Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
31002 | 129 | 16.8 | 19% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
3812 | 626 | ABNORMAL POINT//P REGULARITY//CONICAL APPROXIMATIONS |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | SINGULARLY PERTURBED PARABOLIC PROBLEMS | Author keyword | 3 | 100% | 2% | 3 |
2 | METHOD OF DIFFERENTIAL INEQUALITIES | Author keyword | 2 | 67% | 2% | 2 |
3 | SINGULARLY PERTURBED REACTION DIFFUSION EQUATION | Author keyword | 2 | 67% | 2% | 2 |
4 | ASYMPTOTIC EXPANSION OF SOLUTION | Author keyword | 1 | 50% | 1% | 1 |
5 | AV HARDWARE BRANCH | Address | 1 | 50% | 1% | 1 |
6 | DIFFERENTIAL EQUATION OF NTH ORDER | Author keyword | 1 | 50% | 1% | 1 |
7 | DIFFUSION STOCHASTIC PROCESS | Author keyword | 1 | 50% | 1% | 1 |
8 | INCOMPLETE IMPURITY IONIZATION | Author keyword | 1 | 50% | 1% | 1 |
9 | SILICON BIPOLAR TRANSISTOR | Author keyword | 0 | 20% | 2% | 2 |
10 | COMPLEMENTARY PROPERTIES | Author keyword | 0 | 33% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | CONTRAST STRUCTURES | 1 | 50% | 1% | 1 |
2 | EFFECT POLARIMETRY | 1 | 50% | 1% | 1 |
3 | DIFFERENTIAL INEQUALITIES | 0 | 13% | 2% | 3 |
4 | 1 F NOISE SOURCES | 0 | 25% | 1% | 1 |
5 | LEVEL QUANTUM SYSTEMS | 0 | 11% | 1% | 1 |
6 | DYNAMICS MODELS | 0 | 10% | 1% | 1 |
7 | BETA LINES | 0 | 100% | 1% | 1 |
8 | PERTURBED INTEGRODIFFERENTIAL EQUATIONS | 0 | 100% | 1% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
EVOLUTION OF THE MOS-TRANSISTOR - FROM CONCEPTION TO VLSI | 1988 | 38 | 32 | 13% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | AV HARDWARE BRANCH | 1 | 50% | 0.8% | 1 |
2 | PROGRAMMED SYST | 0 | 33% | 0.8% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000171503 | ARONSZAJN NULL//BEURLING SPACES//DIFFERENTIAL EQUATION IN A BANACH SPACE |
2 | 0.0000103554 | HOMOTOPIC MAPPING//VARIATIONAL ITERATION//EL NINO SOUTHERN OSCILLATOR MODEL |
3 | 0.0000099384 | A SCHEME//COULOMB BROADENING//NOISE PULSES |
4 | 0.0000090586 | PLASMA HOLE//LEUVEN MATH MODELLING COMPUTAT SCI LMCC//VISCOSITY ANOMALY |
5 | 0.0000076656 | NON EQUILIBRIUM ELECTRONS//DEVICE MODELLING//ENGN STATE |
6 | 0.0000074574 | SYMPLECTIC ELASTICITY//INFINITE DIMENSIONAL HAMILTONIAN OPERATOR//SYMPLECTIC GEOMETRY METHOD |
7 | 0.0000054912 | SHISHKIN MESH//LAYER ADAPTED MESH//SINGULAR PERTURBATION |
8 | 0.0000053040 | ALMOST SURE UNIFORM STABILITY//TIME TOPOLOGY//EXCELLENCE ISEM |
9 | 0.0000050983 | BEAM EMISSION SPECTROSCOPY//PLASMA DENSITY DIAGNOSTIC//MOTIONAL STARK EFFECT |
10 | 0.0000049643 | OCCUPATIONAL MEASURES//CONTROL SETS//APPROXIMATION OF SLOW MOTIONS |