Class information for:
Level 1: RESIST SENSITIVITY//MATH CHEM ENGN//RECTIFICATION PROPERTY

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
34663 66 17.4 50%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
2662 2955 FYS CHEM//INERT SEMICONDUCTOR REDOX ELECTROLYTE//KINETICS OF REDOX REACTIONS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 RESIST SENSITIVITY Author keyword 1 12% 6% 4
2 MATH CHEM ENGN Address 0 33% 2% 1
3 RECTIFICATION PROPERTY Author keyword 0 25% 2% 1
4 HEAT DEFORMATION Author keyword 0 20% 2% 1
5 REDOX DEPOSITION Author keyword 0 20% 2% 1
6 PHOTOCATALYTIC LITHOGRAPHY Author keyword 0 13% 2% 1
7 SCAN EXPOSURE Author keyword 0 13% 2% 1
8 ELECTRIC FIELD DEPENDENCE Author keyword 0 11% 2% 1
9 REFLECTIVE MASK Author keyword 0 11% 2% 1
10 ADSORPTION OF O 2 Author keyword 0 100% 2% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 RESIST SENSITIVITY 1 12% 6% 4 Search RESIST+SENSITIVITY Search RESIST+SENSITIVITY
2 RECTIFICATION PROPERTY 0 25% 2% 1 Search RECTIFICATION+PROPERTY Search RECTIFICATION+PROPERTY
3 HEAT DEFORMATION 0 20% 2% 1 Search HEAT+DEFORMATION Search HEAT+DEFORMATION
4 REDOX DEPOSITION 0 20% 2% 1 Search REDOX+DEPOSITION Search REDOX+DEPOSITION
5 PHOTOCATALYTIC LITHOGRAPHY 0 13% 2% 1 Search PHOTOCATALYTIC+LITHOGRAPHY Search PHOTOCATALYTIC+LITHOGRAPHY
6 SCAN EXPOSURE 0 13% 2% 1 Search SCAN+EXPOSURE Search SCAN+EXPOSURE
7 ELECTRIC FIELD DEPENDENCE 0 11% 2% 1 Search ELECTRIC+FIELD+DEPENDENCE Search ELECTRIC+FIELD+DEPENDENCE
8 REFLECTIVE MASK 0 11% 2% 1 Search REFLECTIVE+MASK Search REFLECTIVE+MASK
9 ADSORPTION OF O 2 0 100% 2% 1 Search ADSORPTION+OF+O+2 Search ADSORPTION+OF+O+2
10 ELECTRODE ELECTRODE DISTANCE 0 100% 2% 1 Search ELECTRODE+ELECTRODE+DISTANCE Search ELECTRODE+ELECTRODE+DISTANCE

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 ELECTRONIC STATE DENSITIES 1 50% 2% 1
2 EUV RETICLE 1 50% 2% 1
3 ELECTROCHEMICAL TUNNELING SPECTROSCOPY 0 33% 2% 1
4 MEMBRANE MIRRORS 0 25% 2% 1
5 CYTOSTATIC EVALUATIONS 0 20% 2% 1
6 RETICLES 0 10% 3% 2
7 STATE DENSITIES 0 11% 2% 1
8 SENSITIVE ZNO SIO2 AU DEVICE 0 100% 2% 1

Journals

Reviews

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 MATH CHEM ENGN 0 33% 1.5% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000177377 PHOTOCATALYTIC LITHOGRAPHY//LATEX DEV//REMOTE OXIDATION
2 0.0000130430 NANOMETER SIZED SCHOTTKY CONTACT//METAL DOT ARRAY//NANO DIODE
3 0.0000128647 ELECTROCHEMICAL MICROSCRATCHING//PARTICLE CONTACTS//GLASS ENAMEL COATINGS
4 0.0000112191 SHEARING MOTIONS//WEAK INHOMOGENEITY//PRACT EDUC
5 0.0000094143 FYS CHEM//INERT SEMICONDUCTOR REDOX ELECTROLYTE//KINETICS OF REDOX REACTIONS
6 0.0000086537 LOCAL ANODIC OXIDATION//AFM LITHOGRAPHY//NANO OXIDATION
7 0.0000084229 PHYSICOCHIM MOLEC ORSAY//SURFACE STRUCTURE AND ROUGHNESS//DESORPTION INDUCED BY ELECTRON STIMULATION
8 0.0000078307 PYROMET//PYROSEARCH//GASIFICATION AND MELTING
9 0.0000074323 S SENCE//SCANNING LIGHT PULSE TECHNIQUE//HYDROGEN SENSOR
10 0.0000071543 X RAY MASK//SUPER FINE SR LITHOG//X RAY LITHOGRAPHY