Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
29685 | 149 | 12.8 | 26% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
372 | 16511 | SWAMP//OXYGEN PRECIPITATION//GROWN IN DEFECT |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | FARADAY COLLECTOR | Author keyword | 1 | 100% | 1% | 2 |
2 | MAGNETIC ANALYZER | Author keyword | 1 | 22% | 1% | 2 |
3 | IMAGE WIDTH | Author keyword | 0 | 33% | 1% | 1 |
4 | ION IMAGE | Author keyword | 0 | 25% | 1% | 1 |
5 | VARIABLE DISPERSION | Author keyword | 0 | 11% | 1% | 1 |
6 | ZOOM OPTICS | Author keyword | 0 | 10% | 1% | 1 |
7 | CURVED SHIMS | Author keyword | 0 | 100% | 1% | 1 |
8 | IMAGE DEPTH PROFILING | Author keyword | 0 | 100% | 1% | 1 |
9 | ION MICROBEAM ANALYSIS | Author keyword | 0 | 100% | 1% | 1 |
10 | ISOLAB 54 | Author keyword | 0 | 100% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
LCSH search | Wikipedia search |
---|---|---|---|---|---|---|---|
1 | FARADAY COLLECTOR | 1 | 100% | 1% | 2 | Search FARADAY+COLLECTOR | Search FARADAY+COLLECTOR |
2 | MAGNETIC ANALYZER | 1 | 22% | 1% | 2 | Search MAGNETIC+ANALYZER | Search MAGNETIC+ANALYZER |
3 | IMAGE WIDTH | 0 | 33% | 1% | 1 | Search IMAGE+WIDTH | Search IMAGE+WIDTH |
4 | ION IMAGE | 0 | 25% | 1% | 1 | Search ION+IMAGE | Search ION+IMAGE |
5 | VARIABLE DISPERSION | 0 | 11% | 1% | 1 | Search VARIABLE+DISPERSION | Search VARIABLE+DISPERSION |
6 | ZOOM OPTICS | 0 | 10% | 1% | 1 | Search ZOOM+OPTICS | Search ZOOM+OPTICS |
7 | CURVED SHIMS | 0 | 100% | 1% | 1 | Search CURVED+SHIMS | Search CURVED+SHIMS |
8 | IMAGE DEPTH PROFILING | 0 | 100% | 1% | 1 | Search IMAGE+DEPTH+PROFILING | Search IMAGE+DEPTH+PROFILING |
9 | ION MICROBEAM ANALYSIS | 0 | 100% | 1% | 1 | Search ION+MICROBEAM+ANALYSIS | Search ION+MICROBEAM+ANALYSIS |
10 | ISOLAB 54 | 0 | 100% | 1% | 1 | Search ISOLAB+54 | Search ISOLAB+54 |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | IMPURITY CLUSTERS | 1 | 100% | 1% | 2 |
2 | IR LASER MICROSCOPY | 1 | 100% | 1% | 2 |
3 | BULK SEMICONDUCTORS | 1 | 13% | 3% | 4 |
4 | OSMIUM ISOTOPE RATIOS | 0 | 20% | 1% | 1 |
5 | DEFECT ACCUMULATIONS | 0 | 100% | 1% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references |
% act. ref. to same field |
---|---|---|---|---|
Optical materials for lasers in the mid-IR range | 1996 | 1 | 21 | 48% |
Address terms |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000169192 | OPTIMIZATION OF ANNEALING//ERBIUM RELATED CENTRES//SELF ASSEMBLED SILICON QUANTUM WELLS |
2 | 0.0000112797 | RADIOCRYSTALLOGRAPHY//SCI TECHNOL RUMENTAT ENGN//NANOSCALE DIFFUSION |
3 | 0.0000090096 | OXYGEN PRECIPITATION//GROWN IN DEFECT//CZOCHRALSKI SILICON |
4 | 0.0000088471 | FE DOPED INP//PHOSPHORUS VAPOR PRESSURE//WAFER ANNEALING |
5 | 0.0000088308 | ELECTRICAL PASSIVATION OF STRUCTURAL DEFECTS//GAAS DIODE//TRIPLE CRYSTAL DIFFRACTOMETRY |
6 | 0.0000087953 | SIMOX//BURIED OXIDE LAYER//CONTACTLESS I V METHOD |
7 | 0.0000080795 | SCATTERING CORRECTIONS//FED SCI PROD//SPECTRAL MATCHING FACTOR |
8 | 0.0000078161 | ACETYLENEDICARBOXYLATE//POLYMER REACTIONS//ACETYLENEDICARBOXYLIC ACID |
9 | 0.0000068059 | RADIOENGN ELE//HIGH ENERGY CHARGED PARTICLES//ZAVOISKII KAZAN PHYS TECH |
10 | 0.0000066985 | GETTERING//GETTERING EFFICIENCY//SI AU |