyword | 11 | 100% | 0% | 6 |
3 | AU SI INTERFACE | Author keyword | 6 | 80% | 0% | 4 |
4 | REFLECTION HIGH ENERGY POSITRON DIFFRACTION RHEPD | Author keyword | 5 | 60% | 0% | 6 |
5 | METAL SEMICONDUCTOR NONMAGNETIC THIN FILM STRUCTURES | Author keyword | 4 | 47% | 0% | 7 |
6 | AG ISLANDS ON OXIDIZED SI SURFACES | Author keyword | 4 | 75% | 0% | 3 |
7 | IN SI111 | Author keyword | 4 | 75% | 0% | 3 |
8 | METAL SEMICONDUCTOR INTERFACES | Author keyword | 4 | 10% | 2% | 36 |
9 | AU SI111 | Author keyword | 3 | 100% | 0% | 3 |
10 | SI553 | Author keyword | 3 | 100% | 0% | 3 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | SI335 | 11 | 100% | 0% | 6 | Search SI335 | Search SI335 |
2 | AU SI INTERFACE | 6 | 80% | 0% | 4 | Search AU+SI+INTERFACE | Search AU+SI+INTERFACE |
3 | REFLECTION HIGH ENERGY POSITRON DIFFRACTION RHEPD | 5 | 60% | 0% | 6 | Search REFLECTION+HIGH+ENERGY+POSITRON+DIFFRACTION+RHEPD | Search REFLECTION+HIGH+ENERGY+POSITRON+DIFFRACTION+RHEPD |
4 | METAL SEMICONDUCTOR NONMAGNETIC THIN FILM STRUCTURES | 4 | 47% | 0% | 7 | Search METAL+SEMICONDUCTOR+NONMAGNETIC+THIN+FILM+STRUCTURES | Search METAL+SEMICONDUCTOR+NONMAGNETIC+THIN+FILM+STRUCTURES |
5 | AG ISLANDS ON OXIDIZED SI SURFACES | 4 | 75% | 0% | 3 | Search AG+ISLANDS+ON+OXIDIZED+SI+SURFACES | Search AG+ISLANDS+ON+OXIDIZED+SI+SURFACES |
6 | IN SI111 | 4 | 75% | 0% | 3 | Search IN+SI111 | Search IN+SI111 |
7 | METAL SEMICONDUCTOR INTERFACES | 4 | 10% | 2% | 36 | Search METAL+SEMICONDUCTOR+INTERFACES | Search METAL+SEMICONDUCTOR+INTERFACES |
8 | AU SI111 | 3 | 100% | 0% | 3 | Search AU+SI111 | Search AU+SI111 |
9 | SI553 | 3 | 100% | 0% | 3 | Search SI553 | Search SI553 |
10 | SI557 | 3 | 100% | 0% | 3 | Search SI557 | Search SI557 |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ROOT3X ROOT3R30 DEGREES AG SI111 SURFACE | 61 | 95% | 1% | 20 |
2 | AG SI111 SURFACE | 56 | 81% | 2% | 34 |
3 | SI557 AU | 52 | 100% | 1% | 18 |
4 | SI111 ROOT 3X ROOT 3 AG SURFACE | 46 | 82% | 2% | 27 |
5 | SI ATOM DENSITY | 42 | 94% | 1% | 15 |
6 | SQUARE ROOT 3 | 38 | 93% | 1% | 14 |
7 | SI111 SQUARE ROOT 3X SQUARE ROOT 3 AG SURFACE | 29 | 88% | 1% | 14 |
8 | SQUARE ROOT 3 AG SURFACE | 26 | 87% | 1% | 13 |
9 | AU SI111 | 23 | 70% | 1% | 19 |
10 | INDUCED 5X2 RECONSTRUCTION | 23 | 100% | 1% | 10 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Surface-sensitive conductance measurements | 2009 | 33 | 134 | 47% |
Structures and electronic transport on silicon surfaces | 1999 | 132 | 131 | 71% |
Surface-state bands on silicon as electron systems in reduced dimensions at atomic scales | 2000 | 26 | 61 | 70% |
Atomic chains on surfaces | 2008 | 23 | 57 | 35% |
Vicinal surfaces for functional nanostructures | 2009 | 20 | 87 | 26% |
Surface one-dimensional structures | 2007 | 3 | 54 | 59% |
CORRELATION BETWEEN ATOMIC-SCALE STRUCTURES AND MACROSCOPIC ELECTRICAL-PROPERTIES OF METAL-COVERED SI(111) SURFACES | 1993 | 47 | 79 | 48% |
Atomic imaging of macroscopic surface conductivity | 1999 | 3 | 28 | 61% |
Multiprobe NSOM fluorescence | 2014 | 0 | 19 | 37% |
PROPERTIES OF NOBLE-METAL SILICON JUNCTIONS | 1992 | 40 | 234 | 33% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ATOM WI LAYERS | 16 | 45% | 1.7% | 27 |
2 | IQUIPS | 1 | 38% | 0.2% | 3 |
3 | KNOWLEDGE INTELLIGENCE SCI SUMIDA KU | 1 | 100% | 0.1% | 2 |
4 | LEADING PROJECT | 1 | 100% | 0.1% | 2 |
5 | SRL ISSP | 1 | 100% | 0.1% | 2 |
6 | ENGN CRYSTALLINE MAT SCI CHIKUSA KU | 1 | 33% | 0.1% | 2 |
7 | ATOM WI | 1 | 50% | 0.1% | 1 |
8 | CLEAR ENERGY QUANTUM STRUCT | 1 | 50% | 0.1% | 1 |
9 | ELECT ENGN PHYS ELE | 1 | 50% | 0.1% | 1 |
10 | FUNDAMENTAL ELE | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000261490 | DAS STRUCTURE//SN GE111//SI111 7 X 7 |
2 | 0.0000182507 | HIGH INDEX SINGLE CRYSTAL SURFACES//SI110//SI113 |
3 | 0.0000135437 | CEA SERV RECH SUR ES IRRADIAT MAT//CHIM ORGAN THEORIQUE//DISPLAY DEVICE CO |
4 | 0.0000126607 | QUANTUM WELL STATES//ELECTRONIC GROWTH//QUANTUM SIZE EFFECTS |
5 | 0.0000124165 | GE001//C4 X 2//C4X2 |
6 | 0.0000105846 | SURFACTANT MEDIATED EPITAXY//BI NANOLINES//SI100 2X1 SB |
7 | 0.0000098443 | NANOMETER SIZED SCHOTTKY CONTACT//METAL DOT ARRAY//NANO DIODE |
8 | 0.0000092537 | SALINICOCCUS ROSEUS//CU2SI//BURLA |
9 | 0.0000091676 | ERBIUM SILICIDE//ERSI2//YTTRIUM SILICIDE |
10 | 0.0000090728 | VALENCE BAND DENSITY OF STATES//SURFACE MAGNETO OPTIC KERR EFFECT//METAL SEMICONDUCTOR THIN FILM |