Class information for:
Level 1: CURRENT VOLTAGE CHARACTERISTICS//2DEG DENSITY//AU EVAPORATION

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
32684 104 22.5 31%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
270 18550 SEMICONDUCTOR LASERS//IEEE JOURNAL OF QUANTUM ELECTRONICS//IEEE PHOTONICS TECHNOLOGY LETTERS

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 CURRENT VOLTAGE CHARACTERISTICS Author keyword 1 50% 2% 2
2 2DEG DENSITY Author keyword 1 50% 1% 1
3 AU EVAPORATION Author keyword 1 50% 1% 1
4 CPD SEMICOND MICROELECT Address 1 50% 1% 1
5 DISCRETE TRANSITION Author keyword 1 50% 1% 1
6 IMPURITY INDUCED LAYER DISORDERING Author keyword 1 50% 1% 1
7 POWER SEMICOND DEVICE WORKS Address 1 50% 1% 1
8 SCH LASER Author keyword 1 50% 1% 1
9 SEPARATE CONFINEMENT HETEROSTRUCTURES Author keyword 1 50% 1% 1
10 STIMULATED RECOMBINATION Author keyword 1 50% 1% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 CURRENT VOLTAGE CHARACTERISTICS 1 50% 2% 2 Search CURRENT+++VOLTAGE+CHARACTERISTICS Search CURRENT+++VOLTAGE+CHARACTERISTICS
2 2DEG DENSITY 1 50% 1% 1 Search 2DEG+DENSITY Search 2DEG+DENSITY
3 AU EVAPORATION 1 50% 1% 1 Search AU+EVAPORATION Search AU+EVAPORATION
4 DISCRETE TRANSITION 1 50% 1% 1 Search DISCRETE+TRANSITION Search DISCRETE+TRANSITION
5 IMPURITY INDUCED LAYER DISORDERING 1 50% 1% 1 Search IMPURITY+INDUCED+LAYER+DISORDERING Search IMPURITY+INDUCED+LAYER+DISORDERING
6 SCH LASER 1 50% 1% 1 Search SCH+LASER Search SCH+LASER
7 SEPARATE CONFINEMENT HETEROSTRUCTURES 1 50% 1% 1 Search SEPARATE+CONFINEMENT+HETEROSTRUCTURES Search SEPARATE+CONFINEMENT+HETEROSTRUCTURES
8 STIMULATED RECOMBINATION 1 50% 1% 1 Search STIMULATED+RECOMBINATION Search STIMULATED+RECOMBINATION
9 SURFACE CARRIERS 1 50% 1% 1 Search SURFACE+CARRIERS Search SURFACE+CARRIERS
10 SWITCHING CONDITION 1 50% 1% 1 Search SWITCHING+CONDITION Search SWITCHING+CONDITION

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 ACQUIRING BIOLOGICAL SIGNALS 1 50% 1% 1
2 GAAS DIODE LASERS 1 50% 1% 1
3 DYE SOLUTION LASER 0 33% 1% 1
4 MODE FIBER LASERS 0 20% 1% 1
5 JUNCTION LASERS 0 17% 1% 1
6 M OMEGA CM2 0 17% 1% 1
7 CARRIERS CONCENTRATION 0 100% 1% 1
8 GAAS INJECTION LASERS 0 100% 1% 1
9 PHOTOELECTRIC CONVERTERS 0 100% 1% 1
10 STATE OPTICAL MASER 0 100% 1% 1

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Fluorescence microscopy: Established and emerging methods, experimental strategies, and applications in immunology 2007 32 89 3%
Nobel Lecture: The double heterostructure concept and its applications in physics, electronics, and technology 2001 111 24 4%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 CPD SEMICOND MICROELECT 1 50% 1.0% 1
2 POWER SEMICOND DEVICE WORKS 1 50% 1.0% 1
3 MOSCOW POWER ENGN MEI 0 25% 1.0% 1
4 ELEKTROTECH FAK 0 17% 1.0% 1
5 EPFL SB DO 0 100% 1.0% 1
6 IMAGING CAMERAS 0 100% 1.0% 1
7 LASHKAR SEMICOND PHYS 0 100% 1.0% 1
8 MAT ELECT TECH 0 100% 1.0% 1
9 TECHNOL MET FAK 0 100% 1.0% 1
10 US W COAST 0 100% 1.0% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000193672 TRANSISTOR LASER//TRANSISTOR LASER TL//MICRONANOSYST TECHNOL
2 0.0000104851 SEDIMENT MECHANICS//BURROWING MECHANICS//CIRRIFORMIA MOOREI
3 0.0000094522 SCI PROD STATE ENTERPRISE//GRADED GAP ALXGA1 XAS STRUCTURES//GAAS RADIATION DETECTOR
4 0.0000082132 SURFACE AND INTERFACE PHENOMENA//TELECOMMUN ADVANCEMENTS ORG//SENDAI
5 0.0000072898 COLLISION BROADENING COEFFICIENTS//INTENSITY STABILITY//UP A CNRS D1434
6 0.0000071630 METAL SEMICONDUCTOR METAL MSM//ULTRAVIOLET UV DETECTOR//PHOTODETECTORS PDS
7 0.0000071000 CUCRS2//ELECTRICAL AND THERMAL CONDUCTION IN CRYSTALLINE METALS AND ALLOYS//AGCRS2
8 0.0000070817 SECT PHYS PL//KHERSON BRANCH//CARRIERS CAPTURE
9 0.0000069414 NANOMAGNETS SCATTERING AMPLITUDE//SOLUTIONS OF WAVE EQUATIONS BOUND STATES//INVEST FIS MAR DEL PLATA CONICET UNMDP
10 0.0000067578 CATASTROPHIC OPTICAL DEGRADATION//THYRISTOR HETEROSTRUCTURE//OPTOELECT TECHNOL DEV