Class information for:
Level 1: FUNCT TERMINAL CIRCUITS GRP//ITO AU ITO//COMPLEMENTARY METAL OXIDE SEMICONDUCTOR CMOS DEVICES

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
34345 73 13.4 38%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
3719 741 AT&T TECHNICAL JOURNAL//FRAME SYNCHRONIZATION//BELL SYSTEM TECHNICAL JOURNAL

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 FUNCT TERMINAL CIRCUITS GRP Address 1 100% 3% 2
2 ITO AU ITO Author keyword 1 50% 1% 1
3 COMPLEMENTARY METAL OXIDE SEMICONDUCTOR CMOS DEVICES Author keyword 0 33% 1% 1
4 PREVENT CONTROL EXPLOS DISASTERS Address 0 33% 1% 1
5 OPTICAL THICKNESS MONITORING Author keyword 0 25% 1% 1
6 MULTILAYER STACK Author keyword 0 13% 1% 1
7 AD HOC WORKFLOW Author keyword 0 11% 1% 1
8 AL2O3 FINE POWDERS Author keyword 0 100% 1% 1
9 DATA NETWORK EXPLORATORY DEV Address 0 100% 1% 1
10 INFRARED FILM THICKNESS MONITOR Author keyword 0 100% 1% 1

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
LCSH search Wikipedia search
1 ITO AU ITO 1 50% 1% 1 Search ITO+AU+ITO Search ITO+AU+ITO
2 COMPLEMENTARY METAL OXIDE SEMICONDUCTOR CMOS DEVICES 0 33% 1% 1 Search COMPLEMENTARY+METAL+OXIDE+SEMICONDUCTOR+CMOS+DEVICES Search COMPLEMENTARY+METAL+OXIDE+SEMICONDUCTOR+CMOS+DEVICES
3 OPTICAL THICKNESS MONITORING 0 25% 1% 1 Search OPTICAL+THICKNESS+MONITORING Search OPTICAL+THICKNESS+MONITORING
4 MULTILAYER STACK 0 13% 1% 1 Search MULTILAYER+STACK Search MULTILAYER+STACK
5 AD HOC WORKFLOW 0 11% 1% 1 Search AD+HOC+WORKFLOW Search AD+HOC+WORKFLOW
6 AL2O3 FINE POWDERS 0 100% 1% 1 Search AL2O3+FINE+POWDERS Search AL2O3+FINE+POWDERS
7 INFRARED FILM THICKNESS MONITOR 0 100% 1% 1 Search INFRARED+FILM+THICKNESS+MONITOR Search INFRARED+FILM+THICKNESS+MONITOR
8 QUARTERWAVE 0 100% 1% 1 Search QUARTERWAVE Search QUARTERWAVE
9 TELECOM SERVICE PROCESS 0 100% 1% 1 Search TELECOM+SERVICE+PROCESS Search TELECOM+SERVICE+PROCESS

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 GIBBS WULFF CONSTRUCTION 1 50% 1% 1
2 AS P FILMS 0 25% 1% 1
3 BEAM INDUCED REFLECTANCE 0 100% 1% 1
4 TIRKS 0 100% 1% 1

Journals

Reviews



Title Publ. year Cit. Active
references
% act. ref.
to same field
MICROELECTRONICS PACKAGING - PRESENT AND FUTURE 1995 14 7 29%

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 FUNCT TERMINAL CIRCUITS GRP 1 100% 2.7% 2
2 PREVENT CONTROL EXPLOS DISASTERS 0 33% 1.4% 1
3 DATA NETWORK EXPLORATORY DEV 0 100% 1.4% 1
4 LOOP MAINTENANCE OPER PLANNING GRP 0 100% 1.4% 1
5 MAINTENANCE SYST ENGN 0 100% 1.4% 1
6 TESTING REQUIREMENTS GRP 0 100% 1.4% 1

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000281776 MINIMUM DISTANCE CALCULATION//FINE MOTION PLANNING//WESTERN NORWAY
2 0.0000229573 CAPABILITIES BASED PLANNING//HOMELAND SECURITY PLANNING//SERV NODE ARCHITECTURE PERFORMANCE
3 0.0000191104 AI IN NETWORKS//FISHEYE TRANSFORMATION//KNOWLEDGE REPRESENTATION FORMALISMS AND METHODS ARTIFICIAL INTELLIGENCE
4 0.0000186031 FRAME SYNCHRONIZATION//BLIND FRAME SYNCHRONIZATION//PREFIX SYNCHRONIZED CODES
5 0.0000174505 PROBE CARD//POROUS SILICON MICROMACHINING//VERTICAL ACTIVE DEVICES
6 0.0000149958 CRIT INFRASTRUCT PROTECT//AI SAFETY//BLP BELL LAPADULA SECURITY MODEL
7 0.0000083443 B NB TI//REFRACTORY MET//ULTRA HIGH PURITY NIOBIUM
8 0.0000077009 LINE DRIVER//OPERAT SYST DEV//RADIO COMMUN NETWORKS S RADIO COMMUN SYST
9 0.0000066645 CZOCHRALSKI SILICON SUBSTRATES//BERYLLIUM BORIDES//OXYGEN PROFILING
10 0.0000057482 PHOTON TEST//HOMODYNE CROSSTALK//ADV TRANSPORT SYST