Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 32172 | 112 | 26.6 | 68% |
Classes in level above (level 2) |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | CHARGED NANOPARTICLES | Address | 6 | 35% | 13% | 15 |
| 2 | SASAKI TEAM | Address | 5 | 60% | 5% | 6 |
| 3 | MICROSTRUCT SCI MAT | Address | 2 | 12% | 15% | 17 |
| 4 | DIFFRACTED X RAY TRACKING | Author keyword | 2 | 67% | 2% | 2 |
| 5 | CHARGED CLUSTER | Author keyword | 2 | 50% | 3% | 3 |
| 6 | C T SASAKI TEAM | Address | 2 | 43% | 3% | 3 |
| 7 | SECONDARY DEPOSITION | Author keyword | 1 | 50% | 2% | 2 |
| 8 | SUNGKYUN ADV NANO SCI TECHNOL SAINT | Address | 1 | 100% | 2% | 2 |
| 9 | CHARGED CLUSTERS | Author keyword | 1 | 24% | 4% | 5 |
| 10 | MARINE ENERGY CONVERGENCE INTEGRAT | Address | 1 | 40% | 2% | 2 |
Web of Science journal categories |
Author Key Words |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
|---|---|---|---|---|---|---|---|
| 1 | DIFFRACTED X RAY TRACKING | 2 | 67% | 2% | 2 | Search DIFFRACTED+X+RAY+TRACKING | Search DIFFRACTED+X+RAY+TRACKING |
| 2 | CHARGED CLUSTER | 2 | 50% | 3% | 3 | Search CHARGED+CLUSTER | Search CHARGED+CLUSTER |
| 3 | SECONDARY DEPOSITION | 1 | 50% | 2% | 2 | Search SECONDARY+DEPOSITION | Search SECONDARY+DEPOSITION |
| 4 | CHARGED CLUSTERS | 1 | 24% | 4% | 5 | Search CHARGED+CLUSTERS | Search CHARGED+CLUSTERS |
| 5 | BIASED VOLTAGE | 1 | 50% | 1% | 1 | Search BIASED+VOLTAGE | Search BIASED+VOLTAGE |
| 6 | CHARGED CLUSTER MODEL | 1 | 50% | 1% | 1 | Search CHARGED+CLUSTER+MODEL | Search CHARGED+CLUSTER+MODEL |
| 7 | DEGREE OF EPITAXY | 1 | 50% | 1% | 1 | Search DEGREE+OF+EPITAXY | Search DEGREE+OF+EPITAXY |
| 8 | GALLIUM ARSENIDE WAFER | 1 | 50% | 1% | 1 | Search GALLIUM+ARSENIDE+WAFER | Search GALLIUM+ARSENIDE+WAFER |
| 9 | LAUE DIFFRACTOMETRY | 1 | 50% | 1% | 1 | Search LAUE+DIFFRACTOMETRY | Search LAUE+DIFFRACTOMETRY |
| 10 | MYOSIN MOLECULES | 1 | 50% | 1% | 1 | Search MYOSIN+MOLECULES | Search MYOSIN+MOLECULES |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | LOW PRESSURE SYNTHESIS | 14 | 48% | 20% | 22 |
| 2 | ELECTRIC BIAS | 8 | 75% | 5% | 6 |
| 3 | DIAMOND CVD PROCESS | 8 | 100% | 4% | 5 |
| 4 | CVD PROCESS | 6 | 36% | 13% | 14 |
| 5 | CVD RESEARCH | 5 | 50% | 6% | 7 |
| 6 | SINGLE MOLECULAR DETECTION | 2 | 67% | 2% | 2 |
| 7 | CHARGED CLUSTER MODEL | 1 | 30% | 3% | 3 |
| 8 | PLASMA FLASH EVAPORATION | 1 | 30% | 3% | 3 |
| 9 | CHARGED CLUSTERS | 1 | 21% | 4% | 4 |
| 10 | GAS PHASE NUCLEATION | 1 | 16% | 4% | 5 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references | % act. ref. to same field |
|---|---|---|---|---|
| Charged clusters in thin film growth | 2004 | 49 | 71 | 32% |
| Charged nanoparticles in thin film and nanostructure growth by chemical vapour deposition | 2010 | 7 | 205 | 17% |
| DYNAMICAL SINGLE-MOLECULE OBSERVATIONS OF MEMBRANE PROTEIN USING HIGH-ENERGY PROBES | 2012 | 0 | 8 | 38% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | CHARGED NANOPARTICLES | 6 | 35% | 13% | 15 |
| 2 | SASAKI TEAM | 5 | 60% | 5.4% | 6 |
| 3 | MICROSTRUCT SCI MAT | 2 | 12% | 15% | 17 |
| 4 | C T SASAKI TEAM | 2 | 43% | 2.7% | 3 |
| 5 | SUNGKYUN ADV NANO SCI TECHNOL SAINT | 1 | 100% | 1.8% | 2 |
| 6 | MARINE ENERGY CONVERGENCE INTEGRAT | 1 | 40% | 1.8% | 2 |
| 7 | MICROSTRUCT SCI GRP | 1 | 50% | 0.9% | 1 |
| 8 | PHYS D4 | 1 | 50% | 0.9% | 1 |
| 9 | CREAT INITIAT MICROSTRUCT SCI MAT | 1 | 22% | 1.8% | 2 |
| 10 | PHYS CHEM DIELECT MAT | 0 | 20% | 1.8% | 2 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000149835 | BOROPHOSPHOSILICATE GLASS BPSG//ATMOSPHERIC PRESSURE CVD//BPSG |
| 2 | 0.0000143188 | MICROCRYSTALLINE SILICON//SID PHYS DEVICES//MU C SI H |
| 3 | 0.0000118426 | DIAMOND AND RELATED MATERIALS//BIAS ENHANCED NUCLEATION//DIAMOND FILM |
| 4 | 0.0000114473 | PNCA//CATALYTIC PROBE//F4 |
| 5 | 0.0000111975 | QUANTUM SCI GRP//AVADH BHATIA PHYS//GARCIA MRSEC POLYMERS ENGINEERED INTER ES |
| 6 | 0.0000106490 | BURYAT SCI//BURYAT//PHYS PROBLEMS |
| 7 | 0.0000101015 | DUST PARTICLE GROWTH//CNRS LPICM//PARTICLE CHARGE DISTRIBUTION |
| 8 | 0.0000095063 | ATOMIC LAYER DOPING//SI EPITAXIAL GROWTH//GERMANIUM SILICON COMPOUNDS |
| 9 | 0.0000075237 | METASTABLE STATE RELAXATION//BODY ENERGY CONTENT//IR AND UV VIS NIR SPECTROSCOPY |
| 10 | 0.0000074735 | THETA PHASE//STEPPED STRUCTURE//CRYSTALLINE AMORPHOUS TRANSITION |