Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
4545 | 1694 | 17.7 | 54% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
2223 | 4329 | PROTON BEAM WRITING//NUCLEAR MICROPROBE//ION BEAM PLICAT |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ELASTIC RECOIL DETECTION | Author keyword | 27 | 44% | 3% | 47 |
2 | ION BEAM ANALYSIS | Author keyword | 21 | 22% | 5% | 88 |
3 | TOF ERDA | Author keyword | 20 | 66% | 1% | 19 |
4 | ELEMENTAL DEPTH PROFILING | Author keyword | 9 | 83% | 0% | 5 |
5 | GAS IONIZATION DETECTORS | Author keyword | 9 | 83% | 0% | 5 |
6 | ELASTIC SCATTERING CROSS SECTIONS | Author keyword | 8 | 75% | 0% | 6 |
7 | ELASTIC BACKSCATTERING SPECTROSCOPY | Author keyword | 8 | 100% | 0% | 5 |
8 | NUCLEAR REACTION ANALYSIS | Author keyword | 8 | 19% | 2% | 37 |
9 | RUTHERFORD BACKSCATTERING | Author keyword | 7 | 14% | 3% | 45 |
10 | ELASTIC RECOIL DETECTION ANALYSIS | Author keyword | 7 | 25% | 1% | 24 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ELASTIC RECOIL DETECTION | 59 | 53% | 5% | 77 |
2 | E GAS TELESCOPE | 37 | 100% | 1% | 14 |
3 | ION BEAM ANALYSIS | 33 | 41% | 4% | 63 |
4 | RUTHERFORD BACKSCATTERING ANALYSIS | 30 | 100% | 1% | 12 |
5 | RBS | 24 | 29% | 4% | 70 |
6 | IBA METHODS | 23 | 86% | 1% | 12 |
7 | RUTHERFORD BACKSCATTERING SPECTRA | 20 | 67% | 1% | 18 |
8 | ERDA | 18 | 43% | 2% | 33 |
9 | SIMULATED ANNEALING ANALYSIS | 17 | 100% | 0% | 8 |
10 | THICK SAMPLES | 15 | 88% | 0% | 7 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Status of ion beam data analysis and simulation software | 2006 | 38 | 140 | 86% |
Elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool | 2003 | 99 | 126 | 56% |
Hydrogen detection near surfaces and shallow interfaces with resonant nuclear reaction analysis | 2014 | 5 | 632 | 22% |
Analysis of ALD-processed thin films by ion-beam techniques | 2005 | 37 | 33 | 33% |
Characterization of interface of Al-Ni/a-Si for thin film transistor using high-resolution Rutherford backscattering spectrometry | 2009 | 2 | 3 | 100% |
ELASTIC RECOIL DETECTION | 1993 | 28 | 53 | 62% |
Below-surface behavior of hydrogen studied by nuclear reaction analysis | 2002 | 11 | 43 | 35% |
SOME STUDIES ON LIGHT-ELEMENT ANALYSIS WITH PARTICLE ACCELERATORS IN SOUTH-AFRICA | 1993 | 0 | 4 | 100% |
NEW TRENDS IN ION-BEAM ANALYSIS | 1992 | 8 | 38 | 58% |
NUCLEAR-REACTION TECHNIQUES IN MATERIALS ANALYSIS | 1984 | 48 | 13 | 69% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | BASIC TECH STUDIES | 3 | 100% | 0.2% | 3 |
2 | UNIDADE DETECCAO REMOTA | 3 | 60% | 0.2% | 3 |
3 | TANDEM ACCELERATOR | 2 | 11% | 1.2% | 20 |
4 | ABT SF4 | 2 | 36% | 0.3% | 5 |
5 | ABT OP | 2 | 67% | 0.1% | 2 |
6 | CMAM | 2 | 16% | 0.7% | 12 |
7 | EN10 SACAVEM | 1 | 50% | 0.1% | 2 |
8 | SACAVEM EN10 | 1 | 100% | 0.1% | 2 |
9 | URA 17 CNRS | 1 | 50% | 0.1% | 2 |
10 | PM FOURT | 1 | 33% | 0.1% | 2 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000112363 | NUCLEAR MICROPROBE//PROTON MICROPROBE//SCANNING TRANSMISSION ION MICROSCOPY |
2 | 0.0000103507 | STOPPING POWER//STOPPING FORCE//ENERGY LOSS |
3 | 0.0000087183 | AVALANCHE COUNTER//BRAGG CURVE COUNTER//BRAGG CURVE SPECTROSCOPY |
4 | 0.0000080557 | CZOCHRALSKI SILICON SUBSTRATES//BERYLLIUM BORIDES//OXYGEN PROFILING |
5 | 0.0000075835 | PIXE//EXTERNAL BEAM//LANDIS |
6 | 0.0000060491 | RANGE PARAMETERS//SOFT ERROR MAPPING//HIGH ENERGY ION IMPLANTATION |
7 | 0.0000056307 | PLASMA DRIVEN PERMEATION//DEUTERON IMPLANTATION//PHONON MASER |
8 | 0.0000054553 | PROTON BEAM WRITING//ION BEAM PLICAT//PROBE FORMING SYSTEM |
9 | 0.0000048698 | CHANNELED PARTICLE//NONEQUILIBRIUM STATISTICAL THERMODYNAMICS//QUASITEMPERATURE |
10 | 0.0000048450 | STRIPPER LIFETIME//CARBON STRIPPER//CARBON STRIPPER FOIL |