Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
34345 | 73 | 13.4 | 38% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
3719 | 741 | AT&T TECHNICAL JOURNAL//FRAME SYNCHRONIZATION//BELL SYSTEM TECHNICAL JOURNAL |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | FUNCT TERMINAL CIRCUITS GRP | Address | 1 | 100% | 3% | 2 |
2 | ITO AU ITO | Author keyword | 1 | 50% | 1% | 1 |
3 | COMPLEMENTARY METAL OXIDE SEMICONDUCTOR CMOS DEVICES | Author keyword | 0 | 33% | 1% | 1 |
4 | PREVENT CONTROL EXPLOS DISASTERS | Address | 0 | 33% | 1% | 1 |
5 | OPTICAL THICKNESS MONITORING | Author keyword | 0 | 25% | 1% | 1 |
6 | MULTILAYER STACK | Author keyword | 0 | 13% | 1% | 1 |
7 | AD HOC WORKFLOW | Author keyword | 0 | 11% | 1% | 1 |
8 | AL2O3 FINE POWDERS | Author keyword | 0 | 100% | 1% | 1 |
9 | DATA NETWORK EXPLORATORY DEV | Address | 0 | 100% | 1% | 1 |
10 | INFRARED FILM THICKNESS MONITOR | Author keyword | 0 | 100% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ITO AU ITO | 1 | 50% | 1% | 1 | Search ITO+AU+ITO | Search ITO+AU+ITO |
2 | COMPLEMENTARY METAL OXIDE SEMICONDUCTOR CMOS DEVICES | 0 | 33% | 1% | 1 | Search COMPLEMENTARY+METAL+OXIDE+SEMICONDUCTOR+CMOS+DEVICES | Search COMPLEMENTARY+METAL+OXIDE+SEMICONDUCTOR+CMOS+DEVICES |
3 | OPTICAL THICKNESS MONITORING | 0 | 25% | 1% | 1 | Search OPTICAL+THICKNESS+MONITORING | Search OPTICAL+THICKNESS+MONITORING |
4 | MULTILAYER STACK | 0 | 13% | 1% | 1 | Search MULTILAYER+STACK | Search MULTILAYER+STACK |
5 | AD HOC WORKFLOW | 0 | 11% | 1% | 1 | Search AD+HOC+WORKFLOW | Search AD+HOC+WORKFLOW |
6 | AL2O3 FINE POWDERS | 0 | 100% | 1% | 1 | Search AL2O3+FINE+POWDERS | Search AL2O3+FINE+POWDERS |
7 | INFRARED FILM THICKNESS MONITOR | 0 | 100% | 1% | 1 | Search INFRARED+FILM+THICKNESS+MONITOR | Search INFRARED+FILM+THICKNESS+MONITOR |
8 | QUARTERWAVE | 0 | 100% | 1% | 1 | Search QUARTERWAVE | Search QUARTERWAVE |
9 | TELECOM SERVICE PROCESS | 0 | 100% | 1% | 1 | Search TELECOM+SERVICE+PROCESS | Search TELECOM+SERVICE+PROCESS |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | GIBBS WULFF CONSTRUCTION | 1 | 50% | 1% | 1 |
2 | AS P FILMS | 0 | 25% | 1% | 1 |
3 | BEAM INDUCED REFLECTANCE | 0 | 100% | 1% | 1 |
4 | TIRKS | 0 | 100% | 1% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
MICROELECTRONICS PACKAGING - PRESENT AND FUTURE | 1995 | 14 | 7 | 29% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | FUNCT TERMINAL CIRCUITS GRP | 1 | 100% | 2.7% | 2 |
2 | PREVENT CONTROL EXPLOS DISASTERS | 0 | 33% | 1.4% | 1 |
3 | DATA NETWORK EXPLORATORY DEV | 0 | 100% | 1.4% | 1 |
4 | LOOP MAINTENANCE OPER PLANNING GRP | 0 | 100% | 1.4% | 1 |
5 | MAINTENANCE SYST ENGN | 0 | 100% | 1.4% | 1 |
6 | TESTING REQUIREMENTS GRP | 0 | 100% | 1.4% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000281776 | MINIMUM DISTANCE CALCULATION//FINE MOTION PLANNING//WESTERN NORWAY |
2 | 0.0000229573 | CAPABILITIES BASED PLANNING//HOMELAND SECURITY PLANNING//SERV NODE ARCHITECTURE PERFORMANCE |
3 | 0.0000191104 | AI IN NETWORKS//FISHEYE TRANSFORMATION//KNOWLEDGE REPRESENTATION FORMALISMS AND METHODS ARTIFICIAL INTELLIGENCE |
4 | 0.0000186031 | FRAME SYNCHRONIZATION//BLIND FRAME SYNCHRONIZATION//PREFIX SYNCHRONIZED CODES |
5 | 0.0000174505 | PROBE CARD//POROUS SILICON MICROMACHINING//VERTICAL ACTIVE DEVICES |
6 | 0.0000149958 | CRIT INFRASTRUCT PROTECT//AI SAFETY//BLP BELL LAPADULA SECURITY MODEL |
7 | 0.0000083443 | B NB TI//REFRACTORY MET//ULTRA HIGH PURITY NIOBIUM |
8 | 0.0000077009 | LINE DRIVER//OPERAT SYST DEV//RADIO COMMUN NETWORKS S RADIO COMMUN SYST |
9 | 0.0000066645 | CZOCHRALSKI SILICON SUBSTRATES//BERYLLIUM BORIDES//OXYGEN PROFILING |
10 | 0.0000057482 | PHOTON TEST//HOMODYNE CROSSTALK//ADV TRANSPORT SYST |