Class information for:
Level 1: SRAM//PROCESS VARIATION//POWER GATING

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
3979 1795 20.5 41%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
923 10486 IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//HIGH LEVEL SYNTHESIS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SRAM Author keyword 48 22% 11% 198
2 PROCESS VARIATION Author keyword 26 21% 6% 112
3 POWER GATING Author keyword 24 30% 4% 68
4 STATIC RANDOM ACCESS MEMORY SRAM Author keyword 17 36% 2% 38
5 SUBTHRESHOLD LEAKAGE Author keyword 16 49% 1% 24
6 PROCESS VARIATIONS Author keyword 15 21% 4% 64
7 MTCMOS Author keyword 14 38% 2% 30
8 DUAL THRESHOLD VOLTAGE Author keyword 14 57% 1% 17
9 VOLTAGE SCALING Author keyword 13 28% 2% 40
10 LEAKAGE POWER Author keyword 11 21% 3% 46

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 SRAM 48 22% 11% 198 Search SRAM Search SRAM
2 PROCESS VARIATION 26 21% 6% 112 Search PROCESS+VARIATION Search PROCESS+VARIATION
3 POWER GATING 24 30% 4% 68 Search POWER+GATING Search POWER+GATING
4 STATIC RANDOM ACCESS MEMORY SRAM 17 36% 2% 38 Search STATIC+RANDOM+ACCESS+MEMORY+SRAM Search STATIC+RANDOM+ACCESS+MEMORY+SRAM
5 SUBTHRESHOLD LEAKAGE 16 49% 1% 24 Search SUBTHRESHOLD+LEAKAGE Search SUBTHRESHOLD+LEAKAGE
6 PROCESS VARIATIONS 15 21% 4% 64 Search PROCESS+VARIATIONS Search PROCESS+VARIATIONS
7 MTCMOS 14 38% 2% 30 Search MTCMOS Search MTCMOS
8 DUAL THRESHOLD VOLTAGE 14 57% 1% 17 Search DUAL+THRESHOLD+VOLTAGE Search DUAL+THRESHOLD+VOLTAGE
9 VOLTAGE SCALING 13 28% 2% 40 Search VOLTAGE+SCALING Search VOLTAGE+SCALING
10 LEAKAGE POWER 11 21% 3% 46 Search LEAKAGE+POWER Search LEAKAGE+POWER

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 SUBTHRESHOLD SRAM 39 63% 2% 40
2 8T SRAM 13 71% 1% 10
3 SRAM 12 20% 3% 53
4 BODY BIAS 12 37% 1% 25
5 BITLINE 11 100% 0% 6
6 VARIATION TOLERANCE 11 100% 0% 6
7 LOW VOLTAGE OPERATION 9 55% 1% 12
8 BIT LINE 8 70% 0% 7
9 NANOSCALED CMOS 8 70% 0% 7
10 MTCMOS CIRCUITS 8 75% 0% 6

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Statistical timing analysis: From basic principles to state of the art 2008 95 6 33%
Digital circuit design challenges and opportunities in the era of nanoscale CMOS 2008 32 51 39%
Statistical static timing analysis: A survey 2009 8 8 50%
Precomputation-based guarding and a robust power gating strategy in deep sub-micron CMOS 2007 0 6 83%
Review and future prospects of low-voltage RAM circuits 2003 36 25 44%
Timing Analysis Techniques Review for sub-30 nm Circuit Designs 2010 0 6 50%
Energy efficient computation: A silicon perspective 2014 0 7 43%
Review of low-voltage CMOS LSI technology as a standard in the 21st century 1998 0 13 62%
Computer-aided design for low-power robust computing in nanoscale CMOS 2007 4 18 28%
Serial addition: Locally connected architectures 2007 5 43 19%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 ADV DESIGN DIGITAL CIRCUITS TECHNOL INTEGRAT 3 100% 0.2% 3
2 INTEGRATED CIRCUITS ELECT 3 100% 0.2% 3
3 LOW POWER CIRCUITS SYST 3 100% 0.2% 3
4 CIRCUIT 3 25% 0.6% 11
5 CIRCUITS 3 32% 0.4% 8
6 LOW POWER CIRCUITS SYST LPCS 2 67% 0.1% 2
7 VISUAL PARALLEL COMP GRP 2 67% 0.1% 2
8 MICROPROCESSOR S 2 30% 0.3% 6
9 ADV DESIGN GRP 2 50% 0.2% 3
10 GR H PERFORMANCE GRP 3D 1 100% 0.1% 2

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000240769 DEVICE MODELLING GRP//RANDOM DOPANT//DEVICE MODELING GRP
2 0.0000225662 SHORT CIRCUIT POWER DISSIPATION//TRANSISTOR SIZING//GATE SIZING
3 0.0000166755 CLOCK TREE//CLOCK SKEW//CLOCK DISTRIBUTION
4 0.0000162289 DATA RETENTION TIME//VOLTAGE DOWN CONVERTER//FERROELECTRIC MEMORY
5 0.0000143380 ADIABATIC CIRCUIT//ADIABATIC CHARGING//ENERGY RECOVERY LOGIC
6 0.0000140512 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI//NEGATIVE BIAS TEMPERATURE INSTABILITY//CHRISTIAN DOPPLER TCAD
7 0.0000135810 POWER ESTIMATION//SWITCHING ACTIVITY//BUS ENCODING
8 0.0000129207 PASS TRANSISTOR LOGIC//DIGITAL ARITHMETIC//FIXED WIDTH MULTIPLIER
9 0.0000123808 SUBSTRATE NOISE//SUBSTRATE COUPLING//POWER SUPPLY NOISE
10 0.0000086058 COUPLED METHOD CM//MICROPARTICLE MANIPULATION//LEVELIZED