Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 32276 | 110 | 12.3 | 48% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 3367 | 1217 | AC SURFACE PHOTOVOLTAGE//ELECTRON WORK FUNCTION//SUPERCONDUCTIVITY MECHANISM |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | EDUC SCANNING PROBE MICROSCOPY | Address | 3 | 50% | 4% | 4 |
| 2 | LOBACHEVSKY PHYS TECH | Address | 1 | 50% | 1% | 1 |
| 3 | PHOTOELECTRIC SPECTROSCOPY | Author keyword | 1 | 50% | 1% | 1 |
| 4 | PHYS SOLID STATE NANOSTRUCT EDUC | Address | 1 | 50% | 1% | 1 |
| 5 | QUANTUM MOLECULES | Author keyword | 1 | 50% | 1% | 1 |
| 6 | DISSIPATIVE TUNNELING | Author keyword | 1 | 25% | 2% | 2 |
| 7 | SCI TECH SINGLE CRYSTALS | Address | 0 | 33% | 1% | 1 |
| 8 | AVERAGE BINDING ENERGY | Author keyword | 0 | 25% | 1% | 1 |
| 9 | 2D BIFURCATIONS | Author keyword | 0 | 100% | 1% | 1 |
| 10 | ADDITIONAL ELECTRIC FIELD | Author keyword | 0 | 100% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | N GAAS SURFACE | 1 | 100% | 2% | 2 |
| 2 | ACTIVE AG FILMS | 0 | 20% | 1% | 1 |
| 3 | EPITAXIAL N GAAS | 0 | 20% | 1% | 1 |
| 4 | TRAPPING PROPERTIES | 0 | 10% | 1% | 1 |
| 5 | SOL GEL SILICATES | 0 | 100% | 1% | 1 |
Journals |
Reviews |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | EDUC SCANNING PROBE MICROSCOPY | 3 | 50% | 3.6% | 4 |
| 2 | LOBACHEVSKY PHYS TECH | 1 | 50% | 0.9% | 1 |
| 3 | PHYS SOLID STATE NANOSTRUCT EDUC | 1 | 50% | 0.9% | 1 |
| 4 | SCI TECH SINGLE CRYSTALS | 0 | 33% | 0.9% | 1 |
| 5 | PHYSIOTECH SCI | 0 | 100% | 0.9% | 1 |
| 6 | SCI SEMICOND DEVICES | 0 | 100% | 0.9% | 1 |
| 7 | ZAVOISKY PHYS TECHNOL | 0 | 100% | 0.9% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000161502 | HIGHLY DISPERSED FERROMAGNETICS//PULSE PROC TECHNOL//LOW ENERGY DEUTERIUM INCIDENCE |
| 2 | 0.0000159875 | AC SURFACE PHOTOVOLTAGE//SCANNING PHOTON MICROSCOPE//METAL AIR INSULATOR SEMICONDUCTOR |
| 3 | 0.0000134809 | CONFOCAL SYSTEMS//MICROWAVE PHOTOCONDUCTIVITY//MIS SWITCHING DEVICES |
| 4 | 0.0000105288 | SULFUR PASSIVATION//PHOSPHIDIZATION//PHOSPHINE PLASMA |
| 5 | 0.0000077821 | ANAL SEMICOND NANOSTRUCT//QUANTUM DOT INFRARED PHOTODETECTOR QDIP//QUANTUM DOT INFRARED PHOTODETECTOR |
| 6 | 0.0000075655 | GENERAL SYSTEM LOGICAL THEORY//MORPHIC NETWORK//UNIT IND AUTOMAT |
| 7 | 0.0000066641 | UNITE CHIM PHYS HAUTS POLYME POLY//ABORAT INNOVAT LOW DIMENS NANOMAT OPTOE//PHONON ASSISTED TUNNELING |
| 8 | 0.0000066491 | NANOMETER SIZED SCHOTTKY CONTACT//METAL DOT ARRAY//NANO DIODE |
| 9 | 0.0000063131 | SELF ORGANIZING PROCESSES//SELF ORGANIZING EFFECTS//PLATEFORME RIO BIBS |
| 10 | 0.0000062185 | SERIES RESISTANCE//BARRIER INHOMOGENEITY//IDEALITY FACTOR |