Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
32406 | 108 | 15.3 | 33% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
3288 | 1387 | THIN SPRAY ON LINER//BRILLOUIN SCATTERING SPECTROSCOPY//ELECTRONIC RADIATION |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | ELECTRONIC RADIATION | Author keyword | 2 | 67% | 2% | 2 |
2 | RUMENTAT MESU | Address | 0 | 13% | 3% | 3 |
3 | CROSS SECTIONAL SEM | Author keyword | 0 | 25% | 1% | 1 |
4 | ATOMIC SCALE SIMULATION | Author keyword | 0 | 13% | 2% | 2 |
5 | SPACE GEOMETRY | Author keyword | 0 | 20% | 1% | 1 |
6 | SELF INTERSTITIAL ATOMS | Author keyword | 0 | 14% | 1% | 1 |
7 | ELECTRON CHANNELING EFFECT | Author keyword | 0 | 100% | 1% | 1 |
8 | ENGN PL SCI PL PHYS GRP | Address | 0 | 100% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | ELECTRONIC RADIATION | 2 | 67% | 2% | 2 | Search ELECTRONIC+RADIATION | Search ELECTRONIC+RADIATION |
2 | CROSS SECTIONAL SEM | 0 | 25% | 1% | 1 | Search CROSS+SECTIONAL+SEM | Search CROSS+SECTIONAL+SEM |
3 | ATOMIC SCALE SIMULATION | 0 | 13% | 2% | 2 | Search ATOMIC+SCALE+SIMULATION | Search ATOMIC+SCALE+SIMULATION |
4 | SPACE GEOMETRY | 0 | 20% | 1% | 1 | Search SPACE+GEOMETRY | Search SPACE+GEOMETRY |
5 | SELF INTERSTITIAL ATOMS | 0 | 14% | 1% | 1 | Search SELF+INTERSTITIAL+ATOMS | Search SELF+INTERSTITIAL+ATOMS |
6 | ELECTRON CHANNELING EFFECT | 0 | 100% | 1% | 1 | Search ELECTRON+CHANNELING+EFFECT | Search ELECTRON+CHANNELING+EFFECT |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | CD02HG08TE | 1 | 40% | 2% | 2 |
2 | SLOW RELAXATION PHENOMENA | 0 | 17% | 1% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
On the oxidation of CaF2 in transmission electron microscope | 2012 | 0 | 28 | 11% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | RUMENTAT MESU | 0 | 13% | 2.8% | 3 |
2 | ENGN PL SCI PL PHYS GRP | 0 | 100% | 0.9% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000260264 | AS IMPURITY//CONDUCTING POLYMER BLENDS//GROUND WATER TREATMENT |
2 | 0.0000217782 | INDIUM PHOSPHIDE100//INTERACTION IONS MATTER//SIMULATION METHOD TRIM |
3 | 0.0000168283 | PODOLSK BRANCH//TUNGSTEN ATOMS//PENTAGONAL CRYSTALS |
4 | 0.0000155522 | ION BEAM THINNING//MAT SCI PROD TECHNOL//TECHNOL PLANNING CENT ELECT S |
5 | 0.0000138599 | HIGH RESOLUTION X RAY MICROSCOPY//INNER SHELL ELECTRON EXCITATION//INTENSE X RAYS |
6 | 0.0000124942 | NANOPYRAMID ARRAY//DOPANT ION IMPLANTATION//FIS SUPERFICIES INTER ES |
7 | 0.0000083794 | CNRS PHYS SOLIDES//INVEST ESTUDIOS AVANZADOS FIS//PHYS CHIM COMMISSARIAT ENERGIE ATOM |
8 | 0.0000077850 | HEAVY B DOPING//CONCEPTS DISPOSITIFS PHOTON//UMR 6630 |
9 | 0.0000073050 | TRANSIENT ENHANCED DIFFUSION//SWAMP//PAIR DIFFUSION MODEL |
10 | 0.0000070659 | HGCDTE//CERDEC NIGHT VIS ELECT SENSORS DIRECTORATE//MICROPHYS |