Class information for:
Level 1: APPLICATION SPECIFIC PROCESSOR ARRAYS//BEAM CONVERGENCE//INDEX TRANSFORMATIONS

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
32267 110 14.7 27%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
803 11388 ULTRAMICROSCOPY//MICROSCOPY//ELECTRON HOLOGRAPHY

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 APPLICATION SPECIFIC PROCESSOR ARRAYS Author keyword 1 50% 1% 1
2 BEAM CONVERGENCE Author keyword 1 50% 1% 1
3 INDEX TRANSFORMATIONS Author keyword 1 50% 1% 1
4 PSEUDO SYMMETRIC CRYSTALS Author keyword 1 50% 1% 1
5 SPACE TIME MAPPINGS Author keyword 1 50% 1% 1
6 WEAK BEAM TECHNIQUE Author keyword 1 50% 1% 1
7 WEAK BEAM IMAGING Author keyword 1 22% 2% 2
8 ANAT SERV Address 0 25% 1% 1
9 ELECTRON CHANNELLING Author keyword 0 13% 2% 2
10 VLSI SIGNAL PROCESSING Author keyword 0 11% 1% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 APPLICATION SPECIFIC PROCESSOR ARRAYS 1 50% 1% 1 Search APPLICATION+SPECIFIC+PROCESSOR+ARRAYS Search APPLICATION+SPECIFIC+PROCESSOR+ARRAYS
2 BEAM CONVERGENCE 1 50% 1% 1 Search BEAM+CONVERGENCE Search BEAM+CONVERGENCE
3 INDEX TRANSFORMATIONS 1 50% 1% 1 Search INDEX+TRANSFORMATIONS Search INDEX+TRANSFORMATIONS
4 PSEUDO SYMMETRIC CRYSTALS 1 50% 1% 1 Search PSEUDO+SYMMETRIC+CRYSTALS Search PSEUDO+SYMMETRIC+CRYSTALS
5 SPACE TIME MAPPINGS 1 50% 1% 1 Search SPACE+TIME+MAPPINGS Search SPACE+TIME+MAPPINGS
6 WEAK BEAM TECHNIQUE 1 50% 1% 1 Search WEAK+BEAM+TECHNIQUE Search WEAK+BEAM+TECHNIQUE
7 WEAK BEAM IMAGING 1 22% 2% 2 Search WEAK+BEAM+IMAGING Search WEAK+BEAM+IMAGING
8 ELECTRON CHANNELLING 0 13% 2% 2 Search ELECTRON+CHANNELLING Search ELECTRON+CHANNELLING
9 VLSI SIGNAL PROCESSING 0 11% 1% 1 Search VLSI+SIGNAL+PROCESSING Search VLSI+SIGNAL+PROCESSING
10 ALPHA FRINGES 0 100% 1% 1 Search ALPHA+FRINGES Search ALPHA+FRINGES

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 NON COLUMN 1 100% 2% 2
2 TWIN BOUNDARY CONTRAST 1 100% 2% 2
3 WEAK BEAM CONTRAST 1 50% 1% 1
4 UNIFORM MATRIX CAVITATION 0 25% 1% 1
5 ZONE AXIS INCIDENCE 0 25% 1% 1
6 EXELFS MODULATIONS 0 100% 1% 1
7 NON SYMMETRICAL LAUE 0 100% 1% 1
8 UNIDIRECTIONALLY SOLIDIFIED COMPOSITE 0 100% 1% 1

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
The kinematic theory of scattering by stacking faults with supplementary atomic displacements 1997 0 7 100%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 ANAT SERV 0 25% 0.9% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000168978 REG PHYSICOCHEM ANAL//DOUBLE DIFFRACTION//TRANSMISSION REFLECTION AND SCANNING ELECTRON MICROSCOPY INCLUDING EBIC MECHANICAL PROPERTIES OF SOLIDS
2 0.0000124072 EMCD//ELECTRON MAGNETIC CIRCULAR DICHROISM//INELASTIC ELECTRON SCATTERING THEORY
3 0.0000112101 APERTURE ABERRATION//CORE LENS//CURVED OPTIC AXIS
4 0.0000107888 ANAL STRUCT MAT//UNITE RECH PHYS SOLIDE//TECHNOL SILICIUM
5 0.0000095783 ION BEAM THINNING//MAT SCI PROD TECHNOL//TECHNOL PLANNING CENT ELECT S
6 0.0000093410 ULTRAMICROSCOPY//ABERRATION CORRECTION//DEPTH SECTIONING
7 0.0000073932 TRANSPASSIVE CORROSION//TRANSPASSIVE//SERV CORROS ELE OCHIM CHIM FLUIDES
8 0.0000071616 EFTEM//ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPY EFTEM//SPECTRUM IMAGING
9 0.0000064009 PODOLSK BRANCH//TUNGSTEN ATOMS//PENTAGONAL CRYSTALS
10 0.0000054016 CNRS PHYS SOLIDES//INVEST ESTUDIOS AVANZADOS FIS//PHYS CHIM COMMISSARIAT ENERGIE ATOM