Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
31376 | 123 | 16.5 | 18% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
1528 | 6892 | CD1 XMNXTE//THIN FILM PHYS GRP//LEAD TELLURIDE |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | BI SB SOLID SOLUTIONS | Author keyword | 1 | 50% | 1% | 1 |
2 | QUENCH DEPOSITED FILM | Author keyword | 1 | 50% | 1% | 1 |
3 | VARIABLE VALENCE | Author keyword | 1 | 50% | 1% | 1 |
4 | DEGENERATE SEMICONDUCTOR | Author keyword | 1 | 19% | 2% | 3 |
5 | KHARKOV POLYTECHN | Address | 1 | 25% | 2% | 2 |
6 | SNTE | Author keyword | 1 | 13% | 3% | 4 |
7 | DIRECT RECOMBINATION | Author keyword | 0 | 25% | 1% | 1 |
8 | NON STOICHIOMETRIC DEFECTS | Author keyword | 0 | 17% | 1% | 1 |
9 | AGGREGATION PATTERNS | Author keyword | 0 | 13% | 1% | 1 |
10 | IMPURITY DEFECTS | Author keyword | 0 | 13% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | BI SB SOLID SOLUTIONS | 1 | 50% | 1% | 1 | Search BI+SB+SOLID+SOLUTIONS | Search BI+SB+SOLID+SOLUTIONS |
2 | QUENCH DEPOSITED FILM | 1 | 50% | 1% | 1 | Search QUENCH+DEPOSITED+FILM | Search QUENCH+DEPOSITED+FILM |
3 | VARIABLE VALENCE | 1 | 50% | 1% | 1 | Search VARIABLE+VALENCE | Search VARIABLE+VALENCE |
4 | DEGENERATE SEMICONDUCTOR | 1 | 19% | 2% | 3 | Search DEGENERATE+SEMICONDUCTOR | Search DEGENERATE+SEMICONDUCTOR |
5 | SNTE | 1 | 13% | 3% | 4 | Search SNTE | Search SNTE |
6 | DIRECT RECOMBINATION | 0 | 25% | 1% | 1 | Search DIRECT+RECOMBINATION | Search DIRECT+RECOMBINATION |
7 | NON STOICHIOMETRIC DEFECTS | 0 | 17% | 1% | 1 | Search NON+STOICHIOMETRIC+DEFECTS | Search NON+STOICHIOMETRIC+DEFECTS |
8 | AGGREGATION PATTERNS | 0 | 13% | 1% | 1 | Search AGGREGATION+PATTERNS | Search AGGREGATION+PATTERNS |
9 | IMPURITY DEFECTS | 0 | 13% | 1% | 1 | Search IMPURITY+DEFECTS | Search IMPURITY+DEFECTS |
10 | HOMOGENEITY REGION | 0 | 10% | 1% | 1 | Search HOMOGENEITY+REGION | Search HOMOGENEITY+REGION |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | CONCENTRATION DEPENDENCES | 5 | 44% | 7% | 8 |
2 | TIN MONOTELLURIDE | 4 | 75% | 2% | 3 |
3 | HOMOGENEITY REGION | 1 | 40% | 2% | 2 |
4 | SNTE THIN FILMS | 1 | 50% | 1% | 1 |
5 | SEMICONDUCTOR SOLID SOLUTIONS | 0 | 13% | 1% | 1 |
6 | VARIABLE COMPOSITION | 0 | 13% | 1% | 1 |
7 | CONCENTRATION ANOMALIES | 0 | 100% | 1% | 1 |
8 | INDUCED RESONANT PHOTOEMISSION | 0 | 100% | 1% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
HEAT AND MASS-TRANSFER BIBLIOGRAPHY - SOVIET WORKS | 1982 | 1 | 48 | 58% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | KHARKOV POLYTECHN | 1 | 25% | 1.6% | 2 |
2 | DE RTMENT THEORET EXPT PHYS | 0 | 100% | 0.8% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000107311 | PETROLEUM SOURCE//DAQING PETR EXPLORAT DEV//SPORE AND POLLEN |
2 | 0.0000100390 | RADIATION FLUXES//PULSED PROC TECHNOL//PARAMETER DISTRIBUTIONS |
3 | 0.0000093375 | PRIKLADNAYA KHIMIYA//AIR FORCE MIL EDUC SCI//AO SCI HYPERSON SYST |
4 | 0.0000084688 | DONETSK PHYSIKOTECH//GALKIN PHYSICOTECH//A GALKIN DONETSK PHYS TECHNOL |
5 | 0.0000083385 | CHEM PHYS JOINT//CONVERTED X RAY//DOUBLE CHARGED IONS |
6 | 0.0000066179 | CHERNOVTSY//IMPURITY IN SEMICONDUCTORS//FAR INFRARED REFLECTIVITY |
7 | 0.0000065996 | SN TE//ENTHALPIES OF MIXING//FREE ENTHALPY OF FORMATION |
8 | 0.0000063485 | LATTICE INTERACTION//MAGNETOTHERMAL PROPERTIES//SQUARE PLANAR SYSTEM |
9 | 0.0000063447 | SYMBIOT ENVIRONM SYST ENGN//GE1 XMNXTE//SP F HYBRIDIZATION |
10 | 0.0000062105 | THOMSON RADIAL FREQUENCIES//COMP AIDED ELE OCHEM//CHEM INORGAN TECHNOL ADV MAT |