Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 32256 | 111 | 17.3 | 56% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 178 | 21135 | INTEGRATED FERROELECTRICS//FERROELECTRIC THIN FILMS//PZT |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | RADIATION INDUCED CHARGES | Author keyword | 9 | 83% | 5% | 5 |
| 2 | AF IOFFE PTI | Address | 3 | 100% | 3% | 3 |
| 3 | RETAINED POLARIZATION | Author keyword | 3 | 100% | 3% | 3 |
| 4 | OPTICAL DEFLECTOR | Author keyword | 1 | 27% | 4% | 4 |
| 5 | ELECTROOPTIC CERAMICS | Author keyword | 1 | 40% | 2% | 2 |
| 6 | XINJIANG PHYS | Address | 1 | 21% | 4% | 4 |
| 7 | ACCELERATE AGEING | Author keyword | 1 | 50% | 1% | 1 |
| 8 | ANNEALING CHARACTERISTICS | Author keyword | 1 | 50% | 1% | 1 |
| 9 | ANTIFERROELECTRIC PZ THIN FILMS | Author keyword | 1 | 50% | 1% | 1 |
| 10 | COERCITIVE FIELD | Author keyword | 1 | 50% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | FERROELECTRIC PZT CAPACITORS | 8 | 75% | 5% | 6 |
| 2 | PZT CAPACITORS | 7 | 53% | 8% | 9 |
| 3 | PZT TYPE CERAMICS | 1 | 50% | 2% | 2 |
| 4 | FERROELECTRIC NONVOLATILE MEMORIES | 1 | 50% | 1% | 1 |
| 5 | FERROELECTRIC PZT | 1 | 50% | 1% | 1 |
| 6 | FLUORESCEIN SODIUM SALT | 1 | 50% | 1% | 1 |
| 7 | RESISTOR TEST STRUCTURES | 0 | 10% | 1% | 1 |
| 8 | AU PBTIO3 YBA2CU3O7 DELTA | 0 | 100% | 1% | 1 |
| 9 | CONDUCTIVITY ANALYSIS | 0 | 100% | 1% | 1 |
| 10 | THICK FILM PZT | 0 | 100% | 1% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| The electrical conductivity and dielectric properties of CI Basic Violet 10 | 2010 | 12 | 27 | 15% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | AF IOFFE PTI | 3 | 100% | 2.7% | 3 |
| 2 | XINJIANG PHYS | 1 | 21% | 3.6% | 4 |
| 3 | ELECT MICROSCOPY THIN FILM | 1 | 50% | 0.9% | 1 |
| 4 | NUCL FUS TECHNOL DEV | 1 | 50% | 0.9% | 1 |
| 5 | CERAM MAT TRIBOL | 0 | 25% | 0.9% | 1 |
| 6 | SOLID STATE MICROSTRUCT MAT SCI ENGN | 0 | 25% | 0.9% | 1 |
| 7 | ADV POWER SOURCES RD | 0 | 20% | 0.9% | 1 |
| 8 | ASIC RD | 0 | 11% | 1.8% | 2 |
| 9 | ELECT OPT NANOMAT | 0 | 17% | 0.9% | 1 |
| 10 | MEMORY DEVICE BUSINESS | 0 | 14% | 0.9% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000154842 | BOLOMETRY CAMERA//HIGH TEMP PLASMA PHYS//ECRH TEAM |
| 2 | 0.0000149856 | ELECTRO DEPOSIT//NI BI//ELECTRODEPOSIT |
| 3 | 0.0000147077 | PZT//PZT THIN FILMS//INTEGRATED FERROELECTRICS |
| 4 | 0.0000122208 | SINGLE EVENT BURNOUT SEB//SINGLE EVENT GATE RUPTURE SEGR//RREACT GRP |
| 5 | 0.0000119343 | DOMAIN SWITCHING//CERAM MECH ENGN//FERROELECTRIC CERAMICS |
| 6 | 0.0000099052 | MFIS//FERROELECTRIC GATE FET//MFIS STRUCTURE |
| 7 | 0.0000097709 | INFRARED EFFECTIVENESS//FIS QUIM MAT//MICROPOROUS ZEOLITE |
| 8 | 0.0000090689 | CROSS BRIDGE KELVIN RESISTOR CBKR//CROSS KELVIN RESISTOR CKR//CROSS BRIDGE KELVIN RESISTOR |
| 9 | 0.0000089766 | FISSION CHAMBERS//SPEX//SPEX LDCI |
| 10 | 0.0000081201 | LEAD ZIRCONATE//PBHFO3//ANTIFERROELECTRICS |