Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
3489 | 1893 | 26.9 | 43% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
886 | 10744 | SURFACE AND INTERFACE ANALYSIS//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//IMFP |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | KINETIC EXCITATION | Author keyword | 17 | 100% | 0% | 8 |
2 | ION PHOTON EMISSION | Author keyword | 12 | 86% | 0% | 6 |
3 | NON ADDITIVE SPUTTERING | Author keyword | 6 | 80% | 0% | 4 |
4 | SECONDARY ION FORMATION | Author keyword | 6 | 80% | 0% | 4 |
5 | SPECT TRANSLAT INTERACT MOL | Address | 6 | 80% | 0% | 4 |
6 | ATOMIC AND MOLECULAR ION BOMBARDMENT | Author keyword | 6 | 100% | 0% | 4 |
7 | ATOMIC COLLISION CASCADE | Author keyword | 6 | 100% | 0% | 4 |
8 | CLUSTER PHYS | Address | 6 | 100% | 0% | 4 |
9 | EQUIPE SPECT IMAGERIE ATOM MAT | Address | 6 | 100% | 0% | 4 |
10 | TOF SNMS | Author keyword | 6 | 100% | 0% | 4 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | NEUTRAL SILVER CLUSTERS | 36 | 83% | 1% | 20 |
2 | SPUTTERED ATOMS | 19 | 37% | 2% | 41 |
3 | FINE STRUCTURE STATES | 19 | 76% | 1% | 13 |
4 | IONIZATION PROBABILITY | 18 | 47% | 1% | 28 |
5 | NI ATOMS | 17 | 68% | 1% | 15 |
6 | ATOMIC COLLISION CASCADES | 16 | 65% | 1% | 15 |
7 | FE ATOMS | 13 | 69% | 1% | 11 |
8 | ANGLE INTEGRATED YIELDS | 11 | 100% | 0% | 6 |
9 | AR IMPACT | 11 | 100% | 0% | 6 |
10 | SULFUR MOLECULES | 11 | 100% | 0% | 6 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
ENERGY AND ANGULAR-DISTRIBUTIONS OF SPUTTERED PARTICLES | 1994 | 131 | 258 | 51% |
Sputtering yields | 2007 | 40 | 227 | 44% |
Ionization and excitation processes in sputtering in the light of the experimental evidence | 1999 | 15 | 11 | 82% |
AUGER-ELECTRON EMISSION BY ION IMPACT ON SOLID-SURFACES | 1993 | 57 | 89 | 58% |
Ion-induced photon emission of metals | 1997 | 19 | 101 | 90% |
ANGULAR, ENERGY, AND MASS-DISTRIBUTION OF SPUTTERED PARTICLES | 1991 | 41 | 121 | 68% |
Energy and angular distributions of sputtered species | 2007 | 11 | 482 | 51% |
APPLICATION OF MOLECULAR-DYNAMICS SIMULATIONS TO THE STUDY OF ION-BOMBARDED METAL-SURFACES | 1988 | 98 | 60 | 58% |
MECHANISMS AND THEORY OF PHYSICAL SPUTTERING BY PARTICLE IMPACT | 1987 | 205 | 174 | 41% |
CHARGED AND EXCITED-STATES OF SPUTTERED ATOMS | 1991 | 29 | 123 | 61% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SPECT TRANSLAT INTERACT MOL | 6 | 80% | 0.2% | 4 |
2 | CLUSTER PHYS | 6 | 100% | 0.2% | 4 |
3 | EQUIPE SPECT IMAGERIE ATOM MAT | 6 | 100% | 0.2% | 4 |
4 | INFORMAT TECHNOL STRATEGY | 4 | 75% | 0.2% | 3 |
5 | ARIFOV ELECT | 3 | 27% | 0.5% | 10 |
6 | EQUIPE SIAM | 2 | 67% | 0.1% | 2 |
7 | PROJEKT KERNFUS | 1 | 50% | 0.1% | 2 |
8 | SPE OSCOPIE TRANSLAT INTERACT MOL | 1 | 100% | 0.1% | 2 |
9 | URE | 1 | 30% | 0.2% | 3 |
10 | DEP INGN ELECT SEES | 1 | 33% | 0.1% | 2 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000280951 | CONICAL PROTRUSION//FINE PROTRUSION//STRIPE RIB |
2 | 0.0000190305 | SUR E THIN FILM ANAL IFOS//SNMS//POST IONIZATION |
3 | 0.0000118484 | CONDENSED GASES//ELECTRONIC SPUTTERING//PLASMA DESORPTION MASS SPECTROMETRY |
4 | 0.0000114335 | OXYGEN BOMBARDMENT//STORING MATTER TECHNIQUE//SCI ANAL MAT SAM |
5 | 0.0000114241 | ION SOLID INTERACTIONS//LOW ENERGY ION SCATTERING//FAST ATOM DIFFRACTION |
6 | 0.0000109372 | MOLECULAR DEPTH PROFILING//CLUSTER SIMS//ION BEAM ENGN EXPT |
7 | 0.0000096686 | MOLECULAR HYDRINO//NOVEL HYDRIDE ION//NEW ENERGY SOURCE |
8 | 0.0000094712 | EMISSION STATISTICS//PARTICLE INDUCED ELECTRON EMISSION//KINETIC ELECTRON EMISSION |
9 | 0.0000060424 | ION SPUTTERING//HBEREICH AUTOMATISIERUNG INFORMAT//ION EROSION |
10 | 0.0000055191 | SUR E DYNAM//EXCITED STATE ALKALI ATOMS//OPTICAL CHIPS |