Class information for:
Level 1: MOLECULAR DEPTH PROFILING//CLUSTER SIMS//ION BEAM ENGN EXPT

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
4055 1781 24.2 74%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
2253 4237 MOLECULAR DEPTH PROFILING//CLUSTER SIMS//ION BEAM ENGN EXPT

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 MOLECULAR DEPTH PROFILING Author keyword 76 93% 2% 28
2 CLUSTER SIMS Author keyword 56 84% 2% 31
3 ION BEAM ENGN EXPT Address 55 59% 3% 61
4 CLUSTER PROJECTILES Author keyword 41 100% 1% 15
5 GAS CLUSTER ION BEAM Author keyword 38 63% 2% 38
6 CLUSTER ION Author keyword 35 51% 3% 49
7 CLUSTER IMPACT Author keyword 31 71% 1% 25
8 METAL CLUSTER COMPLEX Author keyword 27 92% 1% 11
9 CLUSTER ION BEAM Author keyword 26 57% 2% 31
10 ORGANIC DEPTH PROFILING Author keyword 26 100% 1% 11

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 MOLECULAR DEPTH PROFILING 76 93% 2% 28 Search MOLECULAR+DEPTH+PROFILING Search MOLECULAR+DEPTH+PROFILING
2 CLUSTER SIMS 56 84% 2% 31 Search CLUSTER+SIMS Search CLUSTER+SIMS
3 CLUSTER PROJECTILES 41 100% 1% 15 Search CLUSTER+PROJECTILES Search CLUSTER+PROJECTILES
4 GAS CLUSTER ION BEAM 38 63% 2% 38 Search GAS+CLUSTER+ION+BEAM Search GAS+CLUSTER+ION+BEAM
5 CLUSTER ION 35 51% 3% 49 Search CLUSTER+ION Search CLUSTER+ION
6 CLUSTER IMPACT 31 71% 1% 25 Search CLUSTER+IMPACT Search CLUSTER+IMPACT
7 METAL CLUSTER COMPLEX 27 92% 1% 11 Search METAL+CLUSTER+COMPLEX Search METAL+CLUSTER+COMPLEX
8 CLUSTER ION BEAM 26 57% 2% 31 Search CLUSTER+ION+BEAM Search CLUSTER+ION+BEAM
9 ORGANIC DEPTH PROFILING 26 100% 1% 11 Search ORGANIC+DEPTH+PROFILING Search ORGANIC+DEPTH+PROFILING
10 G SIMS 26 80% 1% 16 Search G+SIMS Search G+SIMS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 GA BOMBARDMENT 108 88% 3% 51
2 BUCKMINSTERFULLERENE PROBE 56 89% 1% 25
3 CLUSTER BOMBARDMENT 46 82% 2% 27
4 MICROSCOPIC INSIGHTS 42 83% 1% 24
5 CLUSTER ION BEAMS 35 89% 1% 16
6 LB LAYERS 31 92% 1% 12
7 SPUTTERING YIELDS 30 43% 3% 54
8 CLUSTER IMPACTS 27 76% 1% 19
9 CLUSTER IMPACT 26 55% 2% 33
10 TOF SIMS 21 14% 8% 146

Journals

Reviews


Title Publ. year Cit. Active references % act. ref.
to same field
CLUSTER SECONDARY ION MASS SPECTROMETRY OF POLYMERS AND RELATED MATERIALS 2010 109 222 57%
Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three Dimensions 2013 29 174 56%
DEVELOPMENTS IN MOLECULAR SIMS DEPTH PROFILING AND 3D IMAGING OF BIOLOGICAL SYSTEMS USING POLYATOMIC PRIMARY IONS 2011 52 76 63%
Computational view of surface based organic mass spectrometry 2008 76 91 56%
Cluster-surface interaction: From soft landing to implantation 2011 63 298 33%
Biological Cluster Mass Spectrometry 2010 36 51 75%
Progress and applications of cluster ion beam technology 2015 1 20 95%
Molecular sputter depth profiling using carbon cluster beams 2010 24 54 94%
A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems 2010 40 46 61%
Materials processing by gas cluster ion beams 2001 186 60 32%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ION BEAM ENGN EXPT 55 59% 3.4% 61
2 PCPM 15 33% 2.0% 36
3 ELE ON OPT SALES 14 100% 0.4% 7
4 SMOLUCHOWSKI PHYS 11 21% 2.7% 48
5 QUANTUM SCI ENGN 9 13% 3.8% 68
6 EPSRC XPS USERS SERV NEXUS 9 83% 0.3% 5
7 CHEM CHARACTERIZAT ANAL 7 36% 0.9% 16
8 CHEM CDE 6 100% 0.2% 4
9 CONDENSED MATTER NANOSCI BIO SOFT MATTER 5 25% 1.1% 19
10 FIS QUIM LICADAS TECN AERONAUT 5 37% 0.6% 10

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000170968 IMAGING MASS SPECTROMETRY//MASS SPECTROMETRY IMAGING//MALDI IMAGING
2 0.0000167615 MAT CHARACTERIZAT PREPARAT IL//ADV ENGN MAT IL//STATIC SECONDARY ION MASS SPECTROMETRY
3 0.0000152331 CONDENSED GASES//ELECTRONIC SPUTTERING//PLASMA DESORPTION MASS SPECTROMETRY
4 0.0000118619 SURFACE INDUCED DISSOCIATION//ION SURFACE COLLISIONS//ION SOFT LANDING
5 0.0000109372 KINETIC EXCITATION//ION PHOTON EMISSION//NON ADDITIVE SPUTTERING
6 0.0000107575 NANOSCALE PHYS//NANO CLUSTER DEVICES LTD//PLASMA GAS CONDENSATION
7 0.0000104071 LANGMUIR SORPTION MODEL//ION CLUSTER BEAM DEPOSITION//IONIZED CLUSTER BEAM TECHNIQUE
8 0.0000073435 CO AL//AL NI001//CO AL 001
9 0.0000068497 OXYGEN BOMBARDMENT//STORING MATTER TECHNIQUE//SCI ANAL MAT SAM
10 0.0000057052 CHARGED NANOPARTICLES//SASAKI TEAM//MICROSTRUCT SCI MAT