Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
3078 | 1990 | 17.2 | 70% |
Classes in level above (level 2) |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | GAAS ON SI | Author keyword | 89 | 75% | 3% | 65 |
2 | GAAS SI | Author keyword | 54 | 76% | 2% | 38 |
3 | GAP ON SI | Author keyword | 11 | 78% | 0% | 7 |
4 | GAAS GE | Author keyword | 9 | 67% | 0% | 8 |
5 | ALGAAS ON SI | Author keyword | 6 | 100% | 0% | 4 |
6 | GAAS ON GE | Author keyword | 6 | 100% | 0% | 4 |
7 | INP ON SI | Author keyword | 5 | 60% | 0% | 6 |
8 | CONFORMAL GROWTH | Author keyword | 4 | 75% | 0% | 3 |
9 | INP SI | Author keyword | 4 | 75% | 0% | 3 |
10 | MICROSTRUCT DEVICES SHOWA KU | Address | 4 | 75% | 0% | 3 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | GAAS ON SI | 89 | 75% | 3% | 65 | Search GAAS+ON+SI | Search GAAS+ON+SI |
2 | GAAS SI | 54 | 76% | 2% | 38 | Search GAAS+SI | Search GAAS+SI |
3 | GAP ON SI | 11 | 78% | 0% | 7 | Search GAP+ON+SI | Search GAP+ON+SI |
4 | GAAS GE | 9 | 67% | 0% | 8 | Search GAAS+GE | Search GAAS+GE |
5 | ALGAAS ON SI | 6 | 100% | 0% | 4 | Search ALGAAS+ON+SI | Search ALGAAS+ON+SI |
6 | GAAS ON GE | 6 | 100% | 0% | 4 | Search GAAS+ON+GE | Search GAAS+ON+GE |
7 | INP ON SI | 5 | 60% | 0% | 6 | Search INP+ON+SI | Search INP+ON+SI |
8 | CONFORMAL GROWTH | 4 | 75% | 0% | 3 | Search CONFORMAL+GROWTH | Search CONFORMAL+GROWTH |
9 | INP SI | 4 | 75% | 0% | 3 | Search INP+SI | Search INP+SI |
10 | THERMAL CYCLE ANNEALING | 4 | 44% | 0% | 7 | Search THERMAL+CYCLE+ANNEALING | Search THERMAL+CYCLE+ANNEALING |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | SINGLE DOMAIN GAAS | 42 | 94% | 1% | 15 |
2 | HIGH QUALITY GAAS | 29 | 88% | 1% | 14 |
3 | ON SI | 20 | 62% | 1% | 21 |
4 | ANTIPHASE DOMAINS | 17 | 68% | 1% | 15 |
5 | SELF ANNIHILATION | 17 | 70% | 1% | 14 |
6 | DEFECT REDUCTION | 15 | 45% | 1% | 25 |
7 | SI 100 | 11 | 52% | 1% | 15 |
8 | GAAS GE GAAS HETEROSTRUCTURES | 11 | 100% | 0% | 6 |
9 | GAAS ON SI | 11 | 69% | 0% | 9 |
10 | STRESS VARIATIONS | 11 | 78% | 0% | 7 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
GALLIUM-ARSENIDE AND OTHER COMPOUND SEMICONDUCTORS ON SILICON | 1990 | 378 | 122 | 78% |
Stresses and strains in epilayers, stripes and quantum structures of III-V compound semiconductors | 1996 | 113 | 111 | 26% |
Heteroepitaxy and selective area heteroepitaxy for silicon photonics | 2012 | 22 | 57 | 32% |
GaAs epitaxy on Si substrates: modern status of research and engineering | 2008 | 49 | 207 | 42% |
RELAXED LATTICE-MISMATCHED GROWTH OF III-V SEMICONDUCTORS | 1991 | 27 | 161 | 78% |
Germanium: Epitaxy and its applications | 2010 | 20 | 95 | 13% |
GALLIUM-ARSENIDE ON SILICON - A REVIEW | 1988 | 10 | 22 | 95% |
MOLECULAR-BEAM EPITAXIAL-GROWTH OF GAAS AND OTHER COMPOUND SEMICONDUCTORS | 1991 | 10 | 136 | 32% |
STRUCTURAL DEFECTS IN EPITAXIAL III/V LAYERS | 1993 | 4 | 87 | 30% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | MICROSTRUCT DEVICES SHOWA KU | 4 | 75% | 0.2% | 3 |
2 | MICROSTRUCT DEVICES | 4 | 19% | 0.9% | 18 |
3 | CRG D2AM | 2 | 67% | 0.1% | 2 |
4 | FOTON OHM | 2 | 50% | 0.2% | 3 |
5 | ELECT ENGN WESTERN NANOELECT | 1 | 100% | 0.1% | 2 |
6 | INTER MEASUREMENT | 1 | 100% | 0.1% | 2 |
7 | MICRO STRUCT DEVICES | 1 | 18% | 0.3% | 6 |
8 | PHYS EP 3 | 1 | 30% | 0.2% | 3 |
9 | TERAHERTZ TERASCALE ELECT | 1 | 40% | 0.1% | 2 |
10 | CNRSCEAUJF | 1 | 50% | 0.1% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000149296 | MISFIT DISLOCATIONS//GRADED BUFFER LAYER//DISLOCATION COMPENSATION |
2 | 0.0000121041 | EPITAXIAL LIFT OFF//EPITAXIAL LIFT OFF ELO//PHOTONIC DOT |
3 | 0.0000073407 | AVERAGE BOND ENERGY THEORY//PHYS IND PHYS//PH ECUBLENS PHYS PL |
4 | 0.0000073224 | GESN//L NESS//GERMANIUM TIN |
5 | 0.0000067450 | SURFACTANT MEDIATED EPITAXY//BI NANOLINES//SI100 2X1 SB |
6 | 0.0000057009 | LUMINESCENT COUPLING//ENERGIA SOLAR//LUMINESCENCE COUPLING |
7 | 0.0000053799 | SELECTIVE AREA GROWTH//TERTIARYBUTYLCHLORIDE//SELECTIVE EPITAXY |
8 | 0.0000051981 | NOVOSHAKHTINSK BRANCH//ELE OCHEM HYDROGEN ENERGY//IRON STEEL IND |
9 | 0.0000050624 | OVAL DEFECTS//SEEIE//GA AS BI SOLUTION |
10 | 0.0000050173 | ATOMIC HYDROGEN CLEANING//ECR HYDROGEN PLASMA//IN SITU VACUUM PROCESS |