Class information for:
Level 1: ELECTRICAL PASSIVATION OF STRUCTURAL DEFECTS//GAAS DIODE//TRIPLE CRYSTAL DIFFRACTOMETRY

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
30693 134 15.3 31%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
2557 3267 INTERFACIAL SILICON EMISSION//SILICON OXIDATION//GENIE URBAIN ENVIRONM

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 ELECTRICAL PASSIVATION OF STRUCTURAL DEFECTS Author keyword 1 50% 1% 1
2 GAAS DIODE Author keyword 1 50% 1% 1
3 TRIPLE CRYSTAL DIFFRACTOMETRY Author keyword 1 25% 1% 2
4 ECR HYDROGENATION Author keyword 0 33% 1% 1
5 FISH SALAD Author keyword 0 33% 1% 1
6 STRAIN PROFILE Author keyword 0 13% 1% 2
7 FISH BALL Author keyword 0 20% 1% 1
8 INFINITE MEDIUM Author keyword 0 13% 1% 1
9 TRANSPARENT CONDUCTING THIN FILMS Author keyword 0 13% 1% 1
10 HYDROGENATION PROCESS Author keyword 0 11% 1% 1

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class		 LCSH search Wikipedia search
1 ELECTRICAL PASSIVATION OF STRUCTURAL DEFECTS 1 50% 1% 1 Search ELECTRICAL+PASSIVATION+OF+STRUCTURAL+DEFECTS Search ELECTRICAL+PASSIVATION+OF+STRUCTURAL+DEFECTS
2 GAAS DIODE 1 50% 1% 1 Search GAAS+DIODE Search GAAS+DIODE
3 TRIPLE CRYSTAL DIFFRACTOMETRY 1 25% 1% 2 Search TRIPLE+CRYSTAL+DIFFRACTOMETRY Search TRIPLE+CRYSTAL+DIFFRACTOMETRY
4 ECR HYDROGENATION 0 33% 1% 1 Search ECR+HYDROGENATION Search ECR+HYDROGENATION
5 FISH SALAD 0 33% 1% 1 Search FISH+SALAD Search FISH+SALAD
6 STRAIN PROFILE 0 13% 1% 2 Search STRAIN+PROFILE Search STRAIN+PROFILE
7 FISH BALL 0 20% 1% 1 Search FISH+BALL Search FISH+BALL
8 INFINITE MEDIUM 0 13% 1% 1 Search INFINITE+MEDIUM Search INFINITE+MEDIUM
9 TRANSPARENT CONDUCTING THIN FILMS 0 13% 1% 1 Search TRANSPARENT+CONDUCTING+THIN+FILMS Search TRANSPARENT+CONDUCTING+THIN+FILMS
10 HYDROGENATION PROCESS 0 11% 1% 1 Search HYDROGENATION+PROCESS Search HYDROGENATION+PROCESS

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 POST HYDROGENATION 0 33% 1% 1
2 SMOKED FISHERY PRODUCTS 0 33% 1% 1
3 SPIN ON SOURCE 0 33% 1% 1
4 NETWORK OXYGEN 0 17% 1% 1
5 CROSS STRAIT RELATIONS 0 13% 1% 1
6 PEACEFUL REUNIFICATION 0 100% 1% 1
7 SENSORIAL 0 100% 1% 1

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
THE EELS, ANGUILLA SPP, THEIR CHARACTERISTICS AND USES 1995 3 17 59%
APPLICATIONS OF SECONDARY ION MASS-SPECTROSCOPY TO CHARACTERIZATION OF MICROELECTRONIC MATERIALS 1986 2 56 9%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 LIB DESIGN TOOLS 0 100% 0.7% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000088308 FARADAY COLLECTOR//MAGNETIC ANALYZER//IMAGE WIDTH
2 0.0000084670 SONDERFOR UNGSBEREICH 345//SONDERFOR BEREICH 345//PHILIPS TECHNICAL REVIEW
3 0.0000084176 INDUCTIVELY COUPLED PLASMA ETCH//SIC C COMPOSITE//SIC C
4 0.0000077820 BOROPHOSPHOSILICATE GLASS BPSG//ATMOSPHERIC PRESSURE CVD//BPSG
5 0.0000068622 EXPANDED CORE FIBER//FINE WIRING//H2 REDUCTION
6 0.0000065428 IRRADIATED P N JUNCTION LEAKAGE//JUNCTION SHAPE//P N JUNCTION LEAKAGE
7 0.0000063936 CONFOCAL SYSTEMS//MICROWAVE PHOTOCONDUCTIVITY//MIS SWITCHING DEVICES
8 0.0000061210 BORON PENETRATION//REMOTE PLASMA NITRIDATION RPN//SI NITRIDE
9 0.0000060045 POLYOXIDE//INTERPOLY OXIDE//NONPLANAR POLYOXIDE
10 0.0000059294 HYDROGEN INDUCED FRACTURE//SURFACE SCALE//SILUMINS