Class information for: |
Basic class information |
| ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
|---|---|---|---|
| 30580 | 136 | 14.9 | 37% |
Classes in level above (level 2) |
| ID, lev. above |
Publications | Label for level above |
|---|---|---|
| 2574 | 3220 | THERMAL FLOW SENSOR//MICROHOTPLATE//THERMOPILE |
Terms with highest relevance score |
| Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|---|
| 1 | SURFACE MOUNT DEVICE | Author keyword | 3 | 40% | 4% | 6 |
| 2 | SEZAWAS THEORY | Author keyword | 2 | 67% | 1% | 2 |
| 3 | SIDE WALL ELECTRODE | Author keyword | 2 | 67% | 1% | 2 |
| 4 | PHOTORESIST SPRAY COATING METHOD | Author keyword | 1 | 100% | 1% | 2 |
| 5 | CRYSTAL IMPEDANCE | Author keyword | 1 | 40% | 1% | 2 |
| 6 | OBLIQUE EVAPORATION | Author keyword | 1 | 23% | 2% | 3 |
| 7 | COMMUNICAT ELECT COMMAND | Address | 1 | 50% | 1% | 1 |
| 8 | CRYSTAL PARAMETERS | Author keyword | 1 | 50% | 1% | 1 |
| 9 | ELE ON MEASUREMENT TECHNOL | Address | 1 | 50% | 1% | 1 |
| 10 | GALLIUM ARSENIDE GERMANIUM ALLOY | Author keyword | 1 | 50% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
| Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | NATURAL DIAMOND CRYSTALS | 1 | 100% | 1% | 2 |
| 2 | ELEMENT METHOD DESIGN | 1 | 40% | 1% | 2 |
| 3 | 32768 KHZ | 1 | 50% | 1% | 1 |
| 4 | ROOM TEMPERATURE MEASUREMENT | 1 | 50% | 1% | 1 |
| 5 | CRYSTAL THERMOMETER | 0 | 20% | 1% | 1 |
| 6 | FLOAT ZONED SILICON | 0 | 100% | 1% | 1 |
| 7 | FT RAMAN SPECTROPHOTOMETER | 0 | 100% | 1% | 1 |
Journals |
Reviews |
| Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
|---|---|---|---|---|
| X-RAY-SCATTERING FROM POINT-DEFECT AGGREGATES IN SINGLE-CRYSTALS | 1989 | 5 | 32 | 13% |
Address terms |
| Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
|---|---|---|---|---|---|
| 1 | COMMUNICAT ELECT COMMAND | 1 | 50% | 0.7% | 1 |
| 2 | ELE ON MEASUREMENT TECHNOL | 1 | 50% | 0.7% | 1 |
| 3 | SYST MODULE GRP | 1 | 50% | 0.7% | 1 |
| 4 | CERAM TEAM | 0 | 33% | 0.7% | 1 |
| 5 | CENT R D | 0 | 25% | 0.7% | 1 |
| 6 | RD SUPPORT | 0 | 17% | 0.7% | 1 |
| 7 | MFG ENGN RD | 0 | 13% | 0.7% | 1 |
| 8 | RELIABIL ASSESSMENT MAT EVALUAT | 0 | 13% | 0.7% | 1 |
| 9 | ISM LENS RD GRP | 0 | 100% | 0.7% | 1 |
| 10 | PRECIS TECHNOL ADV TECHNOL | 0 | 100% | 0.7% | 1 |
Related classes at same level (level 1) |
| Rank | Relatedness score | Related classes |
|---|---|---|
| 1 | 0.0000148664 | MICROWAVE POWER SENSOR//POWER SENSOR//GAAS MMIC |
| 2 | 0.0000105956 | AMETHYST//NATURAL QUARTZ//SINGLE CRYSTAL EPR |
| 3 | 0.0000077857 | MAGNETIC FIELD EFFECT TRANSISTOR MAGFET//MAGFET//BIPOLAR MAGNETOTRANSISTORS |
| 4 | 0.0000074491 | NEEDLE TYPE ELECTRODES//SI O SUPERLATTICE//CONTOUR VIBRATION |
| 5 | 0.0000055352 | PHOTON RECYCLING//SEMICONDUCTOR SCINTILLATORS//FSF |
| 6 | 0.0000054306 | HIGH RESOLUTION X RAY MICROSCOPY//INNER SHELL ELECTRON EXCITATION//INTENSE X RAYS |
| 7 | 0.0000050522 | THREE TERMINAL BALLISTIC JUNCTIONS//BALLISTIC RECTIFICATION//BALLISTIC DEVICES |
| 8 | 0.0000050029 | OXYGEN PRECIPITATION//GROWN IN DEFECT//CZOCHRALSKI SILICON |
| 9 | 0.0000050000 | DIELECT GRP//ASYMMETRIC LEVY STABLE DISTRIBUTIONS//DIPOLAR MATERIALS |
| 10 | 0.0000049311 | DISTRIBUTED MANIPULATION//PROGRAMMABLE FORCE FIELDS//LINEAR VIBRATORY FEEDER |