Class information for:
Level 1: SELECTIVE REMOVAL OF ATOMS//MACROPOROUS CHAR//COMPOSITE ION BEAM IRRADIATION

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
32535 107 16.9 51%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
2372 3849 VACUUM ARC//CATHODE SPOT//VACUUM ARCS

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 SELECTIVE REMOVAL OF ATOMS Author keyword 3 100% 3% 3
2 MACROPOROUS CHAR Author keyword 1 100% 2% 2
3 COMPOSITE ION BEAM IRRADIATION Author keyword 1 50% 1% 1
4 SELECTIVE ATTACHMENT OF ATOMS Author keyword 1 50% 1% 1
5 SURFACE RESISITIVITY Author keyword 1 50% 1% 1
6 ALUMINA CERAMIC BALL Author keyword 0 33% 1% 1
7 STATIC LEACHING Author keyword 0 33% 1% 1
8 CONDUCTING CERAMIC Author keyword 0 25% 1% 1
9 LASER PROCESSING OF MATERIALS Author keyword 0 25% 1% 1
10 TETRAISOPROPYL TITANATE Author keyword 0 25% 1% 1

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
LCSH search Wikipedia search
1 SELECTIVE REMOVAL OF ATOMS 3 100% 3% 3 Search SELECTIVE+REMOVAL+OF+ATOMS Search SELECTIVE+REMOVAL+OF+ATOMS
2 MACROPOROUS CHAR 1 100% 2% 2 Search MACROPOROUS+CHAR Search MACROPOROUS+CHAR
3 COMPOSITE ION BEAM IRRADIATION 1 50% 1% 1 Search COMPOSITE+ION+BEAM+IRRADIATION Search COMPOSITE+ION+BEAM+IRRADIATION
4 SELECTIVE ATTACHMENT OF ATOMS 1 50% 1% 1 Search SELECTIVE+ATTACHMENT+OF+ATOMS Search SELECTIVE+ATTACHMENT+OF+ATOMS
5 SURFACE RESISITIVITY 1 50% 1% 1 Search SURFACE+RESISITIVITY Search SURFACE+RESISITIVITY
6 ALUMINA CERAMIC BALL 0 33% 1% 1 Search ALUMINA+CERAMIC+BALL Search ALUMINA+CERAMIC+BALL
7 STATIC LEACHING 0 33% 1% 1 Search STATIC+LEACHING Search STATIC+LEACHING
8 CONDUCTING CERAMIC 0 25% 1% 1 Search CONDUCTING+CERAMIC Search CONDUCTING+CERAMIC
9 LASER PROCESSING OF MATERIALS 0 25% 1% 1 Search LASER+PROCESSING+OF+MATERIALS Search LASER+PROCESSING+OF+MATERIALS
10 TETRAISOPROPYL TITANATE 0 25% 1% 1 Search TETRAISOPROPYL+TITANATE Search TETRAISOPROPYL+TITANATE

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ. in
class
1 REVERSE BURN GASIFICATION 6 80% 4% 4
2 CHEMCHAR PROCESS 4 67% 4% 4
3 MIXED WASTES 3 57% 4% 4
4 DYNAMIC COMPOSITION CHANGES 3 25% 10% 11
5 FILTERED VACUUM ARC 2 38% 5% 5
6 TRIDYN 2 22% 7% 8
7 PMMA MATRIX 1 50% 1% 1
8 VOX MIXED OXIDES 0 33% 1% 1
9 MCM 48 MESOPOROUS SILICA 0 25% 1% 1
10 PERCOLATION PHENOMENA 0 13% 2% 2

Journals

Reviews



Title Publ. year Cit. Active
references
% act. ref.
to same field
Physical mechanisms underlying the selective removal of atoms 2009 4 6 83%
Ion beam control of electrical, magnetic, and optical material properties 2001 4 11 27%

Address terms



Rank Address term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 CANADIAN PHOTON FABRICAT 0 17% 0.9% 1
2 RARAF 0 13% 0.9% 1
3 CIENCIAS QUIMICAS FARMACEUTICAS ALIMENTOS 0 100% 0.9% 1

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000084923 VACUUM ARC//CATHODE SPOT//VACUUM ARCS
2 0.0000079741 FYS EIKUNDE POLYMEREN//BURNT SMELL//CEMENT INDUSTRY EMISSIONS
3 0.0000079666 DISTORTED PEROVSKITE STRUCTURE//K2MOO4//ORTHORHOMBIC STRUCTURE
4 0.0000068292 INNOVAT MED ENGN//DENGUE VIRUS DETECTION//MSOT
5 0.0000067550 FUSED HOLLOW CATHODE//HOLLOW CATHODE//PLASMA GRP
6 0.0000067550 SLUDGE CHAR//LOW TEMPERATURE CONVERSION//CIENCIA TECNOL MEDIO AMBIENTE
7 0.0000064272 ELECTRICAL POLARIZATION//ELECTROVECTOR EFFECT//ORTHOPED MED MAT SCI
8 0.0000051405 THIN FILM CONDUCTOR//EDWIN C JAHN//SEMIPENETRABLE MODEL
9 0.0000049187 HIGH RESOLUTION X RAY MICROSCOPY//INNER SHELL ELECTRON EXCITATION//INTENSE X RAYS
10 0.0000048417 ION CUT//SURFACE BLISTERING//SMART CUT