Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
34322 | 73 | 22.5 | 31% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
142 | 22391 | JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY//SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY//ELECTROTHERMAL VAPORIZATION |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | CADMIUM YELLOW | Author keyword | 3 | 100% | 4% | 3 |
2 | ELECTRON BACKSCATTERING COEFFICIENT | Author keyword | 1 | 50% | 1% | 1 |
3 | EYE CATARACTS | Author keyword | 1 | 50% | 1% | 1 |
4 | GALLIUM ARSENIDE WAFER | Author keyword | 1 | 50% | 1% | 1 |
5 | PIGMENT INTERACTION | Author keyword | 1 | 50% | 1% | 1 |
6 | POSITION TAGGED SPECTROMETRY | Author keyword | 1 | 50% | 1% | 1 |
7 | SCATTER DIAGRAM ANALYSIS | Author keyword | 1 | 50% | 1% | 1 |
8 | ZETA FACTORS | Author keyword | 1 | 50% | 1% | 1 |
9 | CADMIUM PIGMENTS | Author keyword | 0 | 33% | 1% | 1 |
10 | COMPOSITIONAL IMAGING | Author keyword | 0 | 33% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | CADMIUM YELLOW | 3 | 100% | 4% | 3 | Search CADMIUM+YELLOW | Search CADMIUM+YELLOW |
2 | ELECTRON BACKSCATTERING COEFFICIENT | 1 | 50% | 1% | 1 | Search ELECTRON+BACKSCATTERING+COEFFICIENT | Search ELECTRON+BACKSCATTERING+COEFFICIENT |
3 | EYE CATARACTS | 1 | 50% | 1% | 1 | Search EYE+CATARACTS | Search EYE+CATARACTS |
4 | GALLIUM ARSENIDE WAFER | 1 | 50% | 1% | 1 | Search GALLIUM+ARSENIDE+WAFER | Search GALLIUM+ARSENIDE+WAFER |
5 | PIGMENT INTERACTION | 1 | 50% | 1% | 1 | Search PIGMENT+INTERACTION | Search PIGMENT+INTERACTION |
6 | POSITION TAGGED SPECTROMETRY | 1 | 50% | 1% | 1 | Search POSITION+TAGGED+SPECTROMETRY | Search POSITION+TAGGED+SPECTROMETRY |
7 | SCATTER DIAGRAM ANALYSIS | 1 | 50% | 1% | 1 | Search SCATTER+DIAGRAM+ANALYSIS | Search SCATTER+DIAGRAM+ANALYSIS |
8 | ZETA FACTORS | 1 | 50% | 1% | 1 | Search ZETA+FACTORS | Search ZETA+FACTORS |
9 | CADMIUM PIGMENTS | 0 | 33% | 1% | 1 | Search CADMIUM+PIGMENTS | Search CADMIUM+PIGMENTS |
10 | COMPOSITIONAL IMAGING | 0 | 33% | 1% | 1 | Search COMPOSITIONAL+IMAGING | Search COMPOSITIONAL+IMAGING |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | ELECTRON PROBE MICROANALYZER | 3 | 50% | 7% | 5 |
2 | PULSE PROCESSOR | 1 | 50% | 1% | 1 |
3 | SPECTROMETRY LEEIXS | 0 | 17% | 1% | 1 |
4 | MICROBEAM ANALYSIS | 0 | 14% | 1% | 1 |
5 | MS TRACE ELEMENT | 0 | 14% | 1% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
Saving the photons: mapping x-rays by position-tagged spectrometry | 1999 | 7 | 7 | 57% |
AUTOMATED SYSTEMS OF IMAGE-PROCESSING AND METALLOGRAPHIC INSPECTION (REVIEW) | 1987 | 0 | 4 | 75% |
ATOMIC SPECTROMETRY UPDATE INDUSTRIAL ANALYSIS - METALS, CHEMICALS AND ADVANCED MATERIALS | 1991 | 4 | 181 | 7% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MKT PLICAT GRP | 0 | 100% | 1.4% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000223137 | KUPA RIVER DRAINAGE BASIN//ALUMINUM INTERFERENCE//RIVERS OF KOSOVO |
2 | 0.0000184408 | ENGN 36//MINIMUM MASS FRACTION//QUANTITATIVE X RAY MAPPING |
3 | 0.0000179200 | ELE ON SPECT GRP//HOTSPOT RADIATION//CAO CRUCIBLE |
4 | 0.0000161808 | CHITON//CHITON RADULA//EASY MAGNETIZATION DIRECTION |
5 | 0.0000158722 | LEEIXS//SOFT X RAY SPECTROMETRY//SIO2 NA2O BINARY SLAG |
6 | 0.0000158287 | EFTEM//ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY EFTEM//SPECTRUM IMAGING |
7 | 0.0000116028 | ETUD SCI NAT ENVIRONM//CONTINUOUS FLOW CENTRIFUGE//QUARTIER BINZA UPN |
8 | 0.0000100452 | LOW Z PARTICLE ELECTRON PROBE X RAY MICROANALYSIS//INDIVIDUAL PARTICLE ANALYSIS//LOW Z PARTICLE EPMA |
9 | 0.0000094818 | DIGITAL SPECTROSCOPY//NUCLEAR COUNTING//CDZNTE SEMICONDUCTOR DETECTOR |
10 | 0.0000094084 | VITREOUS ENAMEL//VITREOUS ENAMEL COATING//PROPERMA ENGN COATINGS |