Class information for:
Level 1: TRACE SIGNAL SELECTION//SILICON DEBUG//REAL TIME TRACE

Basic class information
ID Publications Average number
of references		 Avg. shr. active
ref. in WoS
29866 146 20.7 25%


Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)


ID, lev.
above		 Publications Label for level above
1040 9640 JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS//IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS//SINGLE EVENT UPSET SEU

Terms with highest relevance score


Rank Term Type of term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 TRACE SIGNAL SELECTION Author keyword 6 80% 3% 4
2 SILICON DEBUG Author keyword 5 40% 7% 10
3 REAL TIME TRACE Author keyword 4 75% 2% 3
4 TRACE BUFFER Author keyword 3 60% 2% 3
5 POST SILICON VALIDATION Author keyword 2 23% 6% 9
6 DESIGN FOR DEBUG DFD Author keyword 2 67% 1% 2
7 ON CHIP DEBUGGER Author keyword 2 67% 1% 2
8 PROCESSOR DEBUG Author keyword 2 67% 1% 2
9 STATE RESTORATION Author keyword 2 67% 1% 2
10 TRACE COMPRESSION Author keyword 2 36% 3% 4

Web of Science journal categories

Author Key Words


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class		 LCSH search Wikipedia search
1 TRACE SIGNAL SELECTION 6 80% 3% 4 Search TRACE+SIGNAL+SELECTION Search TRACE+SIGNAL+SELECTION
2 SILICON DEBUG 5 40% 7% 10 Search SILICON+DEBUG Search SILICON+DEBUG
3 REAL TIME TRACE 4 75% 2% 3 Search REAL+TIME+TRACE Search REAL+TIME+TRACE
4 TRACE BUFFER 3 60% 2% 3 Search TRACE+BUFFER Search TRACE+BUFFER
5 POST SILICON VALIDATION 2 23% 6% 9 Search POST+SILICON+VALIDATION Search POST+SILICON+VALIDATION
6 DESIGN FOR DEBUG DFD 2 67% 1% 2 Search DESIGN+FOR+DEBUG+DFD Search DESIGN+FOR+DEBUG+DFD
7 ON CHIP DEBUGGER 2 67% 1% 2 Search ON+CHIP+DEBUGGER Search ON+CHIP+DEBUGGER
8 PROCESSOR DEBUG 2 67% 1% 2 Search PROCESSOR+DEBUG Search PROCESSOR+DEBUG
9 STATE RESTORATION 2 67% 1% 2 Search STATE+RESTORATION Search STATE+RESTORATION
10 TRACE COMPRESSION 2 36% 3% 4 Search TRACE+COMPRESSION Search TRACE+COMPRESSION

Key Words Plus


Rank Web of Science journal category Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ. in
class
1 DEBUG 3 23% 7% 10
2 VISIBILITY ENHANCEMENT 2 67% 1% 2
3 SILICON DEBUG 1 33% 2% 3
4 IC FAILURE ANALYSIS 1 50% 1% 1
5 SIGNAL SELECTION 1 29% 1% 2
6 TRACE SIGNAL SELECTION 0 33% 1% 1
7 FUNCTIONAL VALIDATION 0 25% 1% 1
8 PROGRAM EXECUTIONS 0 20% 1% 1
9 TOLERATING LATENCY 0 20% 1% 1
10 ASSERTION CHECKERS 0 100% 1% 1

Journals

Reviews


Title Publ. year Cit. Active
references		 % act. ref.
to same field
Debug support for complex systems on-chip: a review 2006 40 4 50%
An infrastructure for debug using clusters of assertion-checkers 2012 0 2 50%

Address terms


Rank Address term Relevance score
(tfidf)		 Class's shr.
of term's tot.
occurrences		 Shr. of publ.
in class containing
term		 Num. of
publ.
in class
1 CHIP GENERATOR GRP 1 50% 0.7% 1
2 NETWORKING SYST 1 50% 0.7% 1
3 CUHK RELIABLE COMP 0 33% 0.7% 1
4 SYST INFRASTRUCT GRP 0 33% 0.7% 1
5 CORP IT 0 17% 0.7% 1
6 IC DESIGN DIGITAL DESIGN TEST 0 14% 0.7% 1
7 VEHICLE ELECT SYST 0 14% 0.7% 1
8 ADV COMP STUDY 0 13% 0.7% 1
9 AREA FIELDBUS CONTROL NETWORK DEV 0 100% 0.7% 1
10 CORE ARCHITECTURE GRP 0 100% 0.7% 1

Related classes at same level (level 1)


Rank Relatedness score Related classes
1 0.0000224251 IBM SYST TECHNOL GRP//390//SERVER GRP
2 0.0000199802 DESIGN ERROR DIAGNOSIS//PASS FAIL INFORMATION//WITT POLYNOMIAL
3 0.0000145952 OPEN SOURCE OS//COMP ENGN COMP COMMUN//BOOTING TIME
4 0.0000128626 GRAY SHADES//COLUMN DRIVER//LCD DRIVER
5 0.0000117292 ACM TRANSACTIONS ON ARCHITECTURE AND CODE OPTIMIZATION//IEEE MICRO//BRANCH PREDICTION
6 0.0000104375 TEXT COMPRESSION//ARITHMETIC CODING//HUFFMAN CODES
7 0.0000091168 TRANSITION FAULTS//FUNCTIONAL BROADSIDE TESTS//JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
8 0.0000077815 REACHABILITY TESTING//RACE DETECTION//DATA RACE
9 0.0000070627 WORMHOLE ROUTING//NETWORK ON CHIP//NETWORK ON CHIP NOC
10 0.0000068880 INTELLECTUAL PROPERTY PROTECTION IPP//HARDWARE METERING//HARDWARE SECURITY