Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
490 | 3322 | 18.2 | 56% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
138 | 22619 | IEEE TRANSACTIONS ON ELECTRON DEVICES//IEEE ELECTRON DEVICE LETTERS//SOLID-STATE ELECTRONICS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | DOUBLE GATE MOSFET | Author keyword | 77 | 56% | 3% | 95 |
2 | FINFET | Author keyword | 68 | 28% | 6% | 206 |
3 | SHORT CHANNEL EFFECTS | Author keyword | 61 | 42% | 3% | 111 |
4 | SHORT CHANNEL EFFECTS SCES | Author keyword | 55 | 66% | 2% | 51 |
5 | DOUBLE GATE DG MOSFET | Author keyword | 38 | 71% | 1% | 30 |
6 | JUNCTIONLESS | Author keyword | 33 | 57% | 1% | 39 |
7 | DIBL | Author keyword | 33 | 46% | 2% | 53 |
8 | SURROUNDING GATE MOSFET | Author keyword | 31 | 74% | 1% | 23 |
9 | DOUBLE GATE DG | Author keyword | 30 | 53% | 1% | 40 |
10 | DRAIN INDUCED BARRIER LOWERING DIBL | Author keyword | 30 | 47% | 1% | 48 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | DOUBLE GATE MOSFET | 77 | 56% | 3% | 95 | Search DOUBLE+GATE+MOSFET | Search DOUBLE+GATE+MOSFET |
2 | FINFET | 68 | 28% | 6% | 206 | Search FINFET | Search FINFET |
3 | SHORT CHANNEL EFFECTS | 61 | 42% | 3% | 111 | Search SHORT+CHANNEL+EFFECTS | Search SHORT+CHANNEL+EFFECTS |
4 | SHORT CHANNEL EFFECTS SCES | 55 | 66% | 2% | 51 | Search SHORT+CHANNEL+EFFECTS+SCES | Search SHORT+CHANNEL+EFFECTS+SCES |
5 | DOUBLE GATE DG MOSFET | 38 | 71% | 1% | 30 | Search DOUBLE+GATE+DG+MOSFET | Search DOUBLE+GATE+DG+MOSFET |
6 | JUNCTIONLESS | 33 | 57% | 1% | 39 | Search JUNCTIONLESS | Search JUNCTIONLESS |
7 | DIBL | 33 | 46% | 2% | 53 | Search DIBL | Search DIBL |
8 | SURROUNDING GATE MOSFET | 31 | 74% | 1% | 23 | Search SURROUNDING+GATE+MOSFET | Search SURROUNDING+GATE+MOSFET |
9 | DOUBLE GATE DG | 30 | 53% | 1% | 40 | Search DOUBLE+GATE+DG | Search DOUBLE+GATE+DG |
10 | DRAIN INDUCED BARRIER LOWERING DIBL | 30 | 47% | 1% | 48 | Search DRAIN+INDUCED+BARRIER+LOWERING+DIBL | Search DRAIN+INDUCED+BARRIER+LOWERING+DIBL |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SOI MOSFETS | 224 | 48% | 10% | 346 |
2 | THRESHOLD VOLTAGE MODEL | 124 | 70% | 3% | 103 |
3 | DG MOSFETS | 85 | 74% | 2% | 64 |
4 | THRESHOLD VOLTAGE | 71 | 27% | 7% | 231 |
5 | FINFETS | 53 | 51% | 2% | 75 |
6 | GATE SOI MOSFETS | 48 | 71% | 1% | 39 |
7 | SOI MOSFET | 47 | 69% | 1% | 40 |
8 | DRAIN CURRENT MODEL | 44 | 85% | 1% | 23 |
9 | DOUBLE GATE MOSFETS | 41 | 53% | 2% | 54 |
10 | VOLUME INVERSION | 36 | 53% | 1% | 48 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Multigate transistors as the future of classical metal-oxide-semiconductor field-effect transistors | 2011 | 113 | 18 | 67% |
A review of core compact models for undoped double-gate SOI MOSFETs | 2007 | 58 | 25 | 72% |
A Review on Compact Modeling of Multiple-Gate MOSFETs | 2009 | 21 | 28 | 100% |
Moore's law: the future of Si microelectronics | 2006 | 138 | 16 | 38% |
Nanoscale CMOS | 1999 | 199 | 50 | 30% |
Frontiers of silicon-on-insulator | 2003 | 323 | 73 | 21% |
Beyond the conventional transistor | 2002 | 285 | 75 | 19% |
A comprehensive review on microwave FinFET modeling for progressing beyond the state of art | 2013 | 6 | 103 | 39% |
An area efficient body contact for low and high voltage SOI MOSFET devices | 2008 | 6 | 7 | 86% |
A Review on Modeling the Channel Potential in Multi-Gate MOSFETs | 2014 | 0 | 9 | 100% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | NISRC | 24 | 91% | 0.3% | 10 |
2 | LOW POWER NANOELECT GRP | 21 | 90% | 0.3% | 9 |
3 | ELECT ENGN DISCIPLINE | 21 | 85% | 0.3% | 11 |
4 | DEEN DAYAL UPADHYAYA | 18 | 38% | 1.1% | 37 |
5 | COMPETENCE NANOTECHNOL PHOTON | 15 | 82% | 0.3% | 9 |
6 | SITD | 13 | 69% | 0.3% | 11 |
7 | EECS ENG | 12 | 86% | 0.2% | 6 |
8 | EECS ENGN | 11 | 69% | 0.3% | 9 |
9 | NANO DEVICE SIMULAT | 10 | 61% | 0.3% | 11 |
10 | ENGN ELECT ELECT AUTOMAT | 10 | 21% | 1.3% | 44 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000198875 | CAPACITORLESS DRAM//1T DRAM//CAPACITORLESS 1T DRAM |
2 | 0.0000188009 | NETWORK COMPUTAT NANOTECHNOL//QUASI BALLISTIC TRANSPORT//JOURNAL OF COMPUTATIONAL ELECTRONICS |
3 | 0.0000171646 | NONQUASI STATIC NQS EFFECT//QUCS//RSCE |
4 | 0.0000142185 | DEVICE MODELLING GRP//RANDOM DOPANT//DEVICE MODELING GRP |
5 | 0.0000136749 | HORIZONTAL CURRENT BIPOLAR TRANSISTOR HCBT//DYNAMIC THRESHOLD MOSFET DTMOS//LATERAL BIPOLAR TRANSISTOR |
6 | 0.0000124365 | SCHOTTKY BARRIER SB//DOPANT SEGREGATION DS//SCHOTTKY BARRIER SB MOSFET |
7 | 0.0000122338 | CRYOGENIC CMOS//LOW TEMPERATURE ELECTRONICS//LOW TEMPERATURE CIRCUIT |
8 | 0.0000117716 | BACK BIAS EFFECT//VERTICAL MOSFET//SURROUNDING GATE TRANSISTOR |
9 | 0.0000113200 | DIRECT TUNNELING//QUANTUM MECHANICAL EFFECTS QMES//WAVE FUNCTION PENETRATION |
10 | 0.0000108739 | HOT CARRIER//CHANNEL INITIATED SECONDARY ELECTRON CHISEL//HOT CARRIER DEGRADATION |