Class information for:
Level 1: SCANNING CAPACITANCE MICROSCOPY//KELVIN PROBE FORCE MICROSCOPY//ELECTROSTATIC FORCE MICROSCOPY

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
5094 1607 20.5 74%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
751 11810 ATOMIC FORCE MICROSCOPE//DISSENY PROGRAMACIO SISTEMES ELECT//LOCAL ANODIC OXIDATION

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SCANNING CAPACITANCE MICROSCOPY Author keyword 17 41% 2% 32
2 KELVIN PROBE FORCE MICROSCOPY Author keyword 15 26% 3% 50
3 ELECTROSTATIC FORCE MICROSCOPY Author keyword 13 36% 2% 29
4 SSRM Author keyword 10 40% 1% 19
5 INSYS Address 8 19% 2% 36
6 SCANNING CAPACITANCE MICROSCOPE Author keyword 7 64% 0% 7
7 SCANNING CAPACITANCE MICROSCOPY SCM Author keyword 6 53% 0% 8
8 SCANNING SPREADING RESISTANCE MICROSCOPY SSRM Author keyword 5 60% 0% 6
9 AFM STM Author keyword 4 67% 0% 4
10 CONDUCTIVE SCANNING FORCE MICROSCOPY Author keyword 4 75% 0% 3

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 SCANNING CAPACITANCE MICROSCOPY 17 41% 2% 32 Search SCANNING+CAPACITANCE+MICROSCOPY Search SCANNING+CAPACITANCE+MICROSCOPY
2 KELVIN PROBE FORCE MICROSCOPY 15 26% 3% 50 Search KELVIN+PROBE+FORCE+MICROSCOPY Search KELVIN+PROBE+FORCE+MICROSCOPY
3 ELECTROSTATIC FORCE MICROSCOPY 13 36% 2% 29 Search ELECTROSTATIC+FORCE+MICROSCOPY Search ELECTROSTATIC+FORCE+MICROSCOPY
4 SSRM 10 40% 1% 19 Search SSRM Search SSRM
5 SCANNING CAPACITANCE MICROSCOPE 7 64% 0% 7 Search SCANNING+CAPACITANCE+MICROSCOPE Search SCANNING+CAPACITANCE+MICROSCOPE
6 SCANNING CAPACITANCE MICROSCOPY SCM 6 53% 0% 8 Search SCANNING+CAPACITANCE+MICROSCOPY+SCM Search SCANNING+CAPACITANCE+MICROSCOPY+SCM
7 SCANNING SPREADING RESISTANCE MICROSCOPY SSRM 5 60% 0% 6 Search SCANNING+SPREADING+RESISTANCE+MICROSCOPY+SSRM Search SCANNING+SPREADING+RESISTANCE+MICROSCOPY+SSRM
8 AFM STM 4 67% 0% 4 Search AFM+STM Search AFM+STM
9 CONDUCTIVE SCANNING FORCE MICROSCOPY 4 75% 0% 3 Search CONDUCTIVE+SCANNING+FORCE+MICROSCOPY Search CONDUCTIVE+SCANNING+FORCE+MICROSCOPY
10 CONTACT ELECTRIFICATION 4 21% 1% 16 Search CONTACT+ELECTRIFICATION Search CONTACT+ELECTRIFICATION

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SCANNING CAPACITANCE MICROSCOPY 45 46% 5% 73
2 SPREADING RESISTANCE MICROSCOPY 25 49% 2% 38
3 POTENTIOMETRY 24 24% 5% 85
4 2 DIMENSIONAL DOPANT 18 83% 1% 10
5 FREQUENCY MODULATION DETECTION 16 54% 1% 21
6 2 DIMENSIONAL DOPING PROFILES 15 88% 0% 7
7 2 DIMENSIONAL CARRIER 13 69% 1% 11
8 CAPACITANCE MICROSCOPY 13 35% 2% 29
9 2 DIMENSIONAL DELINEATION 12 86% 0% 6
10 2 DIMENSIONAL DOPANT PROFILES 12 86% 0% 6

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
Kelvin probe force microscopy and its application 2011 157 96 50%
Electronic characterization of organic thin films by Kelvin probe force microscopy 2006 201 78 46%
Two-dimensional dopant profiling by scanning capacitance microscopy 1999 142 31 97%
Advances in AFM for the electrical characterization of semiconductors 2008 69 206 56%
Nanoscale Quantitative Measurement of the Potential of Charged Nanostructures by Electrostatic and Kelvin Probe Force Microscopy: Unraveling Electronic Processes in Complex Materials 2010 47 44 45%
Characterization of electrically active dopant profiles with the spreading resistance probe 2004 22 69 80%
Electrical Modes in Scanning Probe Microscopy 2009 28 28 39%
Atomic force microscopy modified for studying electric properties of thin films and crystals. Review 2004 24 163 65%
Kelvin probe force microscopy of molecular surfaces 1999 89 63 41%
Electrical Measurement Techniques in Atomic Force Microscopy 2010 8 36 50%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 INSYS 8 19% 2.2% 36
2 MAT COMPONENTS ANAL GRP 3 100% 0.2% 3
3 SCI NANOMETER SCALE 2 21% 0.6% 10
4 BIOMAT PL CRYSTALLOG 2 67% 0.1% 2
5 CORP NANO DEVICES 2 67% 0.1% 2
6 MECAN FLUIDES IMFT 2 67% 0.1% 2
7 UMR CNRS 5011 2 50% 0.2% 3
8 NANOBIOELEC GRP 2 43% 0.2% 3
9 TECHNOL MONTPELLIER 2 43% 0.2% 3
10 CNRS UA 17 1 100% 0.1% 2

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000133211 CHARGE WRITING//CAPILLARY FORCE ASSEMBLY//NANOPARTICLE PATTERNING
2 0.0000123915 MICRO WETTABILITY//MACRO WETTING//MICRO CONTAMINANT
3 0.0000114525 DISSENY PROGRAMACIO SISTEMES ELECT//FUTURE ENERGY IFES//QPLUS
4 0.0000109756 MICROWAVE MICROSCOPE//MICROWAVE MICROPROBE//NEAR FIELD SCANNING MICROWAVE MICROSCOPE
5 0.0000103161 CHAIR QUANTUM RADIO PHYS//X RAY EXCITED CURRENT//SHERMAN FAIRCHILD SOLID STATE STUDIES
6 0.0000083779 SCANNING NONLINEAR DIELECTRIC MICROSCOPY//FERROELECTRIC DATA STORAGE//PIEZORESPONSE FORCE MICROSCOPY
7 0.0000070855 ELECTRON WORK FUNCTION//AERONAUT TESTING EVALUAT//MAT SCI ENGN AERONAUT SCI
8 0.0000063343 NANOMETER SIZED SCHOTTKY CONTACT//METAL DOT ARRAY//NANO DIODE
9 0.0000061569 TIP CHARACTERIZATION//TIP CHARACTERIZER//SIDEWALL MEASUREMENT
10 0.0000054669 SCANNING GATE MICROSCOPY//ERASABLE ELECTROSTATIC LITHOGRAPHY//KELDYSHS GREEN FUNCTION