Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
33345 | 93 | 12.4 | 42% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
2430 | 3649 | INTENSE PULSED ION BEAM//HIGH CURRENT PULSED ELECTRON BEAM//HIGH INTENSITY PULSED ION BEAM |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | INFNSEZ LECCE | Address | 1 | 50% | 2% | 2 |
2 | FAST SIGNALS | Author keyword | 1 | 50% | 1% | 1 |
3 | FOCUSED ION BEAM IMAGING | Author keyword | 1 | 50% | 1% | 1 |
4 | HIGH MELTING COMPOUNDS | Author keyword | 1 | 50% | 1% | 1 |
5 | RAFI CHAIR | Address | 1 | 50% | 1% | 1 |
6 | ELETTRON PL STRUMENTAZ | Address | 0 | 33% | 1% | 1 |
7 | ELETTRON PLICATA STRUMENTAZ LEAS | Address | 0 | 33% | 1% | 1 |
8 | STEEPEST DESCENT ALGORITHMS | Author keyword | 0 | 25% | 1% | 1 |
9 | HIGH VOLTAGE TECHNOLOGY | Author keyword | 0 | 17% | 1% | 1 |
10 | FIB SEM BOMBAY | Address | 0 | 13% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | DEPOSITED TUNGSTEN | 1 | 50% | 1% | 1 |
2 | LOW IMPEDANCE | 0 | 33% | 1% | 1 |
3 | CHROMIUM SILICIDE | 0 | 20% | 1% | 1 |
4 | GAS HALIDE LASERS | 0 | 17% | 1% | 1 |
5 | COMPRESSION CIRCUIT | 0 | 100% | 1% | 1 |
6 | CW SCANNED LASER | 0 | 100% | 1% | 1 |
7 | PULSE POWER GENERATION | 0 | 100% | 1% | 1 |
8 | VOLTAGE COMPRESSOR | 0 | 100% | 1% | 1 |
Journals |
Reviews |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | INFNSEZ LECCE | 1 | 50% | 2.2% | 2 |
2 | RAFI CHAIR | 1 | 50% | 1.1% | 1 |
3 | ELETTRON PL STRUMENTAZ | 0 | 33% | 1.1% | 1 |
4 | ELETTRON PLICATA STRUMENTAZ LEAS | 0 | 33% | 1.1% | 1 |
5 | FIB SEM BOMBAY | 0 | 13% | 1.1% | 1 |
6 | DIPARTIMENTO FISSEZ LECCE | 0 | 100% | 1.1% | 1 |
7 | LEASINFNSEZ LECCE | 0 | 100% | 1.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000245762 | HYDROGEN INDUCED FRACTURE//SURFACE SCALE//SILUMINS |
2 | 0.0000192573 | TISI2//SALICIDE//NICKEL SILICIDE |
3 | 0.0000192325 | CU NI TI SYSTEM//OPTICAL CONDUCTIVITY SPECTRUM//DATA STORAGE MAT |
4 | 0.0000174402 | INTENSE PULSED ION BEAM//HIGH CURRENT PULSED ELECTRON BEAM//HIGH INTENSITY PULSED ION BEAM |
5 | 0.0000145004 | EXCIMER LASER DOPING//LASER INDUCED SURFACE PROCESS//WIDE BANDGAP OXIDES |
6 | 0.0000117493 | THERMOGRADIENT EFFECT//HETERO EPITAXIAL STRUCTURE//LASER INDUCED ATOMIC DEFECTS |
7 | 0.0000102853 | LATTICE SPECIFIC HEAT//AUFE ALLOYS//HAHN MEITNER KERNFOR |
8 | 0.0000102662 | ZONE MELTING RECRYSTALLIZATION//ARCHITECTURE TECH//LASER INDUCED TEMPERATURE RISE |
9 | 0.0000094230 | VALENCE BAND DENSITY OF STATES//SURFACE MAGNETO OPTIC KERR EFFECT//METAL SEMICONDUCTOR THIN FILM |
10 | 0.0000087938 | LASER COLOR MARKING//DPCSEARS//FEATURE SIMILARITY INDEX |