Class information for:
Level 1: PLATED THROUGH HOLE//ENDICOTT ELECT PACKAGING//THREE DIMENSIONAL 3 D CHIP STACKING

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
34687 65 13.8 29%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
688 12395 LEAD FREE SOLDER//SOLDERING & SURFACE MOUNT TECHNOLOGY//PB FREE SOLDER

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 PLATED THROUGH HOLE Author keyword 2 33% 6% 4
2 ENDICOTT ELECT PACKAGING Address 1 100% 3% 2
3 THREE DIMENSIONAL 3 D CHIP STACKING Author keyword 1 50% 3% 2
4 BOND PULL STRENGTH Author keyword 1 50% 2% 1
5 FIELD LIFE Author keyword 1 50% 2% 1
6 INTERCONNECT STRESS TEST Author keyword 1 50% 2% 1
7 RIGID FLEX PRINTED CIRCUIT Author keyword 1 50% 2% 1
8 SEMICOND PROD SECTORS Address 1 50% 2% 1
9 OCCAM PROCESS Author keyword 0 33% 2% 1
10 VERTICAL INTERCONNECTIONS Author keyword 0 33% 2% 1

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
LCSH search Wikipedia search
1 PLATED THROUGH HOLE 2 33% 6% 4 Search PLATED+THROUGH+HOLE Search PLATED+THROUGH+HOLE
2 THREE DIMENSIONAL 3 D CHIP STACKING 1 50% 3% 2 Search THREE+DIMENSIONAL+3+D+CHIP+STACKING Search THREE+DIMENSIONAL+3+D+CHIP+STACKING
3 BOND PULL STRENGTH 1 50% 2% 1 Search BOND+PULL+STRENGTH Search BOND+PULL+STRENGTH
4 FIELD LIFE 1 50% 2% 1 Search FIELD+LIFE Search FIELD+LIFE
5 INTERCONNECT STRESS TEST 1 50% 2% 1 Search INTERCONNECT+STRESS+TEST Search INTERCONNECT+STRESS+TEST
6 RIGID FLEX PRINTED CIRCUIT 1 50% 2% 1 Search RIGID+FLEX+PRINTED+CIRCUIT Search RIGID+FLEX+PRINTED+CIRCUIT
7 OCCAM PROCESS 0 33% 2% 1 Search OCCAM+PROCESS Search OCCAM+PROCESS
8 VERTICAL INTERCONNECTIONS 0 33% 2% 1 Search VERTICAL+INTERCONNECTIONS Search VERTICAL+INTERCONNECTIONS
9 THERMO MECHANICAL TESTING 0 15% 3% 2 Search THERMO+MECHANICAL+TESTING Search THERMO+MECHANICAL+TESTING
10 CUT DEPTH 0 25% 2% 1 Search CUT+DEPTH Search CUT+DEPTH

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 PLATED THROUGH HOLES 1 40% 3% 2
2 MULTILAYER INTERCONNECTION BOARDS 1 50% 2% 1
3 LONG TERM RELIABILITY 0 33% 2% 1
4 LINE STRUCTURES 0 25% 2% 1
5 ELECTROCHEMICAL REACTORS 0 13% 3% 2
6 GRID ARRAY ASSEMBLIES 0 20% 2% 1
7 BATTERY MODELS 0 100% 2% 1
8 POLYMER LINE STRUCTURES 0 100% 2% 1
9 PTH RELIABILITY 0 100% 2% 1

Journals

Reviews



Title Publ. year Cit. Active
references
% act. ref.
to same field
HIGH-RESOLUTION OPTICAL INTERFERENCE MEASUREMENTS OF CHANGES IN BOND-LINE THICKNESS - A REVIEW 1990 0 4 100%

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 ENDICOTT ELECT PACKAGING 1 100% 3.1% 2
2 SEMICOND PROD SECTORS 1 50% 1.5% 1
3 MAT SCI CHEM CHEM ENGNMINIST EDUC 0 25% 1.5% 1
4 ADV INTERCONNECT SYST S 0 20% 1.5% 1
5 DEVICE PACKAGING 0 20% 1.5% 1
6 THERMAL ANAL MAT PROC 0 10% 1.5% 1
7 FAILURE ANAL PHYS 0 100% 1.5% 1
8 HSDDL 0 100% 1.5% 1
9 RENEWABLE POWER BUSINESS UNIT 0 100% 1.5% 1

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000170372 THECLA//ACTS OF PAUL//HANMUN
2 0.0000159683 JOURNAL OF ELECTRONIC PACKAGING//SOLDERING & SURFACE MOUNT TECHNOLOGY//SOLDER JOINT
3 0.0000154730 THE REFINED THEORY//DECOMPOSED THEOREM//THE LURE METHOD
4 0.0000143599 INNER LEAD BONDING ILB//INNER LEAD BONDING//LASER SOLDERING
5 0.0000123102 THERMAL ENGN TECHNOL//J AN MARINE SCI TECHNOL//INP WAFERS
6 0.0000110016 IN CIRCUIT MEASUREMENT//COMPUTER AIDED DESIGN CAD TECHNIQUES//HIGH POWER RF TRANSISTORS
7 0.0000090921 BENZOCYCLOBUTENE//MICROWAVE MICROSYST//NON PLANAR DEVICES
8 0.0000084248 BLISTER TEST//SHAFT LOADED BLISTER TEST//FIXED ARM PEEL
9 0.0000080153 FLEXIBLE COPPER CLAD LAMINATE//FLEXIBLE COPPER CLAD LAMINATE FCCL//SILANE MODIFIED POLYVINYLIMIDAZOLE
10 0.0000079507 SPECKLE PHOTOGRAPHY//OPTIMO//YOUNG FRINGES