Class information for: |
Basic class information |
ID | Publications | Average number of references |
Avg. shr. active ref. in WoS |
---|---|---|---|
29643 | 149 | 21.3 | 25% |
Classes in level above (level 2) |
ID, lev. above |
Publications | Label for level above |
---|---|---|
886 | 10744 | SURFACE AND INTERFACE ANALYSIS//AUGER PHOTOELECTRON COINCIDENCE SPECTROSCOPY APECS//IMFP |
Terms with highest relevance score |
Rank | Term | Type of term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|---|
1 | INDUCTIVELY COUPLED PLASMA ETCH | Author keyword | 1 | 50% | 1% | 1 |
2 | SIC C COMPOSITE | Author keyword | 1 | 50% | 1% | 1 |
3 | SIC C | Author keyword | 0 | 25% | 1% | 1 |
4 | O CIENCIA MAT | Address | 0 | 14% | 1% | 1 |
5 | LIMITER MATERIALS | Author keyword | 0 | 11% | 1% | 1 |
6 | 30 NM MOLYBDENUM GATES | Author keyword | 0 | 100% | 1% | 1 |
7 | BORON CARBIDE EROSION | Author keyword | 0 | 100% | 1% | 1 |
8 | COMPOUND SEMICONDUCTOR TRANSISTORS | Author keyword | 0 | 100% | 1% | 1 |
9 | ELE ON MICROSCOPY NANO | Address | 0 | 100% | 1% | 1 |
10 | FUNCTIONALLY GRADED NANOSTRUCTURED MATERIALS | Author keyword | 0 | 100% | 1% | 1 |
Web of Science journal categories |
Author Key Words |
Key Words Plus |
Rank | Web of Science journal category | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | HYDROGENATED AMORPHOUS SI | 1 | 50% | 1% | 1 |
2 | BEAM INDUCED FRAGMENTATION | 0 | 14% | 1% | 1 |
Journals |
Reviews |
Title | Publ. year | Cit. | Active references | % act. ref. to same field |
---|---|---|---|---|
SURFACE CHARACTERIZATION | 1983 | 16 | 883 | 3% |
Address terms |
Rank | Address term | Relevance score (tfidf) |
Class's shr. of term's tot. occurrences |
Shr. of publ. in class containing term |
Num. of publ. in class |
---|---|---|---|---|---|
1 | O CIENCIA MAT | 0 | 14% | 0.7% | 1 |
2 | ELE ON MICROSCOPY NANO | 0 | 100% | 0.7% | 1 |
3 | KHARKIV POLITECH | 0 | 100% | 0.7% | 1 |
4 | KHIPT | 0 | 100% | 0.7% | 1 |
5 | PLASMA TECHNOL ENTERTAINMENT | 0 | 100% | 0.7% | 1 |
Related classes at same level (level 1) |
Rank | Relatedness score | Related classes |
---|---|---|
1 | 0.0000138389 | DEBYE SUR E SCI//VANTHOFF//ACOUSTO OPTIC CRYSTAL |
2 | 0.0000091462 | LINEAR RAMAN SPECTROSCOPY//AUTOMOBILE EXHAUST GASES// |
3 | 0.0000085882 | INDOOR APPLICATION//PIPV//INTEGRATED TYPE |
4 | 0.0000084176 | ELECTRICAL PASSIVATION OF STRUCTURAL DEFECTS//GAAS DIODE//TRIPLE CRYSTAL DIFFRACTOMETRY |
5 | 0.0000073613 | LASER DYE SOLVENTS//SUB WAVELENGTH DIFFRACTION GRATING//DISPERSION FORMULAS |
6 | 0.0000072901 | PLASMA CONFINEMENT SPATIALLY PERIODIC FIELD//MAGNETIC CUSP//MECH SYST ENGN COURSE |
7 | 0.0000069636 | ASSOC EURATOM PLASM HYS//EURATOM FUS ASSOC CULHAM//ASSOC EURATOM PHYS |
8 | 0.0000067520 | EPITAXIAL AL2O3//AL2O3 ON SI//DENVER AEROSP TECH OPERAT |
9 | 0.0000064714 | NANOMETRIC CRYSTALS//TG DTA MEASUREMENT//X RAY SCANNING ANALYTICAL MICROSCOPY XSAM |
10 | 0.0000063972 | COLLOIDAL CENTER//PHOTOVOLTA METROL//SOLID SOLUTIONS WITH FLUORITE STRUCTURE |