Class information for:
Level 1: FARADAY COLLECTOR//MAGNETIC ANALYZER//IMAGE WIDTH

Basic class information

ID Publications Average number
of references
Avg. shr. active
ref. in WoS
29685 149 12.8 26%



Bar chart of Publication_year

Last years might be incomplete

Classes in level above (level 2)



ID, lev.
above
Publications Label for level above
372 16511 SWAMP//OXYGEN PRECIPITATION//GROWN IN DEFECT

Terms with highest relevance score



Rank Term Type of term Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 FARADAY COLLECTOR Author keyword 1 100% 1% 2
2 MAGNETIC ANALYZER Author keyword 1 22% 1% 2
3 IMAGE WIDTH Author keyword 0 33% 1% 1
4 ION IMAGE Author keyword 0 25% 1% 1
5 VARIABLE DISPERSION Author keyword 0 11% 1% 1
6 ZOOM OPTICS Author keyword 0 10% 1% 1
7 CURVED SHIMS Author keyword 0 100% 1% 1
8 IMAGE DEPTH PROFILING Author keyword 0 100% 1% 1
9 ION MICROBEAM ANALYSIS Author keyword 0 100% 1% 1
10 ISOLAB 54 Author keyword 0 100% 1% 1

Web of Science journal categories

Author Key Words



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
LCSH search Wikipedia search
1 FARADAY COLLECTOR 1 100% 1% 2 Search FARADAY+COLLECTOR Search FARADAY+COLLECTOR
2 MAGNETIC ANALYZER 1 22% 1% 2 Search MAGNETIC+ANALYZER Search MAGNETIC+ANALYZER
3 IMAGE WIDTH 0 33% 1% 1 Search IMAGE+WIDTH Search IMAGE+WIDTH
4 ION IMAGE 0 25% 1% 1 Search ION+IMAGE Search ION+IMAGE
5 VARIABLE DISPERSION 0 11% 1% 1 Search VARIABLE+DISPERSION Search VARIABLE+DISPERSION
6 ZOOM OPTICS 0 10% 1% 1 Search ZOOM+OPTICS Search ZOOM+OPTICS
7 CURVED SHIMS 0 100% 1% 1 Search CURVED+SHIMS Search CURVED+SHIMS
8 IMAGE DEPTH PROFILING 0 100% 1% 1 Search IMAGE+DEPTH+PROFILING Search IMAGE+DEPTH+PROFILING
9 ION MICROBEAM ANALYSIS 0 100% 1% 1 Search ION+MICROBEAM+ANALYSIS Search ION+MICROBEAM+ANALYSIS
10 ISOLAB 54 0 100% 1% 1 Search ISOLAB+54 Search ISOLAB+54

Key Words Plus



Rank Web of Science journal category Relevance score
(tfidf)
Class's shr.
of term's tot.
occurrences
Shr. of publ.
in class containing
term
Num. of
publ.
in class
1 IMPURITY CLUSTERS 1 100% 1% 2
2 IR LASER MICROSCOPY 1 100% 1% 2
3 BULK SEMICONDUCTORS 1 13% 3% 4
4 OSMIUM ISOTOPE RATIOS 0 20% 1% 1
5 DEFECT ACCUMULATIONS 0 100% 1% 1

Journals

Reviews



Title Publ. year Cit. Active
references
% act. ref.
to same field
Optical materials for lasers in the mid-IR range 1996 1 21 48%

Address terms

Related classes at same level (level 1)



Rank Relatedness score Related classes
1 0.0000169192 OPTIMIZATION OF ANNEALING//ERBIUM RELATED CENTRES//SELF ASSEMBLED SILICON QUANTUM WELLS
2 0.0000112797 RADIOCRYSTALLOGRAPHY//SCI TECHNOL RUMENTAT ENGN//NANOSCALE DIFFUSION
3 0.0000090096 OXYGEN PRECIPITATION//GROWN IN DEFECT//CZOCHRALSKI SILICON
4 0.0000088471 FE DOPED INP//PHOSPHORUS VAPOR PRESSURE//WAFER ANNEALING
5 0.0000088308 ELECTRICAL PASSIVATION OF STRUCTURAL DEFECTS//GAAS DIODE//TRIPLE CRYSTAL DIFFRACTOMETRY
6 0.0000087953 SIMOX//BURIED OXIDE LAYER//CONTACTLESS I V METHOD
7 0.0000080795 SCATTERING CORRECTIONS//FED SCI PROD//SPECTRAL MATCHING FACTOR
8 0.0000078161 ACETYLENEDICARBOXYLATE//POLYMER REACTIONS//ACETYLENEDICARBOXYLIC ACID
9 0.0000068059 RADIOENGN ELE//HIGH ENERGY CHARGED PARTICLES//ZAVOISKII KAZAN PHYS TECH
10 0.0000066985 GETTERING//GETTERING EFFICIENCY//SI AU