Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
32347 | 109 | 18.1 | 42% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
3348 | 1252 | ZHURNAL NAUCHNOI I PRIKLADNOI FOTOGRAFII//UNIV BEREICH STADTMITTE//MICROELECT SEMICOND |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | UNIV BEREICH STADTMITTE | Address | 6 | 100% | 4% | 4 |
2 | MICROELECT SEMICOND | Address | 4 | 75% | 3% | 3 |
3 | DEBRIS PARTICLES | Author keyword | 2 | 44% | 4% | 4 |
4 | DEBRIS PARTICLE | Author keyword | 2 | 67% | 2% | 2 |
5 | REAL TIME DOSE MONITORING | Author keyword | 2 | 67% | 2% | 2 |
6 | SCATTERING OF PARTICLES | Author keyword | 2 | 67% | 2% | 2 |
7 | THIN AND THICK FILMS | Author keyword | 2 | 50% | 3% | 3 |
8 | ENERGY OF TRANSFER | Author keyword | 1 | 100% | 2% | 2 |
9 | RUBEZHANSK BRANCH | Address | 1 | 100% | 2% | 2 |
10 | TELLURIUM DIOXIDE | Author keyword | 1 | 16% | 6% | 6 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | TELLURIUM DIOXIDE | 1 | 25% | 2% | 2 |
2 | ABRASIVE PROPERTIES | 0 | 33% | 1% | 1 |
3 | TIO2 PHOTOCATALYTIC REDUCTION | 0 | 33% | 1% | 1 |
4 | VISIBLE LIGHT DEGRADATION | 0 | 33% | 1% | 1 |
5 | MEDIUM INTENSITY AURORA | 0 | 20% | 1% | 1 |
6 | POLARITY IDENTIFICATION | 0 | 20% | 1% | 1 |
7 | SURFACE DEFECT | 0 | 11% | 1% | 1 |
8 | AG PARTICLES | 0 | 10% | 1% | 1 |
9 | EXOELECTRON ANALYSIS | 0 | 100% | 1% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Response of metal oxide thin film structures to radiation | 2006 | 16 | 23 | 35% |
Influence of the surface state of inorganic scintillation materials on their performance characteristics (review) | 2011 | 1 | 35 | 31% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | UNIV BEREICH STADTMITTE | 6 | 100% | 3.7% | 4 |
2 | MICROELECT SEMICOND | 4 | 75% | 2.8% | 3 |
3 | RUBEZHANSK BRANCH | 1 | 100% | 1.8% | 2 |
4 | RADIAT BEAMS MAT MODIFICAT | 1 | 50% | 0.9% | 1 |
5 | RUBEZHANSK | 1 | 50% | 0.9% | 1 |
6 | BIOMED ENGN MICROTECHNOL | 0 | 33% | 0.9% | 1 |
7 | BIOMED ENGN NANOTECHNOL | 0 | 15% | 1.8% | 2 |
8 | RUBEZHNOE BRANCH | 0 | 14% | 1.8% | 2 |
9 | CHEM HIGH PUR MAT | 0 | 25% | 0.9% | 1 |
10 | MAT PROC CHARACTERIZAT S | 0 | 25% | 0.9% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000125372 | TELLURITE GLASSES//TELLURIUM OXIDE//TELLURITES |
2 | 0.0000107533 | GENIE URBAIN ENVIRONM//COMPUTERISING//OXYNITRIDE FILMS |
3 | 0.0000086009 | LOMO//OFF AXIS ASPHERICAL MIRROR//HYDROGEN PROFILING |
4 | 0.0000081432 | FRUMKIN PHYS ELE OCHEM//POLYCRISTALLINE//RUTHENIUM TITANIUM OXIDE ELECTRODE |
5 | 0.0000078727 | MULTI ENERGY RADIOGRAPHY//SCINTILLAT MAT SCI TECHNOL CONCERN//DUAL ENERGY METHOD |
6 | 0.0000070365 | AG CLUSTER FILM//METAL ISLANDS FILMS//ILLUMINATION SENSORS |
7 | 0.0000062142 | RADFET//IMPLANTABLE DOSIMETER//DEVICE PHYS MICROELECT |
8 | 0.0000061235 | LEHRSTUHL MAT VERBUNDE//CHAIR MULTICOMPONENT MAT//BULK AND SURFACE DIFFUSION |
9 | 0.0000060044 | CHEMICURRENT//CATALYTIC NANODIODE//EEWS WCU NANOCENTURY KI |
10 | 0.0000056812 | PHOSPHATIDIC ACIDS//THERMOSOL DYEING//BARRE |