Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
33328 | 94 | 15.4 | 27% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
2557 | 3267 | INTERFACIAL SILICON EMISSION//SILICON OXIDATION//GENIE URBAIN ENVIRONM |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | HITACHI ADM | Address | 1 | 50% | 1% | 1 |
2 | SOLAR CELL METALLIZATION | Author keyword | 0 | 14% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | SOLAR CELL METALLIZATION | 0 | 14% | 1% | 1 | Search SOLAR+CELL+METALLIZATION | Search SOLAR+CELL+METALLIZATION |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | RUO2 GLASS COMPOSITES | 0 | 33% | 1% | 1 |
2 | AG CONTACTS | 0 | 10% | 1% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
KINETICS AND MECHANISMS OF DISSOLUTION AND OXIDATION REACTIONS OF SEMICONDUCTORS | 1983 | 5 | 11 | 27% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | HITACHI ADM | 1 | 50% | 1.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000199519 | IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE//P N JUNCTION LEAKAGE |
2 | 0.0000171057 | SIPOS//MSOS O P STRUCTURE//SEMI INSULATING POLYCRYSTALLINE SILICON |
3 | 0.0000138724 | EMISSION RATE SPECTRUM//CAPACITANCE TRANSIENTS//DLTS RESOLUTION |
4 | 0.0000120403 | CDS NANONEEDLES//ELE ODYNAM PL PROBLEM//CHEMISENSORS |
5 | 0.0000112242 | BOROPHOSPHOSILICATE GLASS BPSG//ATMOSPHERIC PRESSURE CVD//BPSG |
6 | 0.0000103890 | CRYOGENIC MEDIA//SECTOR PHYS CHEM//SILICON QUANTUM WIRE |
7 | 0.0000102249 | THICK FILM RESISTORS//ELECTROCOMPONENT SCIENCE AND TECHNOLOGY//THICK FILM RESISTOR |
8 | 0.0000092682 | IN FRANTZEVICH PROBLEMS MAT SCI//GROWTH TECHNIQUES//SEMICOND HETEROSTRUCT |
9 | 0.0000090148 | SILVER PASTES//CONDUCTING POWDER//SILVER PASTE |
10 | 0.0000088102 | GE S GLASSES//STACKING STRUCTURES//TOPOLOGICAL FACTOR |